Patents by Inventor Naoki Yamagami

Naoki Yamagami has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 8211249
    Abstract: A copper base rolled alloy has a copper base alloy composition containing 0.05 percent by mass or more, and 10 percent by mass or less of at least one type of element selected from Be, Mg, Al, Si, P, Ti, Cr, Mn, Fe, Co, Ni, Zr and Sn, wherein the X-ray diffraction intensity ratio I(111)/I(200) where I(hkl) is the X-ray diffraction intensity from (hkl)plane measured with respect to a rolled surface is 2.0 or more.
    Type: Grant
    Filed: December 23, 2008
    Date of Patent: July 3, 2012
    Assignees: NGK Insulators, Ltd., Osaka University
    Inventors: Tetsuo Sakai, Naokuni Muramatsu, Koki Chiba, Naoki Yamagami
  • Publication number: 20090165899
    Abstract: A copper base rolled alloy has a copper base alloy composition containing 0.05 percent by mass or more, and 10 percent by mass or less of at least one type of element selected from Be, Mg, Al, Si, P, Ti, Cr, Mn, Fe, Co, Ni, Zr, and Sn, wherein the X-ray diffraction intensity ratio I(111)/I(200) of (hkl)plane measured with respect to a rolled surface is 2.0 or more.
    Type: Application
    Filed: December 23, 2008
    Publication date: July 2, 2009
    Applicants: NGK Insulators, Ltd., Osaka University
    Inventors: Tetsuo Sakai, Naokuni Muramatsu, Koki Chiba, Naoki Yamagami
  • Patent number: 6762422
    Abstract: On a sample base 1 disposed within a vacuum container is provided a scale S(1). . . S(N), where in an actual distance of the sample base is monitored by observing the scale trough an optical system for exclusive use thereof, which can catch it within a field of view. With this, it is possible to position a foreign body, as a target of analysis, which is analyzed or observed by a first analysis/observation device, so that it necessarily falls within a field of view of a second analysis/observation device, thereby realizing quick and automatic delivery of the samples when observing the foreign body on the sample by plural numbers of the devices.
    Type: Grant
    Filed: September 24, 2002
    Date of Patent: July 13, 2004
    Assignee: Hitachi, Ltd.
    Inventors: Hironaru Yamaguchi, Hidefumi Ibe, Naoki Yamagami
  • Publication number: 20030116720
    Abstract: On a sample base 1 disposed within a vacuum container is provided a scale S(1) . . . S(N), where in an actual distance of the sample base is monitored by observing the scale trough an optical system for exclusive use thereof, which can catch it within a field of view.
    Type: Application
    Filed: September 24, 2002
    Publication date: June 26, 2003
    Inventors: Hironaru Yamaguchi, Hidefumi Ibe, Naoki Yamagami