Patents by Inventor Naomi Ishii
Naomi Ishii has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Patent number: 9978044Abstract: An analyzing device requires regular maintenance for maintaining a predetermined analyzing performance thereof. However, the more complex the analyzing device becomes, the more number of maintenance items are provided. For example, if a plurality of types of maintenances to be performed by removing same component, efficiency may be improved by performing the same as a whole. However, when conforming with a manual, if recommended timings to perform the maintenance are shifted delicately, there is a probability of occurrence of a case where the same components are removed several times for maintenance during a short time. At the time when an instruction to perform maintenance is issued, maintenance items to be performed are extracted, the extracted maintenance items are sorted into a recommended performance order in conformity to a preset rule such that the similar maintenance or the maintenance of the same portion or the like are performed continuously.Type: GrantFiled: January 10, 2012Date of Patent: May 22, 2018Assignee: Hitachi High-Technologies CorporationInventors: Miki Taki, Naomi Ishii
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Patent number: 9841413Abstract: An automatic analysis device includes: a factor storage unit 12b which stores each factor previously specified as a factor that could affect measurement accuracy of each of measurement items, while associating each factor with each measurement item; an abnormality judgment unit 103a which judges the presence/absence of an abnormality in a measurement value of each measurement item on the basis of an approximation formula and approximation formula parameters stored in an approximation formula storage unit 12a; and a factor judgment unit 103b which refers to the results of the judgment by the abnormality judgment unit 103a in a preset order, and would judge as an abnormality factor a factor stored in the factor storage unit 12b in association with a measurement item as an abnormality factor in a case where a plurality of measurement values regarding the measurement item have consecutively been judged to be abnormal.Type: GrantFiled: July 3, 2013Date of Patent: December 12, 2017Assignee: Hitachi High-Technologies CorporationInventors: Naomi Ishii, Kumiko Kamihara
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Patent number: 9430312Abstract: The system includes an analyzer that analyzes a sample, or a processing device that pre-processes the sample, and a management device that manages at least one of the analyzer and the processing device, wherein the management device includes: error detection means that detects errors in the analyzer or the processing device; storage means having stored therein an operator notification management table in which at least one operator is registered per kind of error; error notification means that notifies an error that the error detection means has detected to operators who are to individually handle the error, the means notifying on the basis of the operator notification management table and in accordance with the kind of error detected by the error detection means; and registration means that registers an operator, who has handled the error as a troubleshooter, among operators to whom the error was notified from the error notification means.Type: GrantFiled: October 23, 2012Date of Patent: August 30, 2016Assignee: Hitachi High-Technologies CorporationInventor: Naomi Ishii
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Sample-test-device management server, sample test device, sample test system, and sample test method
Patent number: 9377478Abstract: There is provided a sample test system which can execute a prior process for a specific sample in consideration of priorities and process progresses of a plurality of samples processed in the sample test system. The sample test system includes a sample-test-device management server 101, when a specific-sample prior process request containing a specific sample ID and a prior-process-request level identification code is accepted from a sample access system 108, which selects a specific-sample prior-process-policy determination table based on the prior-process-request level identification code attached to the specific-sample prior process request, which determines a specific-sample prior process policy based on the specific-sample prior-process-policy determination table and a process state of the sample, which specifies a sample ID regarding the specific sample ID, and which transmits the specific-sample prior process policy to a sample-test-device group 119.Type: GrantFiled: April 28, 2010Date of Patent: June 28, 2016Assignee: HITACHI HIGH-TECHNOLOGIES CORPORATIONInventors: Takashi Noguchi, Yoshiyuki Tajima, Koji Kamoshida, Naomi Ishii -
Patent number: 9229015Abstract: There is provided a comprehensive accuracy management method attained by including the steps of: displaying operation event information in time series in an accuracy management result chart or a calibration result chart on the same screen; accumulating a characteristic daily measurement value fluctuation pattern on the basis of a kind of an operation event; displaying the latest fluctuation pattern of measurement results and the daily measurement value fluctuation pattern in superposition with each other to warn of fluctuations which differ from the daily measurement value fluctuation pattern; and estimating and reporting the cause of the fluctuations.Type: GrantFiled: November 19, 2009Date of Patent: January 5, 2016Assignee: Hitachi High-Technologies CorporationInventors: Qing Li, Tomonori Mimura, Shinichi Fukuzono, Naomi Ishii
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Patent number: 9194876Abstract: A management server of a sample inspection system includes sample processing information generated on the basis of inspection request data, facility data, a simulation execution portion and a window generation portion for generating a monitor window. The inspection request data contains a priority, an order time, a required time and inspection items and the sample processing information contains an inspection start time and an inspection estimate finish time. The monitor window has a work area in which the samples represented by sample bars parallel to the abscissa are arranged in a vertical direction and a past record and a future schedule are allocated to this abscissa with the present time as the base. The sample bars display a simulation execution portion for executing simulation on the basis of the inspection start time, the inspection estimate finish time and a delay time. The management server displays the simulation result.Type: GrantFiled: March 23, 2010Date of Patent: November 24, 2015Assignee: HITACHI HIGH-TECHNOLOGIES CORPORATIONInventors: Tatsuya Tokunga, Naomi Ishii, Takashi Noguchi, Masaki Takano, Yayoi Shitara
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Publication number: 20150198579Abstract: An automatic analysis device includes: a factor storage unit 12b which stores each factor previously specified as a factor that could affect measurement accuracy of each of measurement items, while associating each factor with each measurement item; an abnormality judgment unit 103a which judges the presence/absence of an abnormality in a measurement value of each measurement item on the basis of an approximation formula and approximation formula parameters stored in an approximation formula storage unit 12a; and a factor judgment unit 103b which refers to the results of the judgment by the abnormality judgment unit 103a in a preset order, and would judge as an abnormality factor a factor stored in the factor storage unit 12b in association with a measurement item as an abnormality factor in a case where a plurality of measurement values regarding the measurement item have consecutively been judged to be abnormal.Type: ApplicationFiled: July 3, 2013Publication date: July 16, 2015Inventors: Naomi Ishii, Kumiko Kamihara
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Publication number: 20140250339Abstract: The system includes an analyzer that analyzes a sample, or a processing device that pre-processes the sample, and a management device that manages at least one of the analyzer and the processing device, wherein the management device includes: error detection means that detects errors in the analyzer or the processing device; storage means having stored therein an operator notification management table in which at least one operator is registered per kind of error; error notification means that notifies an error that the error detection means has detected to operators who are to individually handle the error, the means notifying on the basis of the operator notification management table and in accordance with the kind of error detected by the error detection means; and registration means that registers an operator, who has handled the error as a troubleshooter, among operators to whom the error was notified from the error notification means.Type: ApplicationFiled: October 23, 2012Publication date: September 4, 2014Applicant: HITACHI HIGH-TECHNOLOGIES CORPORATIONInventor: Naomi Ishii
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Publication number: 20130311243Abstract: An analyzing device requires regular maintenance for maintaining a predetermined analyzing performance thereof. However, the more complex the analyzing device becomes, the more number of maintenance items are provided. For example, if a plurality of types of maintenances to be performed by removing same component, efficiency may be improved by performing the same as a whole. However, when conforming with a manual, if recommended timings to perform the maintenance are shifted delicately, there is a probability of occurrence of a case where the same components are removed several times for maintenance during a short time. At the time when an instruction to perform maintenance is issued, maintenance items to be performed are extracted, the extracted maintenance items are sorted into a recommended performance order in conformity to a preset rule such that the similar maintenance or the maintenance of the same portion or the like are performed continuously.Type: ApplicationFiled: January 10, 2012Publication date: November 21, 2013Applicant: HITACHI HIGH-TECHNOLOGIES CORPORATIONInventors: Miki Taki, Naomi Ishii
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Patent number: 8383689Abstract: The present skin cosmetics comprising cocoon-shaped polymer fine particles having an average particle size of 1 to 8 ?m and cosmetic vehicles show an effect of making fine wrinkles on the skin unnoticeable, letting the skin appear smoother and fairer.Type: GrantFiled: April 29, 2009Date of Patent: February 26, 2013Assignee: Aica Kogyo Co., Ltd.Inventors: Koichiro Tanaka, Shunsaku Tanaka, Sadao Negayama, Naomi Ishii
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SAMPLE-TEST-DEVICE MANAGEMENT SERVER, SAMPLE TEST DEVICE, SAMPLE TEST SYSTEM, AND SAMPLE TEST METHOD
Publication number: 20120144009Abstract: There is provided a sample test system which can execute a prior process for a specific sample in consideration of priorities and process progresses of a plurality of samples processed in the sample test system. The sample test system includes a sample-test-device management server 101, when a specific-sample prior process request containing a specific sample ID and a prior-process-request level identification code is accepted from a sample access system 108, which selects a specific-sample prior-process-policy determination table based on the prior-process-request level identification code attached to the specific-sample prior process request, which determines a specific-sample prior process policy based on the specific-sample prior-process-policy determination table and a process state of the sample, which specifies a sample ID regarding the specific sample ID, and which transmits the specific-sample prior process policy to a sample-test-device group 119.Type: ApplicationFiled: April 28, 2010Publication date: June 7, 2012Applicant: HITACHI HIGH-TECHNOLOGIES CORPORATIONInventors: Takashi Noguchi, Yoshiyuki Tajima, Koji Kamoshida, Naomi Ishii -
Publication number: 20120000268Abstract: It is convenient and useful in inspection work to assess a fluctuation pattern of accuracy management results based on operation events occurring in a clinical laboratory and detect an abnormal fluctuation pattern before a control range is exceeded. However, an accuracy management system having such a function is not provided. When the cause of fluctuations in accuracy management results or calibration results is to be estimated, one depends on a variety of related information and one's specialized knowledge and experience. Much time and efforts are required to sort out useful pieces of information from useless ones and obtain organized information.Type: ApplicationFiled: November 19, 2009Publication date: January 5, 2012Inventors: Qing Li, Tomonori Mimura, Shinichi Fukuzono, Naomi Ishii
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Publication number: 20100278884Abstract: Previously proposed skin cosmetics have been compounded with spherical resin particles for the purpose of improving extendability on the skin, improving feel, and making fine wrinkles unnoticeable. However, these particles are insufficient in their effect of making fine wrinkles on the skin unnoticeable, and there has been demand for fine particles that let the skin appear smooth and fair. The present skin cosmetics comprising cocoon-shaped polymer fine particles having an average particle size of 1 to 8 ?m and cosmetic vehicles show an effect of making fine wrinkles on the skin unnoticeable, letting the skin appear smoother and fairer.Type: ApplicationFiled: April 29, 2009Publication date: November 4, 2010Inventors: Koichiro Tanaka, Shunsaku Tanaka, Sadao Negayama, Naomi Ishii
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Publication number: 20100250174Abstract: A management server of a sample inspection system includes sample processing information generated on the basis of inspection request data, facility data, a simulation execution portion and a window generation portion for generating a monitor window. The inspection request data contains a priority, an order time, a required time and inspection items and the sample processing information contains an inspection start time and an inspection estimate finish time. The monitor window has a work area in which the samples represented by sample bars parallel to the abscissa are arranged in a vertical direction and a past record and a future schedule are allocated to this abscissa with the present time as the base. The sample bars display a simulation execution portion for executing simulation on the basis of the inspection start time, the inspection estimate finish time and a delay time. The management server displays the simulation result.Type: ApplicationFiled: March 23, 2010Publication date: September 30, 2010Inventors: Tatsuya TOKUNAGA, Naomi Ishii, Takashi Noguchi, Masaki Takano, Yayoi Shitara