Patents by Inventor Naomi Ishii

Naomi Ishii has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 9978044
    Abstract: An analyzing device requires regular maintenance for maintaining a predetermined analyzing performance thereof. However, the more complex the analyzing device becomes, the more number of maintenance items are provided. For example, if a plurality of types of maintenances to be performed by removing same component, efficiency may be improved by performing the same as a whole. However, when conforming with a manual, if recommended timings to perform the maintenance are shifted delicately, there is a probability of occurrence of a case where the same components are removed several times for maintenance during a short time. At the time when an instruction to perform maintenance is issued, maintenance items to be performed are extracted, the extracted maintenance items are sorted into a recommended performance order in conformity to a preset rule such that the similar maintenance or the maintenance of the same portion or the like are performed continuously.
    Type: Grant
    Filed: January 10, 2012
    Date of Patent: May 22, 2018
    Assignee: Hitachi High-Technologies Corporation
    Inventors: Miki Taki, Naomi Ishii
  • Patent number: 9841413
    Abstract: An automatic analysis device includes: a factor storage unit 12b which stores each factor previously specified as a factor that could affect measurement accuracy of each of measurement items, while associating each factor with each measurement item; an abnormality judgment unit 103a which judges the presence/absence of an abnormality in a measurement value of each measurement item on the basis of an approximation formula and approximation formula parameters stored in an approximation formula storage unit 12a; and a factor judgment unit 103b which refers to the results of the judgment by the abnormality judgment unit 103a in a preset order, and would judge as an abnormality factor a factor stored in the factor storage unit 12b in association with a measurement item as an abnormality factor in a case where a plurality of measurement values regarding the measurement item have consecutively been judged to be abnormal.
    Type: Grant
    Filed: July 3, 2013
    Date of Patent: December 12, 2017
    Assignee: Hitachi High-Technologies Corporation
    Inventors: Naomi Ishii, Kumiko Kamihara
  • Patent number: 9430312
    Abstract: The system includes an analyzer that analyzes a sample, or a processing device that pre-processes the sample, and a management device that manages at least one of the analyzer and the processing device, wherein the management device includes: error detection means that detects errors in the analyzer or the processing device; storage means having stored therein an operator notification management table in which at least one operator is registered per kind of error; error notification means that notifies an error that the error detection means has detected to operators who are to individually handle the error, the means notifying on the basis of the operator notification management table and in accordance with the kind of error detected by the error detection means; and registration means that registers an operator, who has handled the error as a troubleshooter, among operators to whom the error was notified from the error notification means.
    Type: Grant
    Filed: October 23, 2012
    Date of Patent: August 30, 2016
    Assignee: Hitachi High-Technologies Corporation
    Inventor: Naomi Ishii
  • Patent number: 9377478
    Abstract: There is provided a sample test system which can execute a prior process for a specific sample in consideration of priorities and process progresses of a plurality of samples processed in the sample test system. The sample test system includes a sample-test-device management server 101, when a specific-sample prior process request containing a specific sample ID and a prior-process-request level identification code is accepted from a sample access system 108, which selects a specific-sample prior-process-policy determination table based on the prior-process-request level identification code attached to the specific-sample prior process request, which determines a specific-sample prior process policy based on the specific-sample prior-process-policy determination table and a process state of the sample, which specifies a sample ID regarding the specific sample ID, and which transmits the specific-sample prior process policy to a sample-test-device group 119.
    Type: Grant
    Filed: April 28, 2010
    Date of Patent: June 28, 2016
    Assignee: HITACHI HIGH-TECHNOLOGIES CORPORATION
    Inventors: Takashi Noguchi, Yoshiyuki Tajima, Koji Kamoshida, Naomi Ishii
  • Patent number: 9229015
    Abstract: There is provided a comprehensive accuracy management method attained by including the steps of: displaying operation event information in time series in an accuracy management result chart or a calibration result chart on the same screen; accumulating a characteristic daily measurement value fluctuation pattern on the basis of a kind of an operation event; displaying the latest fluctuation pattern of measurement results and the daily measurement value fluctuation pattern in superposition with each other to warn of fluctuations which differ from the daily measurement value fluctuation pattern; and estimating and reporting the cause of the fluctuations.
    Type: Grant
    Filed: November 19, 2009
    Date of Patent: January 5, 2016
    Assignee: Hitachi High-Technologies Corporation
    Inventors: Qing Li, Tomonori Mimura, Shinichi Fukuzono, Naomi Ishii
  • Patent number: 9194876
    Abstract: A management server of a sample inspection system includes sample processing information generated on the basis of inspection request data, facility data, a simulation execution portion and a window generation portion for generating a monitor window. The inspection request data contains a priority, an order time, a required time and inspection items and the sample processing information contains an inspection start time and an inspection estimate finish time. The monitor window has a work area in which the samples represented by sample bars parallel to the abscissa are arranged in a vertical direction and a past record and a future schedule are allocated to this abscissa with the present time as the base. The sample bars display a simulation execution portion for executing simulation on the basis of the inspection start time, the inspection estimate finish time and a delay time. The management server displays the simulation result.
    Type: Grant
    Filed: March 23, 2010
    Date of Patent: November 24, 2015
    Assignee: HITACHI HIGH-TECHNOLOGIES CORPORATION
    Inventors: Tatsuya Tokunga, Naomi Ishii, Takashi Noguchi, Masaki Takano, Yayoi Shitara
  • Publication number: 20150198579
    Abstract: An automatic analysis device includes: a factor storage unit 12b which stores each factor previously specified as a factor that could affect measurement accuracy of each of measurement items, while associating each factor with each measurement item; an abnormality judgment unit 103a which judges the presence/absence of an abnormality in a measurement value of each measurement item on the basis of an approximation formula and approximation formula parameters stored in an approximation formula storage unit 12a; and a factor judgment unit 103b which refers to the results of the judgment by the abnormality judgment unit 103a in a preset order, and would judge as an abnormality factor a factor stored in the factor storage unit 12b in association with a measurement item as an abnormality factor in a case where a plurality of measurement values regarding the measurement item have consecutively been judged to be abnormal.
    Type: Application
    Filed: July 3, 2013
    Publication date: July 16, 2015
    Inventors: Naomi Ishii, Kumiko Kamihara
  • Publication number: 20140250339
    Abstract: The system includes an analyzer that analyzes a sample, or a processing device that pre-processes the sample, and a management device that manages at least one of the analyzer and the processing device, wherein the management device includes: error detection means that detects errors in the analyzer or the processing device; storage means having stored therein an operator notification management table in which at least one operator is registered per kind of error; error notification means that notifies an error that the error detection means has detected to operators who are to individually handle the error, the means notifying on the basis of the operator notification management table and in accordance with the kind of error detected by the error detection means; and registration means that registers an operator, who has handled the error as a troubleshooter, among operators to whom the error was notified from the error notification means.
    Type: Application
    Filed: October 23, 2012
    Publication date: September 4, 2014
    Applicant: HITACHI HIGH-TECHNOLOGIES CORPORATION
    Inventor: Naomi Ishii
  • Publication number: 20130311243
    Abstract: An analyzing device requires regular maintenance for maintaining a predetermined analyzing performance thereof. However, the more complex the analyzing device becomes, the more number of maintenance items are provided. For example, if a plurality of types of maintenances to be performed by removing same component, efficiency may be improved by performing the same as a whole. However, when conforming with a manual, if recommended timings to perform the maintenance are shifted delicately, there is a probability of occurrence of a case where the same components are removed several times for maintenance during a short time. At the time when an instruction to perform maintenance is issued, maintenance items to be performed are extracted, the extracted maintenance items are sorted into a recommended performance order in conformity to a preset rule such that the similar maintenance or the maintenance of the same portion or the like are performed continuously.
    Type: Application
    Filed: January 10, 2012
    Publication date: November 21, 2013
    Applicant: HITACHI HIGH-TECHNOLOGIES CORPORATION
    Inventors: Miki Taki, Naomi Ishii
  • Patent number: 8383689
    Abstract: The present skin cosmetics comprising cocoon-shaped polymer fine particles having an average particle size of 1 to 8 ?m and cosmetic vehicles show an effect of making fine wrinkles on the skin unnoticeable, letting the skin appear smoother and fairer.
    Type: Grant
    Filed: April 29, 2009
    Date of Patent: February 26, 2013
    Assignee: Aica Kogyo Co., Ltd.
    Inventors: Koichiro Tanaka, Shunsaku Tanaka, Sadao Negayama, Naomi Ishii
  • Publication number: 20120144009
    Abstract: There is provided a sample test system which can execute a prior process for a specific sample in consideration of priorities and process progresses of a plurality of samples processed in the sample test system. The sample test system includes a sample-test-device management server 101, when a specific-sample prior process request containing a specific sample ID and a prior-process-request level identification code is accepted from a sample access system 108, which selects a specific-sample prior-process-policy determination table based on the prior-process-request level identification code attached to the specific-sample prior process request, which determines a specific-sample prior process policy based on the specific-sample prior-process-policy determination table and a process state of the sample, which specifies a sample ID regarding the specific sample ID, and which transmits the specific-sample prior process policy to a sample-test-device group 119.
    Type: Application
    Filed: April 28, 2010
    Publication date: June 7, 2012
    Applicant: HITACHI HIGH-TECHNOLOGIES CORPORATION
    Inventors: Takashi Noguchi, Yoshiyuki Tajima, Koji Kamoshida, Naomi Ishii
  • Publication number: 20120000268
    Abstract: It is convenient and useful in inspection work to assess a fluctuation pattern of accuracy management results based on operation events occurring in a clinical laboratory and detect an abnormal fluctuation pattern before a control range is exceeded. However, an accuracy management system having such a function is not provided. When the cause of fluctuations in accuracy management results or calibration results is to be estimated, one depends on a variety of related information and one's specialized knowledge and experience. Much time and efforts are required to sort out useful pieces of information from useless ones and obtain organized information.
    Type: Application
    Filed: November 19, 2009
    Publication date: January 5, 2012
    Inventors: Qing Li, Tomonori Mimura, Shinichi Fukuzono, Naomi Ishii
  • Publication number: 20100278884
    Abstract: Previously proposed skin cosmetics have been compounded with spherical resin particles for the purpose of improving extendability on the skin, improving feel, and making fine wrinkles unnoticeable. However, these particles are insufficient in their effect of making fine wrinkles on the skin unnoticeable, and there has been demand for fine particles that let the skin appear smooth and fair. The present skin cosmetics comprising cocoon-shaped polymer fine particles having an average particle size of 1 to 8 ?m and cosmetic vehicles show an effect of making fine wrinkles on the skin unnoticeable, letting the skin appear smoother and fairer.
    Type: Application
    Filed: April 29, 2009
    Publication date: November 4, 2010
    Inventors: Koichiro Tanaka, Shunsaku Tanaka, Sadao Negayama, Naomi Ishii
  • Publication number: 20100250174
    Abstract: A management server of a sample inspection system includes sample processing information generated on the basis of inspection request data, facility data, a simulation execution portion and a window generation portion for generating a monitor window. The inspection request data contains a priority, an order time, a required time and inspection items and the sample processing information contains an inspection start time and an inspection estimate finish time. The monitor window has a work area in which the samples represented by sample bars parallel to the abscissa are arranged in a vertical direction and a past record and a future schedule are allocated to this abscissa with the present time as the base. The sample bars display a simulation execution portion for executing simulation on the basis of the inspection start time, the inspection estimate finish time and a delay time. The management server displays the simulation result.
    Type: Application
    Filed: March 23, 2010
    Publication date: September 30, 2010
    Inventors: Tatsuya TOKUNAGA, Naomi Ishii, Takashi Noguchi, Masaki Takano, Yayoi Shitara