Abstract: The present invention relates to diagnostic device for the characterization of electromagnetic material properties and a method of making and using same. Unlike current diagnostic devices, the disclosed diagnostic device comprises a novel waveguide system and is suitable for the characterization of electromagnetic material properties such as permittivity, permeability, and the loss tangent of materials over a broad temperature and pressure range.

Abstract: A method of determining a refractive index of a material sample comprises removably mounting the material sample into a sample holder having a thermal control mechanism, a thermal expansion compensation mechanism, and a rotation mechanism; projecting a laser beam into the material sample, wherein the material sample has a predetermined orientation and temperature, wherein the material sample has parallel sides defining parallel planes for entry and exit of the laser beam into and out of the material sample; collecting a refracted laser beam from the material sample, and determining the refractive index for the material sample at the predetermined temperature. The laser beam may be a visible laser and/or an infrared laser. The thermal control mechanism comprises a thermal controller coupled to an induction coil apparatus and a temperature sensor. The sample holder comprises a refractory metal consisting of one or more of a niobium/molybdenum alloy and a tantalum/tungsten alloy.