Abstract: A method of policy management and control on a mobile phone. The method comprises receiving a user interface change request by a launcher application executing on the mobile phone, requesting permissions from an interface control application programming interface (API) by the launcher application, receiving a response from the interface control application programming interface by the launcher application, where the response indicates if the user interface change is permitted, and enforcing the received permission by the launcher application, where enforcing the received permission comprises executing the user interface change request when the user interface change is permitted, and where enforcing the received permissions comprises not executing the user interface change request and presenting a message to a user of the mobile phone when the user interface change is restricted.

Abstract: An extended reach inspection apparatus may include a scanner device and a robotic manipulator arm. The robotic manipulator arm may include a plurality of arm segments including a distal end arm segment and a proximal end arm segment. A movable joint may couple the distal end arm segment to the robotic manipulator arm. A telescoping extension mechanism may be coupled to the distal end arm segment. The scanner device is mounted to the telescoping extension mechanism for moving the scanner device between a retracted position proximate the robotic manipulator arm and an extended position at a distance from the robotic manipulator arm. A control handle may be coupled to the proximal end arm segment of the plurality of arm segments for manipulating the robotic manipulator arm.

Abstract: A method of standardizing ultrasonic flaw detectors utilizing electronic porosity standards which includes the steps of obtaining bandwidth characteristics of an ultrasonic flaw detector, obtaining broadband porosity attenuation characteristics of porosity samples, and generating porosity vs. attenuation curves calibrated to the apparatus using the bandwidth characteristics and the broadband porosity attenuation characteristics.

Abstract: A method of policy management and control on a mobile phone. The method comprises receiving a user interface change request by a launcher application executing on the mobile phone, requesting permissions from an interface control application programming interface (API) by the launcher application, receiving a response from the interface control application programming interface by the launcher application, where the response indicates if the user interface change is permitted, and enforcing the received permission by the launcher application, where enforcing the received permission comprises executing the user interface change request when the user interface change is permitted, and where enforcing the received permissions comprises not executing the user interface change request and presenting a message to a user of the mobile phone when the user interface change is restricted.

Abstract: An apparatus for measuring porosity of a structure includes an ultrasonic transducer device configured to be pressed against a structure, the ultrasonic transducer device being further configured to emit ultrasonic pulses into the structure and detect echo profiles; and an electronic device including: a manager having an interface gate, a back-surface sensing gate and a back surface analysis gate; a pulse generator interfacing with the manager and the ultrasonic transducer device; a data acquisition device interfacing with the ultrasonic transducer device and the manager; and a display having a porosity indicator interfacing with the manager.

Abstract: A microchip handling system has a pair of probes with suction cups for handling microchips. An improved microchip holding device is used in lieu of the suction cups to pick up and hold microchips. The microchip holding device has a head accommodating an annular sleeve that retains the microchip in spaced holding relationship relative to a body. The sleeve establishes a large annular space whereby the vacuum force has a large surface area for holding the microchip in engagement with the sleeve.

Abstract: A microchip tray handling apparatus has microchip loading and receiving units for supplying microchips to a microchip tester and receiving tested microchips. The units have tables to support stacks of trays containing microchips. Each unit has a tray holding assembly for raising a stack of trays to allow a bottom tray to be moved along the table. Pick, invert and place probes remove micro chips from the trays and place tested microchips back into the trays.

Abstract: A microchip tray handling apparatus has microchip loading and receiving units for supplying microchips to a microchip tester and receiving tested microchips. The units have tables to support stacks of trays containing microchips. Each unit has a tray holding assembly for raising a stack of trays to allow a bottom tray to allow a bottom tray to be moved along the table. Pick, invert and place probes remove microchips from the trays and place tested microchips back into the trays.

Abstract: A microchip tray handling apparatus has microchip loading and receiving units for supplying microchips to a microchip tester and receiving tested microchips. The units have tables to support stacks of trays containing microchips. Each unit has a tray holding assembly for raising a stack of trays to allow a bottom tray to allow a bottom tray to be moved along the table. Pick, invert and place probes remove microchips from the trays and place tested microchips back into the trays.

Abstract: An inertial parts feeding apparatus and method for dispensing parts, such as microchips, onto a moving belt. The feeding apparatus has a housing supporting an elongated tube accommodating the microchips. A guide mounted on the housing aligns the tube with an arm having an impact shoulder and a microchip stop finger. A roller, engageable with the tube, driven by a stepping motor, moves the tube longitudinally into engagement with the shoulder causing a microchip to move out of the end of the tube and into engagement with the stop finger. The arm is released from the microchip during the time that the tube moves back to its initial position to allow the microchip to move with the belt.

Abstract: Apparatus (10) for handling devices for testing under varying temperature conditions is disclosed including a mechanical arm (32) pivotally mounted by a bearing (34) to a control portion (16) which is variably vertically positionable relative to a platform portion (14). An insert arm (38) is rotatably mounted within the mechanical arm (32) to reciprocally and rotatably mount a thermal socket (90) for mating with a contactor (126). The socket (90) is mounted to a vacuum cup (48) to allow position alignment as alignment pins (132) are initially slideably received in alignment notches (124) and when no vacuum is applied and is fixed in the aligned position after the application of vacuum. Thermal tubes (74) of probes (50) are reciprocal with the thermal socket (90) to provide thermally conditioned gas/air to the thermal socket (90). The thermal socket (90) provides a swirling action to the thermally conditioned gas/air to exit 360.degree.

Abstract: A system for positioning an electronic test head of a test system with respect to an electronic device handler. A positioner assembly moves vertically and provides substantial movement in the horizontal plane with six degrees of freedom. The positioner assembly includes a section for attaching the test head. A counterbalancing assembly is coupled to the positioner assembly to provide a substantially weightless condition to the positioner assembly with the test head attached.

Abstract: Apparatus (10) for handling devices for testing under varying temperature conditions is disclosed including a mechanical arm (32) pivotally mounted by a bearing (34) to a control portion (16) which is variably vertically positionable relative to a platform portion (14). An insert arm (38) is rotatably mounted within the mechanical arm (32) to reciprocally and rotatably mount a thermal socket (90) for mating with a contactor (126). The socket (90) is mounted to a vacuum cup (48) to allow position alignment as alignment pins (132) are initially slideably received in alignment notches (124) and when no vacuum is applied and is fixed in the aligned position after the application of vacuum. Thermal tubes (74) of probes (50) are reciprocal with the thermal socket (90) to provide thermally conditioned gas/air to the thermal socket (90). The thermal socket (90) provides a swirling action to the thermally conditioned gas/air to exit 360.degree.

Abstract: Apparatus is disclosed for optically detecting the position of an edge of a workpiece (such as an IC lead tip) in a sensing plane, involving the emission of electromagnetic energy from a known source region in the sensing plane such as to cause the edge to create a shadow having a penumbra in the sensing plane. Two detectors determine the amount of energy which reach two known detection regions in the sensing plane and wholly within the penumbra. The amount of energy detected by one detector determines a first curve in the sensing plane on which the edge must lie, and the amount of energy detected by the other determines a second such curve. The intersection of these two curves fully determines the position of the edge in the sensing plane. Preferably, the source region and both detector regions are all essentially line segments oriented parallel to a z-axis, the two detection regions being disposed axially but spaced from each other.

Abstract: A system for positioning an electronic test head of a test system with respect to an electronic device handler. A positioner assembly moves vertically and provides substantial movement in the horizontal plane with six degrees of freedom. The positioner assembly includes a section for attaching the test head. A counterbalancing assembly is coupled to the positioner assembly to provide a substantially weightless condition to the positioner assembly with the test head attached.

Abstract: The invention of the present document comprises apparatus for receiving and automatically feeding dual-in-line package (DIP) transportation and storage tubes (24) to the singulator (76) of an integrated circuit device handler (20) so that devices (22) in the tubes (24) can be introduced at the singulator (76). The tubes (24) are randomly placed in a hopper (66), and conveyed through an aperture (170) formed in a side wall (172) of the hopper (66). An elevator (74) is provided to raise the tubes (24) to a height at which open ends thereof are disposed above the height of the singulator (76). With a tube (24) so raised, a tube inserter (96) pushes the tube (24) into the tube holder (98) of a manipulator (100). The tube holder (98) is, in turn, pivoted to tilt the tube (24) so that devices (22) within the tube (24) are deposited for introduction into the singulator (76 ).

Abstract: A system for positioning an electronic test head of a test system with respect to an electronic device handler. A positioner assembly moves vertically and provides substantial movement in the horizontal plane with six degrees of freedom. The positioner assembly includes a section for attaching the test head. A counterbalancing assembly is coupled to the positioner assembly to provide a substantially weightless condition to the positioner assembly with the test head attached.

Abstract: A system for positioning an electronic test head of a test system with respect to an electronic device handler. A housing is provided having a vertical shaft. A positioner assembly moves vertically with respect to the shaft and provides substantial movement in the horizontal plane with six degrees of freedom. The positioner assembly includes a section for attaching the test head. A counterbalancing assembly is coupled to the positioner assembly and has a counterweight to provide a substantially weightless condition to the positioner assembly with the test head attached.

Abstract: A system for positioning an electronic test head of a test system with respect to an electronic device handler. A housing is provided having a vertical shaft. A positioner assembly moves vertically with respect to the shaft and provides substantial movement in the horizontal plane with six degrees of freedom. The positioner assembly includes a section for attaching the test head. A counterbalancing assembly is coupled to the positioner assembly and has a counterweight to provide a substantially weightless condition to the positioner assembly with the test head attached.

Abstract: An orientation system forms part of a magnetic core handling system using an oscillating feed cup causing magnetic cores to roll across an arcuate surface into a tapered slot and communicate with an index feed wheel. The index feed wheel has 50 slots formed around the edge thereof, each slot being in communication with a vacuum line to engage and hold the edge of the cores with the open center portion being exposed for testing. The index wheel is controlled without bounce through the use of a permanent magnetic stepping motor. The motor is controlled through four series of pulses for different field phases of the motor to control its movement. A single standard split pin probe is used for testing the magnetic cores and the probe does not come in contact with the core. A storage memory system is used to determine whether the core tested previously a plurality of slots from the accept or reject sorter determines the reservoir into which the cores will be collected.