Patents by Inventor Naveen V. Nair

Naveen V. Nair has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Eddy current inspection system
    Publication number: 20100045276
    Abstract: An innovative method is provided for assessing structural integrity of a sample. The method comprises: capturing a signal indicative of magnetic flux density caused by an Eddy current flowing in the sample; extracting an envelope of the captured signal using a demodulation scheme; sampling the envelope at a frequency that is lower than the frequency of the excitation current signal which generated the Eddy current; and examining the sampled envelope to assess structural integrity of the sample.
    Type: Application
    Filed: January 24, 2008
    Publication date: February 25, 2010
    Applicant: Board of Trustees of Michigan State University
    Inventors: Satish Udpa, Lalita Udpa, Naveen V. Nair, Vikram Reddy Melapudi