Patents by Inventor Neelesh G. Pai

Neelesh G. Pai has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Method and apparatus for test and repair of marginally functional SRAM cells
    Patent number: 7210085
    Abstract: A method of manufacturing a device having embedded memory including a plurality of memory cells. During manufacturing test, a first test stress is applied to selected cells of the plurality of memory cells with a built-in self test. At least one weak memory cell is identified. The at least one weak memory cell is repaired. A second test stress is applied to the selected cells and the repaired cells with the built-in self test.
    Type: Grant
    Filed: December 2, 2003
    Date of Patent: April 24, 2007
    Assignee: International Business Machines Corporation
    Inventors: Ciaran J. Brennan, Steven M. Eustis, Michael T. Fragano, Michael R. Ouellette, Neelesh G. Pai, Jeremy P. Rowland, Kevin M. Tompsett, David J. Wager