Abstract: An integrated circuit (IC) includes first and second secure memory elements storing identical data and a memory management system that executes a memory operation on the first secure memory element and a control operation on the second secure memory element simultaneously. The control operation is associated with safety of the IC and is executed to enable error detection in the second secure memory element, fault injection for the second secure memory element, masking of a power profile associated with the memory operation, or a combination thereof. After the execution of the memory operation and the control operation, the memory management system copies the data of the first secure memory element to the second secure memory element to maintain sanity of the second secure memory element.

Abstract: An integrated circuit includes a secure asset, a security system, and an efficacy decoder. The security system is triggered to operate in one of its functional states. Further, the security system receives various test requests for an access to the secure asset, and determines, based on the triggered functional state thereof, one or more test requests authorized to access the secure asset. The efficacy decoder similarly receives the test requests and determines one or more allowable requests for the triggered functional state of the security system. Further, the efficacy decoder determines an efficacy value for the security system based on a comparison between the test requests authorized by the security system and the allowable requests associated with the triggered functional state. The efficacy value is indicative of a security level of the security system operating in the triggered functional state.

Abstract: An integrated circuit includes a functional circuit, a detection circuit, a processing circuit, and a recovery circuit. The detection circuit detects a fault in the functional circuit and generates a fault indication indicative of the detected fault. The processing circuit receives the fault indication and identifies a functional domain identifier (ID) associated with the fault. Based on the fault indication, the processing circuit generates context tag data that is indicative of a type of the fault and an operational state of the functional circuit when the fault is detected therein. Further, the processing circuit assigns a priority level to the fault based on the context tag data and the functional domain ID. The recovery circuit performs, based on the functional domain ID, the context tag data, and the first priority level, a recovery operation to recover the functional circuit from the fault.

Abstract: An integrated circuit includes a functional circuit, a detection circuit, a processing circuit, and a recovery circuit. The detection circuit detects a fault in the functional circuit and generates a fault indication indicative of the detected fault. The processing circuit receives the fault indication and identifies a functional domain identifier (ID) associated with the fault. Based on the fault indication, the processing circuit generates context tag data that is indicative of a type of the fault and an operational state of the functional circuit when the fault is detected therein. Further, the processing circuit assigns a priority level to the fault based on the context tag data and the functional domain ID. The recovery circuit performs, based on the functional domain ID, the context tag data, and the first priority level, a recovery operation to recover the functional circuit from the fault.

Abstract: A fault recovery system including a fault controller is disclosed. The fault controller is coupled between a processor and an interconnect, and configured to receive a time-out signal that is indicative of a failure of the processor to execute a transaction after a fault is detected in the processor. The failure in the execution of the transaction results in queuing of the interconnect. Based on the time-out signal, the fault controller is further configured to generate and transmit a control signal to the processor to disconnect the processor from the interconnect. Further, the fault controller is configured to execute the transaction, and in turn, dequeue the interconnect. When the transaction is successfully executed, the fault controller is further configured to generate a status signal to reset the processor, thereby managing a fault recovery of the processor.

Abstract: A fault recovery system includes various fault management circuits that form a hierarchical structure. One fault management circuit detects a fault in a functional circuit and executes a recovery operation to recover the functional circuit from the fault. When the fault management circuit fails to recover the functional circuit from the fault within a predetermined time duration, a fault management circuit that is in a higher hierarchical level executes another recovery operation to recover the functional circuit from the fault. Such a fault management circuit is required to execute the corresponding recovery operation within another predetermined time duration to successfully recover the functional circuit from the fault. The fault recovery system thus implements the hierarchical structure of fault management circuits to recover the functional circuit from the fault.

Abstract: A lockstep testing system includes a lockstep controller that generates various control signals. The lockstep testing system further includes various lockstep circuitries, with each lockstep circuitry including primary and redundant functional circuits that are operable in a lockstep mode, and a fault injection circuit that receives a control signal from the lockstep controller and injects a transient fault in the corresponding lockstep circuitry. The transient fault can be injected at one of input and output stages of the primary and redundant functional circuits. Each lockstep circuitry further includes a checker circuit that tests whether the corresponding lockstep circuitry is faulty (i.e., whether the injected fault is accurately detected), and generates and provides, to the lockstep controller, a fault indication signal indicating whether the corresponding lockstep circuitry is faulty.

Abstract: A system-on-chip (SoC) is disclosed. The SoC includes a fault controlling circuit and processing circuits. The fault controlling circuit is configured to receive fault events generated by fault sources of the SoC and categorize the fault events based on a priority associated with each fault event. The fault controlling circuit is further configured to identify corresponding fault reactions for the categorized fault events and generate a set of recovery signals based on the identified fault reactions. The processing circuits are configured to receive the fault events, and further configured to receive the set of recovery signals to recover from the fault events. The fault controlling circuit thus acts as a central control system for controlling faults in the SoC.

Abstract: A clock sweeping system includes multiple delay elements and a selection circuit. The delay elements are configured to generate multiple delayed clock signals. Each delay element is configured to receive an input signal and delay the input signal to generate a corresponding first delayed clock signal. The input signal is one of a first clock signal, a second clock signal, and a corresponding output signal generated by a previous delay element. The selection circuit is configured to select and output, based on a first select signal for a plurality of times, a corresponding second delayed clock signal as a first output clock signal. The selection circuit is further configured to select and output, based on a second select signal, one of the first and second clock signals as a second output clock signal. The first output clock signal is asynchronous with respect to the second output clock signal.

Abstract: A lockstep testing system includes a lockstep controller that generates various control signals. The lockstep testing system further includes various lockstep circuitries, with each lockstep circuitry including primary and redundant functional circuits that are operable in a lockstep mode, and a fault injection circuit that receives a control signal from the lockstep controller and injects a transient fault in the corresponding lockstep circuitry. The transient fault can be injected at one of input and output stages of the primary and redundant functional circuits. Each lockstep circuitry further includes a checker circuit that tests whether the corresponding lockstep circuitry is faulty (i.e., whether the injected fault is accurately detected), and generates and provides, to the lockstep controller, a fault indication signal indicating whether the corresponding lockstep circuitry is faulty.

Abstract: A system-on-chip (SoC) includes multiple critical components and a testing system to test the critical components. The critical components include an intellectual property (IP) core and an associated logic circuit. The testing system includes a controller, a fault injector, and a masking circuit. The controller is configured to receive a test initiation request and generate first and second select instructions. The fault injector is configured to generate and inject a set of fault inputs in the logic circuit based on the first select instruction to test the associated logic circuit and the IP core. The IP core is configured to generate a set of responses that is associated with the testing of the logic circuit and the associated IP core. The masking circuit is configured to mask and output the set of responses when the second select instruction indicates a first value and a second value, respectively.

Abstract: A clock sweeping system includes multiple delay elements and a selection circuit. The delay elements are configured to generate multiple delayed clock signals. Each delay element is configured to receive an input signal and delay the input signal to generate a corresponding first delayed clock signal. The input signal is one of a first clock signal, a second clock signal, and a corresponding output signal generated by a previous delay element. The selection circuit is configured to select and output, based on a first select signal for a plurality of times, a corresponding second delayed clock signal as a first output clock signal. The selection circuit is further configured to select and output, based on a second select signal, one of the first and second clock signals as a second output clock signal. The first output clock signal is asynchronous with respect to the second output clock signal.

Abstract: A system-on-chip (SoC) is disclosed. The SoC includes a fault controlling circuit and processing circuits. The fault controlling circuit is configured to receive fault events generated by fault sources of the SoC and categorize the fault events based on a priority associated with each fault event. The fault controlling circuit is further configured to identify corresponding fault reactions for the categorized fault events and generate a set of recovery signals based on the identified fault reactions. The processing circuits are configured to receive the fault events, and further configured to receive the set of recovery signals to recover from the fault events. The fault controlling circuit thus acts as a central control system for controlling faults in the SoC.

Abstract: A fault recovery system including a fault controller is disclosed. The fault controller is coupled between a processor and an interconnect, and configured to receive a time-out signal that is indicative of a failure of the processor to execute a transaction after a fault is detected in the processor. The failure in the execution of the transaction results in queuing of the interconnect. Based on the time-out signal, the fault controller is further configured to generate and transmit a control signal to the processor to disconnect the processor from the interconnect. Further, the fault controller is configured to execute the transaction, and in turn, dequeue the interconnect. When the transaction is successfully executed, the fault controller is further configured to generate a status signal to reset the processor, thereby managing a fault recovery of the processor.

Abstract: A system-on-chip (SoC) includes multiple critical components and a testing system to test the critical components. The critical components include an intellectual property (IP) core and an associated logic circuit. The testing system includes a controller, a fault injector, and a masking circuit. The controller is configured to receive a test initiation request and generate first and second select instructions. The fault injector is configured to generate and inject a set of fault inputs in the logic circuit based on the first select instruction to test the associated logic circuit and the IP core. The IP core is configured to generate a set of responses that is associated with the testing of the logic circuit and the associated IP core. The masking circuit is configured to mask and output the set of responses when the second select instruction indicates a first value and a second value, respectively.

Abstract: A system-on-chip (SoC) is disclosed. The SoC includes a set of fake fault injection circuits and a critical intellectual property (IP) core that includes first and second control circuits. The first and second control circuits are each operable in a test mode and a functional mode. The first and second control circuits are operated in the functional mode in lockstep in an absence of a fake fault input. In a presence of the fake fault input, one of the first and second control circuits is switched from the functional mode to the test mode. One of the first and second control circuits operating the test mode generates a fake fault response for the fake fault input. The critical IP core is determined as one of error-free and erroneous based on a detection of the generated fake fault response as one of error-free and erroneous, respectively.

Abstract: A clock glitch alerting circuit is configured to detect a glitch in an input clock signal, and activate and provide an alert signal to a security controller when the glitch is detected. The clock glitch alerting circuit is further configured to delay the input clock signal based on multiple selection signals, and provide one of a delayed clock output signal and a filtered clock output signal to the security controller based on the alert signal. The clock glitch alerting circuit is further configured to generate and provide a count value to the security controller that indicates a time duration available by the security controller to execute a security critical operation after receiving the activated alert signal.

Abstract: An integrated circuit (IC) having a clock switch that switches the system clock between an internal clock and an external clock based on whether or not the IC has finished downloading device configuration at boot and on whether or not the internal clock is functional. Further restrictions on the use of the external clock are imposed by the clock switch based on a life-cycle state of the IC. The use of the clock switch makes it significantly more difficult for the clock to be tampered with, thereby protecting the security settings of the IC and/or preventing unauthorized access to secure data stored on the IC using an external-clock-based security attack.

Abstract: An integrated circuit (IC) having a clock switch that switches the system clock between an internal clock and an external clock based on whether or not the IC has finished downloading device configuration at boot and on whether or not the internal clock is functional. Further restrictions on the use of the external clock are imposed by the clock switch based on a life-cycle state of the IC. The use of the clock switch makes it significantly more difficult for the clock to be tampered with, thereby protecting the security settings of the IC and/or preventing unauthorized access to secure data stored on the IC using an external-clock-based security attack.

Abstract: A method for reducing leakage current of a delay line on a static net is provided. The static net provides a signal communication path between a data output of a first flip-flop and a data input of a second flip-flop via the delay line. The delay line is designed using standard cells but the standard cells are selected based on leakage power consumption in order to reduce the leakage power consumption of the delay line.