Patents by Inventor Nenad Ocelic

Nenad Ocelic has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Method for measuring the near-field signal
    Patent number: 9043946
    Abstract: The present invention relates to a method for measuring the near-field signal of a sample in a scattering type near-field microscope and to a device for conducting said method.
    Type: Grant
    Filed: December 19, 2012
    Date of Patent: May 26, 2015
    Assignee: Neaspec GmbH
    Inventor: Nenad Ocelic
  • METHOD FOR MEASURING THE NEAR-FIELD SIGNAL
    Publication number: 20150089694
    Abstract: The present invention relates to a method for measuring the near-field signal of a sample in a scattering type near-field microscope and to a device for conducting said method.
    Type: Application
    Filed: December 19, 2012
    Publication date: March 26, 2015
    Applicant: Neaspec GmbH
    Inventor: Nenad Ocelic
  • Near field optical microscope
    Patent number: 8832861
    Abstract: The invention relates to a device for conducting near-field optical measurements of a specimen, a method for conducting near-field optical measurements and the use of the device.
    Type: Grant
    Filed: March 12, 2010
    Date of Patent: September 9, 2014
    Assignee: Neaspec GmbH
    Inventor: Nenad Ocelic
  • NEAR FIELD OPTICAL MICROSCOPE WITH OPTICAL IMAGING SYSTEM
    Publication number: 20130145505
    Abstract: The invention relates to a device for conducting near-field optical measurements of a specimen comprising an optical imaging system, the use of such device and to a method for adjusting the probe or the illumination of the probe in such a device.
    Type: Application
    Filed: February 21, 2011
    Publication date: June 6, 2013
    Applicant: Neaspec GmbH
    Inventors: Nenad Ocelic, Florian Huth
  • NEAR FIELD OPTICAL MICROSCOPE
    Publication number: 20120005793
    Abstract: The invention relates to a device for conducting near-field optical measurements of a specimen, a method for conducting near-field optical measurements and the use of the device.
    Type: Application
    Filed: March 12, 2010
    Publication date: January 5, 2012
    Inventor: Nenad Ocelic
  • Optical device for measuring modulated signal light
    Patent number: 7738115
    Abstract: An optical device for determining at least one signal light component being characteristic for an optical near-field interaction of a probe with an object to be investigated, wherein the near-field interaction is subjected to a fundamental modulation at a fundamental frequency ?, comprises an interferometer device with an illumination light path (I) being directed to the probe, a reference light path (II) being directed to a detector device for obtaining detector output signals including signal light components, and a signal light path (III) being directed from the probe to the detector device, wherein the reference and signal light paths (II, III) are superimposed at the detector device, and a demodulation device for determining the signal light components by demodulating the detector output signals, wherein the reference light path (II) does not contain the probe, an interferometer phase modulator is arranged in the reference light path (II) or signal light path (III) for changing an interferometer phase co
    Type: Grant
    Filed: September 27, 2006
    Date of Patent: June 15, 2010
    Assignee: Max-Planck-Gesellschaft zur Forderung der Wissenschaften e.V.
    Inventors: Nenad Ocelic, Rainer Hillenbrand
  • Optical Device for Measuring Modulated Signal Light
    Publication number: 20080285041
    Abstract: An optical device for determining at least one signal light component being characteristic for an optical near-field interaction of a probe with an object to be investigated, wherein the near-field interaction is subjected to a fundamental modulation at a fundamental frequency ?, comprises an interferometer device with an illumination light path (I) being directed to the probe, a reference light path (II) being directed to a detector device for obtaining detector output signals including signal light components, and a signal light path (III) being directed from the probe to the detector device, wherein the reference and signal light paths (II, III) are superimposed at the detector device, and a demodulation device for determining the signal light components by demodulating the detector output signals, wherein the reference light path (II) does not contain the probe, an interferometer phase modulator is arranged in the reference light path (II) or signal light path (III) for changing an interferometer phase co
    Type: Application
    Filed: September 27, 2006
    Publication date: November 20, 2008
    Applicant: Max-Planck-Gesellschaft Zur Forderung der Wissenschaften E.V.
    Inventors: Nenad Ocelic, Rainer Hillenbrand