Patents by Inventor Neung-goo Yoon

Neung-goo Yoon has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20030159713
    Abstract: Provided is an apparatus and method for cleaning and drying a semiconductor wafer. Isopropyl alcohol and deionized water are premixed in a desired ratio before a cleaning solution containing isopropyl alcohol and deionized water is supplied into a treating bath. Accordingly, a chemical compound remaining due to deionized water can be effectively removed and the creation of water marks due to isopropyl alcohol can be effectively prevented. As a result, cleaning and drying effects can be increased and a cleaning solution can be reused.
    Type: Application
    Filed: February 27, 2003
    Publication date: August 28, 2003
    Applicant: A-Tech Ltd. Republic of Korea
    Inventors: Jin-Koo Park, Joong-Yeon Lee, Neung-Goo Yoon, Chang-Keun Lee, Sang-Ho Lee
  • Publication number: 20030116174
    Abstract: A semiconductor cleaning apparatus and a method of cleaning a wafer surface using the semiconductor cleaning apparatus are provided. In the semiconductor cleaning apparatus, wastewater is easily treated, the consumption of chemical usage is considerably reduced, and a contaminant removal efficiency on the wafer surface is maximized even at a room temperature or a low temperature by using a mixed chemical solution composed of an aqueous ammonium hydroxide and ozone as a cleaning solution in cleaning the wafer surface. In the method of cleaning the wafer surface, a cleaning solution is formed in a mixing tank by adding ozone to aqueous ammonium hydroxide. The cleaning solution is supplied into a cleaning bath through a filter for removing ozone bubble. Megasonic power is applied to the cleaning solution in the cleaning bath using a megasonic transducer. A wafer dipped in the cleaning solution which is at a room temperature to remove the contaminants on wafer surface.
    Type: Application
    Filed: December 21, 2001
    Publication date: June 26, 2003
    Inventors: Jin-goo Park, Dae-hong Eom, Jae-hwa Lee, Neung-goo Yoon
  • Patent number: 6042652
    Abstract: An atomic layer deposition (ALD) apparatus capable of depositing a thin film on a plurality of substrates. The atomic layer deposition apparatus includes: a vacuum chamber, a reactor installed in the vacuum chamber, having a plurality of modules which can be assembled and disassembled as desired, a plurality of stages as spaces partitioned by assembling the plurality of modules, and openings which allow each stage to receive one substrate; a gas supply portion installed in the reactor, for supplying reaction gases and a purging gas to the reactor; and a plurality of gas supply lines installed in the modules, for injecting the gases from the gas supply portion into the stages.
    Type: Grant
    Filed: September 7, 1999
    Date of Patent: March 28, 2000
    Assignee: P.K. Ltd
    Inventors: Kwang-Soo Hyun, Kyung-ho Park, Neung-goo Yoon, Kang-jun Choi, Soo-hong Jeong