Patents by Inventor Nguyen Quang Nguyen

Nguyen Quang Nguyen has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 8649638
    Abstract: A method for measuring the deformation of a specimen using an extensometer having a loop of a single-mode optical fiber. At least two points of the loop are attached to desired locations on a specimen. Light is transmitted through the loop and the transmitted optical power is measured by a photodetector. The deformation of the specimen causes the size and shape of the loop to change, which changes the transmitted optical power. The change in optical power is related to extension or compression using calibration curves. The sensor works on the principle of transmitted power modulation through the curved section.
    Type: Grant
    Filed: September 12, 2012
    Date of Patent: February 11, 2014
    Assignee: Polytechnic Institute of New York University
    Inventors: Nikhil Gupta, Nguyen Quang Nguyen
  • Publication number: 20130240718
    Abstract: A method for measuring the deformation of a specimen using an extensometer having a loop of a single-mode optical fiber. At least two points of the loop are attached to desired locations on a specimen. Light is transmitted through the loop and the transmitted optical power is measured by a photodetector. The deformation of the specimen causes the size and shape of the loop to change, which changes the transmitted optical power. The change in optical power is related to extension or compression using calibration curves. The sensor works on the principle of transmitted power modulation through the curved section.
    Type: Application
    Filed: September 12, 2012
    Publication date: September 19, 2013
    Applicant: Polytechnic Institute of New York University
    Inventors: Nikhil Gupta, Nguyen Quang Nguyen
  • Patent number: 8428400
    Abstract: An extensometer having a loop of a single-mode optical fiber. At least two points of the loop are attached to desired locations on a specimen. Light is transmitted through the loop and the transmitted optical power is measured by a photodetector. The deformation of the specimen causes the size and shape of the loop to change, which changes the transmitted optical power. The change in optical power is related to extension or compression using calibration curves. The sensor works on the principle of transmitted power modulation through the curved section.
    Type: Grant
    Filed: August 12, 2010
    Date of Patent: April 23, 2013
    Assignee: Polytechnic Institute of New York University
    Inventors: Nikhil Gupta, Nguyen Quang Nguyen
  • Publication number: 20110044577
    Abstract: An extensometer having a loop of a single-mode optical fiber. At least two points of the loop are attached to desired locations on a specimen. Light is transmitted through the loop and the transmitted optical power is measured by a photodetector. The deformation of the specimen causes the size and shape of the loop to change, which changes the transmitted optical power. The change in optical power is related to extension or compression using calibration curves. The sensor works on the principle of transmitted power modulation through the curved section.
    Type: Application
    Filed: August 12, 2010
    Publication date: February 24, 2011
    Applicant: Polytechnic Institute of NYU
    Inventors: Nikhil Gupta, Nguyen Quang Nguyen