Abstract: An IC-chip testing system includes multiple digital state machines, and a master controller which controls the operation of those digital state machines by a particular method. In this method, the master controller first generates a command chain in which multiple commands for one particular digital state machine are concatenated together in a series. Thereafter, the master controller sends a single payload data packet embedded in a layered TCP/IP/network format, to that digital state machine. This single payload data packet includes the entire command chain. By concatenating many commands together in the command chain, the adverse effect of TCP/IP/network headers on the efficiency of transmission is overcome. In one particular transmission, efficiency is increased from 7.1% for sending a single command, to 89.4% for sending the entire command chain.

Abstract: A power system includes an output voltage terminal that is coupled by a first conductor to one pressed power contact which is then coupled by a second conductor to an electronic device. Also, the electronic device is coupled by a third conductor to one pressed signal contact which is then coupled by a fourth conductor to an output voltage feedback terminal on the power supply. Further, the power system includes a fault detection circuit which is coupled to the fourth conductor. In operation, the fault detection circuit senses if the pressed signal contact is open at a time when the pressed signal contact is supposed to be closed. If an open contact is sensed, the fault detection circuit sends a signal to an operator which indicates that corrective action is needed.