Patents by Inventor Nick R. Long

Nick R. Long has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 7516560
    Abstract: A method of making an article of footwear includes obtaining a girth measurement of the article of footwear. The girth measurement device includes an expandable and retractable ribbon. The girth measurement device may be used to measure samples from a production run to ensure consistency of the run with a standard. The girth measurement device may also be used to measure an article of footwear post-production to determine an accurate size.
    Type: Grant
    Filed: December 21, 2007
    Date of Patent: April 14, 2009
    Assignee: Nike, Inc.
    Inventor: Nick R. Long
  • Publication number: 20080155767
    Abstract: A method of making an article of footwear includes obtaining a girth measurement of the article of footwear. The girth measurement device includes an expandable and retractable ribbon. The girth measurement device may be used to measure samples from a production run to ensure consistency of the run with a standard. The girth measurement device may also be used to measure an article of footwear post-production to determine an accurate size.
    Type: Application
    Filed: December 21, 2007
    Publication date: July 3, 2008
    Applicant: Nike, Inc.
    Inventor: Nick R. Long
  • Patent number: 7343691
    Abstract: A girth measuring device for a shoe is disclosed. The portions of the device are configured to be placed inside the shoe and a measurement ribbon is moved from a retracted position to an expanded position. As the measurement ribbon expands, it eventually contacts the shoe. This contact can be sensed and information related to the girth of the shoe is available.
    Type: Grant
    Filed: May 16, 2006
    Date of Patent: March 18, 2008
    Assignee: Nike, Inc.
    Inventors: Nick R. Long, Jeffrey L. Crull, Michael J. Maloney, Tom Sutrina, Thomas P. Blandino