Abstract: The invention is a small, low-power consuming, projector system. Once programmed and provided with image data, it can be a standalone system for presenting varying length, silent, videos. Its programmability and FPGA-based micro-circuitry allows it to be repurposed with minimal effort to support other embedded-light-system applications.

Abstract: The invention is a small, low-power consuming, projector system. Once programmed and provided with image data, it can be a standalone system for presenting varying length, silent, videos. Its programmability and FPGA-based micro-circuitry allows it to be repurposed with minimal effort to support other embedded-light-system applications.

Abstract: The invention enables construction of a microscope that has one or more advantageous characteristics as compared to previous microscopes. The microscope can be small and lightweight and, in particular, sufficiently small and light weight to be portable (e.g., smaller and far lighter than probe station microscopes used for microscopic liquid crystal analysis of a semiconductor device). The microscope can include a small and lightweight bellows that provides zoom capability. The microscope and/or a tripod that is used with the microscope can be implemented to provide objective lens position control capability (with any number of translational and/or rotational degrees of freedom). The microscope can include apparatus for ejecting a hot gas from the microscope to heat a specimen being observed with the microscope.

Abstract: The invention enables construction of a microscope that has one or more advantageous characteristics as compared to previous microscopes. The microscope can be small and lightweight and, in particular, sufficiently small and light weight to be portable (e.g., smaller and far lighter than probe station microscopes used for microscopic liquid crystal analysis of a semiconductor device). The microscope can include a small and lightweight bellows that provides zoom capability. The microscope and/or a tripod that is used with the microscope can be implemented to provide objective lens position control capability (with any number of translational and/or rotational degrees of freedom). The microscope can include apparatus for ejecting a hot gas from the microscope to heat a specimen being observed with the microscope.

Abstract: Semiconductor process yield analysis in which the relationship between a wafer-level parameter and a die-level parameter is evaluated can be performed more quickly and with greater accuracy than has been the case with previous such yield analysis. The yield analysis can be performed by selecting regions of a semiconductor wafer or wafers from which parametric data is to be obtained for use in the analysis, based on one or more characteristics of the wafer(s). The yield analysis can be performed by grouping the parametric data based on both a grouping of the wafer-level parametric data and a grouping of the die-level parametric data. The yield analysis can be performed by grouping the parametric data in greater than 3 groups.

Abstract: The invention enables construction of a microscope that has one or more advantageous characteristics as compared to previous microscopes. The microscope can be small and lightweight and, in particular, sufficiently small and light weight to be portable (e.g., smaller and far lighter than probe station microscopes used for microscopic liquid crystal analysis of a semiconductor device). The microscope can include a small and lightweight bellows that provides zoom capability. The microscope and/or a tripod that is used with the microscope can be implemented to provide objective lens position control capability (with any number of translational and/or rotational degrees of freedom). The microscope can include apparatus for ejecting a hot gas from the microscope to heat a specimen being observed with the microscope.