Patents by Inventor Nicolas Bretzke

Nicolas Bretzke has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Apparatus for materials testing of test objects using X-rays
    Patent number: 9341546
    Abstract: An apparatus for materials testing of test objects using X-rays, the apparatus comprising an X-ray device, comprising: an X-ray source for irradiating a test object held in a test position; an X-ray linear diode array detector comprising at least two detection sections and configured to acquire a complete radial cross-section of the test object; and an electronic control device configured to control the X-ray device, wherein during X-ray testing the test object and the X-ray device are rotatable relative to each other only around an essentially vertical axis of rotation.
    Type: Grant
    Filed: January 13, 2009
    Date of Patent: May 17, 2016
    Assignee: GE SENSING & INSPECTION TECHNOLOGIES GMBH
    Inventors: Ingo Stuke, Til Florian Guenzler, Michael Wuestenbecker, Jan Kraemer, Holger Lux, Nicolas Bretzke