Patents by Inventor Nicole Nall

Nicole Nall has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • MICROCHIP CAPILLARY ELECTROPHORESIS ASSAYS AND REAGENTS
    Publication number: 20190285580
    Abstract: MCE assays and reagents to assess purity and to identify impurities in protein drug product samples are provided. Methods for analyzing analytes in a protein drug sample are provided.
    Type: Application
    Filed: March 15, 2019
    Publication date: September 19, 2019
    Inventors: Timothy Riehlman, Gabriel Carreau, Jeffrey Schneiderheinze, Nicole Nall
  • Test system having a sub-system to sub-system bridge
    Patent number: 8732539
    Abstract: A test system having a sub-system to sub-system bridge may be provided that utilizes the useful attributes of a plurality of circuit testing techniques, while reducing deficiencies associated with certain types of circuit testing. A bridged test system structure is utilized to facilitate circuit testing that is more effective and time efficient. The method analyzes performance data acquired by a first component for one or more circuits, and sends that performance data to a second test component. The second test component provides test signals to the circuits, using the performance date to enhance the use of the test signals, and also provides test response data for the circuits in response to the provided test signals.
    Type: Grant
    Filed: May 1, 2013
    Date of Patent: May 20, 2014
    Assignee: AT&T Intellectual Property I, L.P.
    Inventors: Charles Lutz, Jason Speilvogel, Nicole Nall, Barron Cain, William Keyes, Gregory Irwin
  • Test system having a sub-system to sub-system bridge
    Patent number: 8443245
    Abstract: A test system having a sub-system to sub-system bridge may be provided that utilizes the useful attributes of a plurality of circuit testing techniques, while reducing deficiencies associated with certain types of circuit testing. A bridged test system structure is utilized to facilitate circuit testing that is more effective and time efficient. The method analyzes performance data acquired by a first component for one or more circuits, and sends that performance data to a second test component. The second test component provides test signals to the circuits, using the performance date to enhance the use of the test signals, and also provides test response data for the circuits in response to the provided test signals.
    Type: Grant
    Filed: June 26, 2012
    Date of Patent: May 14, 2013
    Assignee: AT&T Intellectual Property I, L.P.
    Inventors: Charles Lutz, Jason Spielvogel, Nicole Nall, Barron Cain, William Keyes, Gregory Irwin
  • Test System Having a Sub-System to Sub-System Bridge
    Publication number: 20120271585
    Abstract: A test system having a sub-system to sub-system bridge may be provided that utilizes the useful attributes of a plurality of circuit testing techniques, while reducing deficiencies associated with certain types of circuit testing. A bridged test system structure is utilized to facilitate circuit testing that is more effective and time efficient. The method analyzes performance data acquired by a first component for one or more circuits, and sends that performance data to a second test component. The second test component provides test signals to the circuits, using the performance date to enhance the use of the test signals, and also provides test response data for the circuits in response to the provided test signals.
    Type: Application
    Filed: June 26, 2012
    Publication date: October 25, 2012
    Inventors: Charles Lutz, Jason Spielvogel, Nicole Nall, Barron Cain, William Keyes, Gregory Irwin
  • Test system having a sub-system to sub-system bridge
    Patent number: 8230278
    Abstract: A test system having a sub-system to sub-system bridge may be provided that utilizes the useful attributes of a plurality of circuit testing techniques, while reducing deficiencies associated with certain types of circuit testing. A bridged test system structure is utilized to facilitate circuit testing that is more effective and time efficient. The method analyzes performance data acquired by a first component for one or more circuits, and sends that performance data to a second test component. The second test component provides test signals to the circuits, using the performance date to enhance the use of the test signals, and also provides test response data for the circuits in response to the provided test signals.
    Type: Grant
    Filed: November 26, 2007
    Date of Patent: July 24, 2012
    Assignee: AT&T Intellectual Property, I, LP
    Inventors: Charles Lutz, Jason Spielvogel, Nicole Nall, Barron Cain, William Keyes, Gregory Irwin
  • Test System Having A Sub-System To Sub-System Bridge
    Publication number: 20090138769
    Abstract: A test system having a sub-system to sub-system bridge may be provided that utilizes the useful attributes of a plurality of circuit testing techniques, while reducing deficiencies associated with certain types of circuit testing. A bridged test system structure is utilized to facilitate circuit testing that is more effective and time efficient. The method analyzes performance data acquired by a first component for one or more circuits, and sends that performance data to a second test component. The second test component provides test signals to the circuits, using the performance date to enhance the use of the test signals, and also provides test response data for the circuits in response to the provided test signals.
    Type: Application
    Filed: November 26, 2007
    Publication date: May 28, 2009
    Applicant: AT&T BLS INTELLECTUAL PROPERTY, INC., FORMERLY KNOWN AS BELLSOUTH INTELLECTUAL PROPERTY CORP.
    Inventors: Charles Lutz, Jason Spielvogel, Nicole Nall, Barron Cain, William Keyes, Gregory Irwin