Patents by Inventor Nile LIGHT

Nile LIGHT has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Optical verification system and methods of verifying micro device transfer
    Patent number: 11107208
    Abstract: An optical verification method and mass transfer system described. In an embodiments, a mass transfer sequence may be accompanied by optical imaging and inspection to detect pick and place errors. The optical imaging and inspection techniques may be performed in-situ.
    Type: Grant
    Filed: September 24, 2019
    Date of Patent: August 31, 2021
    Inventors: Patrick J. Czarnota, Paul Argus Parks, Nile A. Light, Stephen P. Bathurst, John H. Higginson, Stephen R. Deming, Robert B. Martin, Tsan Y. Chan, Andreas Bibl
  • OPTICAL VERIFICATION SYSTEM AND METHODS OF VERIFYING MICRO DEVICE TRANSFER
    Publication number: 20200020095
    Abstract: An optical verification method and mass transfer system described. In an embodiments, a mass transfer sequence may be accompanied by optical imaging and inspection to detect pick and place errors. The optical imaging and inspection techniques may be performed in-situ.
    Type: Application
    Filed: September 24, 2019
    Publication date: January 16, 2020
    Inventors: Patrick J. Czarnota, Paul Argus Parks, Nile A. Light, Stephen P. Bathurst, John H. Higginson, Stephen R. Deming, Robert B. Martin, Tsan Y. Chan, Andreas Bibl
  • Optical verification system and methods of verifying micro device transfer
    Patent number: 10438339
    Abstract: An optical verification method and mass transfer system described. In an embodiments, a mass transfer sequence may be accompanied by optical imaging and inspection to detect pick and place errors. The optical imaging and inspection techniques may be performed in-situ.
    Type: Grant
    Filed: September 5, 2017
    Date of Patent: October 8, 2019
    Assignee: Apple Inc.
    Inventors: Patrick J. Czarnota, Paul Argus Parks, Nile A. Light, Stephen P. Bathurst, John H. Higginson, Stephen R. Deming, Robert B. Martin, Tsan Y. Chan, Andreas Bibl
  • Automatic probe configuration station and method therefor
    Patent number: 9103876
    Abstract: A probe system for facilitating the inspection of a device under test. System incorporates a storage rack; a probe bar gantry assembly; a probe assembly configured to electrically mate the device under test; and a robot system for picking the probe assembly from the storage rack and deliver the probe assembly to the probe bar gantry. The robot system is also enabled to pick a probe assembly from the probe bar gantry and deliver the probe assembly to the storage rack. The probe assembly includes a clamping assembly for attaching the probe assembly to the probe bar gantry or the storage rack. The probe assembly may include an array of contact pins configured to mate with conductive pads on the device under test when the probe assembly is installed on the probe bar gantry assembly.
    Type: Grant
    Filed: January 7, 2011
    Date of Patent: August 11, 2015
    Assignee: PHOTON DYNAMICS, INC.
    Inventors: Kent Nguyen, Kaushal Gangakhedkar, David Baldwin, Nile Light, Steve Aochi, Yan Wang, Atila Ersahin, Hai Tran, Thomas H. Bailey, Kiran Jitendra, Alan Cable, Dave Smiley, Thomas E. Wishard
  • AUTOMATIC PROBE CONFIGURATION STATION AND METHOD THEREFOR
    Publication number: 20120319713
    Abstract: A probe system for facilitating the inspection of a device under test. System incorporates a storage rack; a probe bar gantry assembly; a probe assembly configured to electrically mate the device under test; and a robot system for picking the probe assembly from the storage rack and deliver the probe assembly to the probe bar gantry. The robot system is also enabled to pick a probe assembly from the probe bar gantry and deliver the probe assembly to the storage rack. The probe assembly includes a clamping assembly for attaching the probe assembly to the probe bar gantry or the storage rack. The probe assembly may include an array of contact pins configured to mate with conductive pads on the device under test when the probe assembly is installed on the probe bar gantry assembly.
    Type: Application
    Filed: January 7, 2011
    Publication date: December 20, 2012
    Applicant: PHOTON DYNAMICS, INC.
    Inventors: Kent Nguyen, Kaushal Gangakhedkar, David Baldwin, Nile Light, Steve Aochi, Yan Wang, Atila Ersahin, Hai Tran, Thomas H. Bailey, Kiran Jitendra, Alan Cable, Dave Smiley, Thomas E. Wishard
  • PARALLEL MOTION SYSTEM FOR INDUSTRIAL PRINTING
    Publication number: 20110148985
    Abstract: A microdeposition system includes a printhead carriage that moves along a first axis; a stage that holds a substrate; a rail located above the printhead carriage and extending along a third axis parallel to the first axis; and an accessory carriage that travels along the rail to remain above the printhead carriage. The printhead carriage includes a plurality of nozzles that deposit droplets of fluid material onto the substrate.
    Type: Application
    Filed: December 22, 2010
    Publication date: June 23, 2011
    Applicant: ULVAC, INC.
    Inventors: David ALBERTALLI, Nile LIGHT, Robert D. TAFF, Jason MAXEY