Patents by Inventor Nityanand Gopalika

Nityanand Gopalika has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 8184767
    Abstract: An imaging technique is provided for acquiring scatter free images of an object. The technique includes acquiring a plurality of projection images of the object using a source and a detector oriented at a plurality of projection angles relative to the object, and generating a plurality of scatter free projection images by correcting the plurality of projection images based on respective ones of a plurality of stored scatter images. The scatter images are generated and stored for each of the projection angles by positioning a scatter rejection plate between the object and the detector. The technique further includes reconstructing a three-dimensional image of the object based on the scatter free projection images.
    Type: Grant
    Filed: December 10, 2008
    Date of Patent: May 22, 2012
    Assignee: General Electric Company
    Inventors: Debasish Mishra, William Robert Ross, Thomas James Batzinger, Manoharan Venugopal, Forrest Frank Hopkins, Nityanand Gopalika, Vamshi Krishna Reddy Kommareddy, Rajashekar Venkatachalam, Prasad Thapa
  • Publication number: 20100140485
    Abstract: An imaging technique is provided for acquiring scatter free images of an object. The technique includes acquiring a plurality of projection images of the object using a source and a detector oriented at a plurality of projection angles relative to the object, and generating a plurality of scatter free projection images by correcting the plurality of projection images based on respective ones of a plurality of stored scatter images. The scatter images are generated and stored for each of the projection angles by positioning a scatter rejection plate between the object and the detector. The technique further includes reconstructing a three-dimensional image of the object based on the scatter free projection images.
    Type: Application
    Filed: December 10, 2008
    Publication date: June 10, 2010
    Applicant: GENERAL ELECTRIC COMPANY
    Inventors: Debasish Mishra, William Robert Ross, Thomas James Batzinger, Manoharan Venugopal, Forrest Frank Hopkins, Nityanand Gopalika, Vamshi Krishna Reddy Kommareddy, Rajashekar Venkatachalam, Prasad Thapa
  • Publication number: 20090086911
    Abstract: A system for radiographic inspection of an object is provided. The system comprises a radiation source configured to generate radiation, a display unit for generating a graphical user interface (GUI) including multiple fields. A user provides input data via the fields in the GUI. A processor configured to compute a plurality of exposure parameters based on the input data and a control system is configured to initialize the radiation source with the exposure parameters.
    Type: Application
    Filed: September 27, 2007
    Publication date: April 2, 2009
    Applicant: GENERAL ELECTRIC COMPANY
    Inventors: Manoharan Venugopal, Nityanand Gopalika, Manoj Kumar Meethal, Debasish Mishra
  • Patent number: 7480363
    Abstract: A digital radiography imaging system for acquiring digital images of an object, and a method for transforming digital images into an absolute thickness map characterizing the object under inspection. The system includes a radiation source for directing radiation through a desired region of the object, and a radiation detector having a plurality of sensing elements for detecting radiation passing through the object. Numerical data generated from each sensing element is calibrated, for example by correcting for variations in radiation paths between the source and detector, by correcting for variations in the spatial frequency response (MTF) of the detector, by correcting for variations in the geometric profile of the object under inspection, and by correcting for material contained in and/or around the object. The calibrated data is processed in order to generate and display an absolute thickness map of the object.
    Type: Grant
    Filed: April 18, 2005
    Date of Patent: January 20, 2009
    Assignee: GE Betz, Inc.
    Inventors: Brian W. Lasiuk, Thomas J. Batzinger, Manoharan Venugopal, Elizabeth L. Dixon, Michael R. Hopple, Nityanand Gopalika, Sivaramanivas Ramaswamy, Debasish Mishra, Rajashekar Venkatachalam, Vamishi Krishna Reddy Kommareddy
  • Publication number: 20060058974
    Abstract: A digital radiography imaging system for acquiring digital images of an object, and a method for transforming digital images into an absolute thickness map characterizing the object under inspection. The system includes a radiation source for directing radiation through a desired region of the object, and a radiation detector having a plurality of sensing elements for detecting radiation passing through the object. Numerical data generated from each sensing element is calibrated, for example by correcting for variations in radiation paths between the source and detector, by correcting for variations in the spatial frequency response (MTF) of the detector, by correcting for variations in the geometric profile of the object under inspection, and by correcting for material contained in and/or around the object. The calibrated data is processed in order to generate and display an absolute thickness map of the object.
    Type: Application
    Filed: April 18, 2005
    Publication date: March 16, 2006
    Applicant: GE Betz, Inc.
    Inventors: Brian Lasiuk, Thomas Batzinger, Manoharan Venugopal, Elizabeth Dixon, Michael Hopple, Nityanand Gopalika, Sivaramanivas Ramaswamy, Debasish Mishra, Rajashekar Venkatachalam, Vamshi Reddy Kommareddy