Abstract: Accurate measurement of pupillary distance, PD, is necessary to make prescription eye glasses as well as configuring VR headsets, and using other binocular optical devices. Today, many people are ordering eyeglasses on line and obtaining their PD is often problematic for a number of reasons as the prior art fails to provide consumer friendly PD measurement systems. A disclosed eyeglass frame system comprises reference marks of known locations upon the frames. A smart phone may be used to locate the consumer's pupils, while the consumer is wearing the frames. The consumer's pupils may be marked or tagged upon a digital image of the consumer wearing the frames. By use of angles in the sight lines of the camera lens and other variable values and the known relative distances of the frame markings, a consumer's pupillary distance can be quickly and accurately derived.

Abstract: The present invention may include acquiring a plurality of overlay metrology measurement signals from a plurality of metrology targets distributed across one or more fields of a wafer of a lot of wafers, determining a plurality of overlay estimates for each of the plurality of overlay metrology measurement signals using a plurality of overlay algorithms, generating a plurality of overlay estimate distributions, and generating a first plurality of quality metrics utilizing the generated plurality of overlay estimate distributions, wherein each quality metric corresponds with one overlay estimate distribution of the generated plurality of overlay estimate distributions, each quality metric a function of a width of a corresponding generated overlay estimate distribution, each quality metric further being a function of asymmetry present in an overlay metrology measurement signal from an associated metrology target.

Abstract: Disclosed embodiments may include a device, system and method for providing a low cost device that can measure refractive errors very accurately via attachment to a smart phone. A disclosed device may use ambient light or a light source in simulating the cross cylinder procedure that optometrists use by utilizing the inverse Shack-Hartman technique. The optical device may include an array of lenslets and pinholes that will force the user to effectively focus at different depths. Using an optical device, in conjunction with a smart phone, the user first changes the angle of the axis until he/she sees a cross pattern (the vertical and horizontal lines are equally spaced). The user adjusts the display, typically using the controls on the smartphone, to make the lines come together and overlap, which corresponds to bringing the view into sharp focus, thus determining the appropriate optical prescription for the user.

Abstract: The invention may include a fixed lens (perhaps to simulate a cornea), a pair of Stokes lenses, an iris, deformable lens and an array detector. The implementation or construction of the disclosed embodiments follow and/or simulate the anatomy and geometry of an eye. Several optical and practical constraints were overcome by creating equivalent systems.

Abstract: Consumer products such as refraction measurement devices may be used for obtaining refraction measurements allow consumers to track their vision without visiting an optometrist or ophthalmologist. Such consumer products may work in concert with smart phones or other products having a touch screen that present images to refraction measurement devices. Smart phones may have resolution rates, sometimes measured as PPI or pixels per inch that are unknown to the user and/or refraction measurement device. One aspect of the invention is to provide an optical interface for the user to manually match the view port boundary of the smartphone to comport with the view port boundary of the refraction measurement device. Another aspect of the invention is the use of pre-distortion in images presented to the user. By noting the corrective movements exerted by the user upon the refractive measurement device, the user's own refractive error can be derived.

Abstract: Disclosed embodiments may include a device, system and method for providing a low cost device that can measure refractive errors very accurately via attachment to a smart phone. A disclosed device may use ambient light or a light source in simulating the cross cylinder procedure that optometrists use by utilizing the inverse Shack-Hartman technique. Using an optical device, in conjunction with a smart phone, the user first changes the angle of the axis until he/she sees a cross pattern (the vertical and horizontal lines are equally spaced). The user adjusts the display, using motorized controls on the on the optical device, to make the lines come together and overlap, which corresponds to bringing the view into sharp focus, thus determining the appropriate optical prescription for the user.

Abstract: A system for replicating a standardized visual acuity test, such as the 20? Snellen test may comprise a binocular viewer attached to a smartphone. A binocular viewer may comprise a housing comprising a pair tube covers having voids allowing for viewing through a pair of lens tubes with each lens tube in visual communication with a second lens a first lens an aperture and a front cover. The optical systems use an artful combination of front and back lens surfaces, demagnification and other systems to faithfully replicate the sight lines perceived by a user of a traditional 20? test. The system also allows for the incorporation of other tests conducted with both eyes including Color Sensitivity and Contrast, furthermore by placing a deformable, tunable lens between the second lens and the eye the device serves as an ophthalmic refractometer, allowing a Spherical Equivalent refraction estimate for each eye.

Abstract: Disclosed embodiments include means and methods of automatically measuring numerous characteristics of an optical system, such as an eye. Measured or displayed optical properties may include but are not limited to. spherical power, cylinder and axis for astigmatism. Higher order optical aberrations may also be measured. Disclosed embodiments may be used to measure refraction for creating corrective lenses for eyeglasses and contact lenses. Measurements of higher order aberrations of an eye may be used for measuring enhanced correction, accommodation state and range.

Abstract: The present invention may include acquiring a plurality of overlay metrology measurement signals from a plurality of metrology targets distributed across one or more fields of a wafer of a lot of wafers, determining a plurality of overlay estimates for each of the plurality of overlay metrology measurement signals using a plurality of overlay algorithms, generating a plurality of overlay estimate distributions, and generating a first plurality of quality metrics utilizing the generated plurality of overlay estimate distributions, wherein each quality metric corresponds with one overlay estimate distribution of the generated plurality of overlay estimate distributions, each quality metric a function of a width of a corresponding generated overlay estimate distribution, each quality metric further being a function of asymmetry present in an overlay metrology measurement signal from an associated metrology target.

Abstract: Various presbyopia measurement systems are presented. Solutions include a consumer friendly system using a consumer's smart phone to present a test image. The test image by be viewed through a first lens, second lens and optional added lens such that the image is perceived to be approximately eight inches to two feet away from the consumer's eye. In addition to a lens system that may be attached to a consumer's smart phone, the systems presented include a presbyopia kit that my comprise an eyeglass kit comprising near vision attachments, mid vision attachments, clip on lenses and Plano frames. Disclosed systems include the use of the use of both the eyeglass kit and lens system that attaches to the consumer's phone.

Abstract: A collection system of a semiconductor metrology tool includes a chuck to support a target from which an optical beam is reflected and a spectrometer to receive the reflected optical beam. The collection system also includes a plurality of aperture masks arranged in a rotatable sequence about an axis parallel to an optical axis. Each aperture mask of the plurality of aperture masks is rotatable into and out of the reflected optical beam between the chuck and the spectrometer to selectively mask the reflected optical beam.

Abstract: In an embodiment, multiple conjugate planes are used to create a plurality of optical pupil planes and a plurality of image planes. These optical planes solve multiple problems and introduce significant performance enhancements in the system. In one implementation of a disclosed embodiment, the measurement channel is based on the reverse Shack-Hartmann principle. By introducing a relay system (for example a 4-f lens system) the slit plane could be made conjugate to the measured system pupil plane (unlike a previous implementation where the slits were places away from the pupil plane as it was not accessible directly). Creating a virtual pupil plane allows for more accurate placement of the plane without the need for contact with the measured optical system.

Abstract: Methods and systems for performing spectroscopic measurements of semiconductor structures including ultraviolet, visible, and infrared wavelengths greater than two micrometers are presented herein. A spectroscopic measurement system includes a combined illumination source including a first illumination source that generates ultraviolet, visible, and near infrared wavelengths (wavelengths less than two micrometers) and a second illumination source that generates mid infrared and long infrared wavelengths (wavelengths of two micrometers and greater). Furthermore, the spectroscopic measurement system includes one or more measurement channels spanning the range of illumination wavelengths employed to perform measurements of semiconductor structures. In some embodiments, the one or more measurement channels simultaneously measure the sample throughout the wavelength range. In some other embodiments, the one or more measurement channels sequentially measure the sample throughout the wavelength range.

Abstract: Consumer products such as refraction measurement devices may be used for obtaining refraction measurements allow consumers to track their vision without visiting an optometrist or ophthalmologist. Such consumer products may work in concert with smart phones or other products having a touch screens that present images to refraction measurement devices. Smart phones may have resolution rates, sometimes measured as PPI or pixels per inch that are unknown to the user and/or refraction measurement device. On aspect of the invention is to provide an optical interface for the user to manually match the view port boundary of the smartphone to comport with the view port boundary of the refraction measurement device. Another aspect of the invention is the use of pre-distortion in images presented to the user. By noting the corrective movements exerted by the user upon the refractive measurement device, the user's own refractive error can be derived.

Abstract: Methods and systems for performing spectroscopic measurements of semiconductor structures including ultraviolet, visible, and infrared wavelengths greater than two micrometers are presented herein. A spectroscopic measurement system includes a combined illumination source including a first illumination source that generates ultraviolet, visible, and near infrared wavelengths (wavelengths less than two micrometers) and a second illumination source that generates mid infrared and long infrared wavelengths (wavelengths of two micrometers and greater). Furthermore, the spectroscopic measurement system includes one or more measurement channels spanning the range of illumination wavelengths employed to perform measurements of semiconductor structures. In some embodiments, the one or more measurement channels simultaneously measure the sample throughout the wavelength range. In some other embodiments, the one or more measurement channels sequentially measure the sample throughout the wavelength range.

Abstract: A collection system of a semiconductor metrology tool includes a chuck to support a target from which an optical beam is reflected and a spectrometer to receive the reflected optical beam. The collection system also includes a plurality of aperture masks arranged in a rotatable sequence about an axis parallel to an optical axis. Each aperture mask of the plurality of aperture masks is rotatable into and out of the reflected optical beam between the chuck and the spectrometer to selectively mask the reflected optical beam.

Abstract: Disclosed embodiments may include a device, system and method for providing a low cost device that can measure refractive errors very accurately via attachment to a smart phone. A disclosed device may use ambient light or a light source in simulating the cross cylinder procedure that optometrists use by utilizing the inverse Shack-Hartman technique. The optical device may include an array of lenslets and pinholes that will force the user to effectively focus at different depths. Using an optical device, in conjunction with a smart phone, the user first changes the angle of the axis until he/she sees a cross pattern (the vertical and horizontal lines are equally spaced). The user adjusts the display, typically using the controls on the smartphone, to make the lines come together and overlap, which corresponds to bringing the view into sharp focus, thus determining the appropriate optical prescription for the user.