Patents by Inventor Nobuaki Ueki
Nobuaki Ueki has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Patent number: 10437028Abstract: The first and second optical elements are held so as to be rotatable relative to each other about an optical axis. An aberration, which can cancel an aberration caused by a color separation prism, is generated from a synthesis of aberrations generated by the first and second optical elements in a case in which the second optical element is positioned at a first position with respect to the first optical element. The aberration generated by the first optical element is cancelled by the aberration generated by the second optical element in a case in which the second optical element is positioned at a second position with respect to the first optical element. The second optical element is positioned at the first position in a case in which the lens device is to be used in a 3-CCD type first camera device, and the second optical element is positioned at the second position with respect to the first optical element in a case in which the lens device is to be used in a single-CCD type second camera device.Type: GrantFiled: March 14, 2018Date of Patent: October 8, 2019Assignee: FUJIFILM CorporationInventors: Nobuaki Ueki, Tsuyoshi Mitarai
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Publication number: 20180203213Abstract: The first and second optical elements are held so as to be rotatable relative to each other about an optical axis. An aberration, which can cancel an aberration caused by a color separation prism, is generated from a synthesis of aberrations generated by the first and second optical elements in a case in which the second optical element is positioned at a first position with respect to the first optical element. The aberration generated by the first optical element is cancelled by the aberration generated by the second optical element in a case in which the second optical element is positioned at a second position with respect to the first optical element. The second optical element is positioned at the first position in a case in which the lens device is to be used in a 3-CCD type first camera device, and the second optical element is positioned at the second position with respect to the first optical element in a case in which the lens device is to be used in a single-CCD type second camera device.Type: ApplicationFiled: March 14, 2018Publication date: July 19, 2018Applicant: FUJIFILM CorporationInventors: Nobuaki UEKI, Tsuyoshi MITARAI
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Patent number: 8526009Abstract: A low coherent light from a white light source is emitted to a sample surface. A detour distance in a detour section is adjusted such that an optical path difference between a reference light and a sample light is equal to or shorter than a coherence length of interference light. The interference light is incident on an image sensor only when an inclination angle of a diffraction grating plate and a wavelength of the interference light satisfy a predetermined condition. Thus, an interference fringe image is formed. Based on each of the interference fringe images taken on a wavelength-by-wavelength basis of the interference light and an optical distance between a reference surface and the sample surface along an optical path of a measuring light at the time of taking the interference fringe image, a shape of the sample surface is measured.Type: GrantFiled: May 16, 2011Date of Patent: September 3, 2013Assignee: Fujifilm CorporationInventor: Nobuaki Ueki
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Publication number: 20110305254Abstract: An optical transmission device includes: a substrate on which an element portion that includes a semiconductor layer transmitting or receiving an optical signal, and a support portion that includes a conductive semiconductor layer are formed; an optical transmission member that is arranged to face the element portion and the support portion and to be optically coupled to the element portion; and a conductive member that is provided on the support portion and electrically contacts the optical transmission member.Type: ApplicationFiled: October 11, 2010Publication date: December 15, 2011Applicant: FUJI XEROX CO., LTD.Inventor: Nobuaki Ueki
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Publication number: 20110304855Abstract: Through a first diffraction grating, two conical fluxes different in wavefront propagation angle relative to its optical axis are applied to a first surface. Through a second diffraction grating, two conical fluxes different in wavefront propagation angle relative to its optical axis are applied to a second surface. Two sets of interference fringes formed by the fluxes reflected from the first surface and a reference beam are analyzed to obtain surface misalignment and angular misalignment of the first surface relative to the optical axis. Similarly, two sets of interference fringes formed by the fluxes reflected from the second surface and the reference beam are analyzed to obtain surface misalignment and angular misalignment of the second surface relative to the optical axis. Surface misalignment and angular misalignment of a sample lens are obtained from the measurement results of the first and second surfaces.Type: ApplicationFiled: June 10, 2011Publication date: December 15, 2011Applicant: FUJIFILM CORPORATIONInventors: Nobuaki UEKI, Hideo KANDA
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Publication number: 20110299090Abstract: A detour unit splits a light beam from a light source unit into first and second beams and makes the first beam travel longer than the second beam by a predetermined optical distance, and then combines the first and second beams into a single combined light beam. In the detour unit, a first ?/2 plate is disposed on an optical path of the first beam. A second ?/2 plate is disposed on an optical path of the second beam. Directions of optical axes of the first and second ?/2 plates are different from each other by 45 degrees. A ?/4 plate is disposed on an optical path between the detour unit and a beam expanding unit. Thereby, the first and second beams are converted into two circularly polarized beams having opposite rotation directions, respectively.Type: ApplicationFiled: June 6, 2011Publication date: December 8, 2011Applicant: FUJIFILM CORPORATIONInventor: Nobuaki UEKI
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Publication number: 20110279823Abstract: A low coherent light from a white light source is emitted to a sample surface. A detour distance in a detour section is adjusted such that an optical path difference between a reference light and a sample light is equal to or shorter than a coherence length of interference light. The interference light is incident on an image sensor only when an inclination angle of a diffraction grating plate and a wavelength of the interference light satisfy a predetermined condition. Thus, an interference fringe image is formed. Based on each of the interference fringe images taken on a wavelength-by-wavelength basis of the interference light and an optical distance between a reference surface and the sample surface along an optical path of a measuring light at the time of taking the interference fringe image, a shape of the sample surface is measured.Type: ApplicationFiled: May 16, 2011Publication date: November 17, 2011Applicant: FUJIFILM CORPORATIONInventor: Nobuaki UEKI
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Patent number: 7957447Abstract: Provided is a VCSEL array device that includes at least a first multilayer reflective film, an active layer, and a second multilayer reflective film, formed on a substrate that extends in a longitudinal direction. Plural mesa portions are formed on the substrate by selectively removing at least a portion of the first multilayer reflective film, active layer, and second multilayer reflective film. A selectively oxidized region is formed in at least one of the first multilayer reflective film and the second multilayer reflective film. The VCSEL array device further includes an interlayer insulating film that covers at least a side portion and a bottom portion of the mesa portions, and a surface protecting film that covers the interlayer insulating film. The surface protecting film has plural grooves formed along a longitudinal direction of the substrate in which at least a portion of the surface protecting film is removed.Type: GrantFiled: August 11, 2008Date of Patent: June 7, 2011Assignee: Fuji Xerox Co., Ltd.Inventors: Kazuyuki Matsushita, Nobuaki Ueki
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Publication number: 20110042591Abstract: A first bar code that is reproduced by linearly polarized red light (first read light) parallel to a short-side direction and a second bar code that is reproduced by linearly polarized green light (second read light) parallel to a long-side direction are recorded on a birefringence label. A probe is a reading device that reads the first and second bar codes from the birefringence label and includes first and second light sources and an imaging unit. The first light source emits the first read light to the birefringence label. The second light source emits the second read light to the birefringence label at a time different from that of the first read light. The imaging unit captures the birefringence label through a polarizing plate having a transmission axis aligned with the short-side direction of the birefringence label, and acquires reproduced images of the first and second bar codes.Type: ApplicationFiled: August 23, 2010Publication date: February 24, 2011Inventors: Minoru Kurose, Junichi Yokoyama, Yasuhiro Noguchi, Takashi Nagashima, Nobuaki Ueki, Hiroyuki Nagasaki, Ichiro Amimori, Kouki Takahashi
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Patent number: 7760365Abstract: A relationship between surface decenter of a lens 1 under test and surface-decenter comatic aberration and a relationship between surface tilt of the lens 1 under test and surface-tilt comatic aberration are calculated by computer simulation. The surface tilt of the lens 1 under test is calculated by measuring a transmissive wavefront of a projecting portion 3, and comatic aberration of the lens 1 under test is calculated by measuring a transmissive wavefront of a lens portion 2. The surface-decenter comatic aberration that occurs due to the surface decenter is calculated by subtracting the surface-tilt comatic aberration from the calculated comatic aberration. The surface decenter of the lens 1 under test is calculated based on the calculated surface-decenter comatic aberration.Type: GrantFiled: March 13, 2008Date of Patent: July 20, 2010Assignee: FUJINON CorporationInventor: Nobuaki Ueki
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Patent number: 7672352Abstract: A surface-emitting semiconductor array device includes a substrate, a plurality of light-emitting portions, an electrode pad portion formed on the substrate and disposed through the plurality of light-emitting portions and a dividing groove, and having a plurality of electrode pads formed on an insulating film, and a plurality of metal wirings for connecting each of the plurality of light-emitting portions to a corresponding electrode pad through the dividing groove, the dividing groove has a wave-shaped side wall formed on the substrate.Type: GrantFiled: March 26, 2007Date of Patent: March 2, 2010Assignee: Fuji Xerox Co., Ltd.Inventors: Nobuaki Ueki, Yasuaki Miyamoto, Jun Sakurai, Terutaka Inoue
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Patent number: 7580133Abstract: A moving-object measuring interferometric apparatus comprises: a light beam output section outputting a measuring beam; an interference optical system obtaining interference light by projecting the measuring beam onto an object and by allowing light reflected from the object or transmitted light having passed through the object to interfere with reference light; an image pickup section obtaining image information by receiving the interference light on an image pickup surface; and an image pickup timing control section setting a momentary image pickup period during which the object is regarded as being stationary to be contained in a light reception acceptable period of the image pickup surface and controlling the interference light to enter the image pickup surface only during the momentary image pickup period.Type: GrantFiled: June 6, 2006Date of Patent: August 25, 2009Assignee: Fujinon CorporationInventors: Nobuaki Ueki, Hidenori Takahashi
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Publication number: 20090209871Abstract: Provided is an apparatus for measuring blood flow rate that includes a light emitting portion for irradiating living tissues with laser light, a photo-detector for detecting at least one of reflection, scattering, or absorption of the laser light, and an operation portion for calculating blood flow rate based on the difference between the spectrum of the laser light from the light emitting portion and the spectrum of the light detected by the photo-detector. The spectrum of the laser light has plural peaks.Type: ApplicationFiled: August 22, 2008Publication date: August 20, 2009Applicant: FUJI XEROX CO., LTD.Inventors: Nobuaki Ueki, Ryoji Ishii
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Publication number: 20090129419Abstract: Provided is a VCSEL array device that includes at least a first multilayer reflective film, an active layer, and a second multilayer reflective film, formed on a substrate that extends in a longitudinal direction. Plural mesa portions are formed on the substrate by selectively removing at least a portion of the first multilayer reflective film, active layer, and second multilayer reflective film. A selectively oxidized region is formed in at least one of the first multilayer reflective film and the second multilayer reflective film. The VCSEL array device further includes an interlayer insulating film that covers at least a side portion and a bottom portion of the mesa portions, and a surface protecting film that covers the interlayer insulating film. The surface protecting film has plural grooves formed along a longitudinal direction of the substrate in which at least a portion of the surface protecting film is removed.Type: ApplicationFiled: August 11, 2008Publication date: May 21, 2009Applicant: FUJI XEROX CO., LTD.Inventors: Kazuyuki Matsushita, Nobuaki Ueki
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Patent number: 7496123Abstract: A VCSEL including a substrate, a first semiconductor layer of a first conductivity-type formed on the substrate, an active layer formed on the first semiconductor layer, a second semiconductor layer of a second conductivity-type formed on the active layer, a first electrode wiring formed on a main surface of the substrate and electrically connected with the first semiconductor layer, a second electrode wiring formed on the main surface of the substrate and electrically connected with the second semiconductor layer, and a light emitting portion formed on the substrate for emitting laser light. A contact portion at which the first electrode wiring is electrically connected to the first semiconductor layer is formed in a range equal to or greater than ?/2 radians and within ? radians, centering on the light emitting portion.Type: GrantFiled: February 15, 2007Date of Patent: February 24, 2009Assignee: Fuji Xerox Co., Ltd.Inventors: Nobuaki Ueki, Naotaka Mukoyama, Ryoji Ishii, Takeshi Nakamura
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Publication number: 20080304080Abstract: A relationship between surface decenter of a lens 1 under test and surface-decenter comatic aberration and a relationship between surface tilt of the lens 1 under test and surface-tilt comatic aberration are calculated by computer simulation. The surface tilt of the lens 1 under test is calculated by measuring a transmissive wavefront of a projecting portion 3, and comatic aberration of the lens 1 under test is calculated by measuring a transmissive wavefront of a lens portion 2. The surface-decenter comatic aberration that occurs due to the surface decenter is calculated by subtracting the surface-tilt comatic aberration from the calculated comatic aberration. The surface decenter of the lens 1 under test is calculated based on the calculated surface-decenter comatic aberration.Type: ApplicationFiled: March 13, 2008Publication date: December 11, 2008Inventor: Nobuaki UEKI
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Patent number: 7443899Abstract: A surface emitting semiconductor laser diode includes a substrate, a first reflective layer formed over the substrate, an active layer formed over the first reflective layer, a second reflective layer formed over the active layer, a first conductive layer having an opening therein and formed over the second reflective layer, and an additional reflective layer formed over the second reflective layer so as to cover the opening, wherein the additional reflective layer is covered, at least at a portion thereof, with a second conductive layer.Type: GrantFiled: November 12, 2004Date of Patent: October 28, 2008Assignee: Fuji Xerox Co., Ltd.Inventor: Nobuaki Ueki
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Patent number: 7375825Abstract: The light intensity ratio adjustment filter is placed between the reference surface and the sample surface of the interferometer. This light intensity ratio adjustment filter has a light intensity ratio adjustment film including an optical reflection-absorption layer and a dielectric anti-reflection layer on the surface of a transparent substrate made of glass on the sample side, and an optical anti-reflection film on the reference surface side, and acts so as to reflect part of the incident light from the surface opposite the reference surface, and after absorbing part of the remaining light, transmit the remainder towards the sample, and furthermore, absorb part of the light returned from the sample while controlling reflection, and transmit the remainder in the direction of the reference surface as the sample light.Type: GrantFiled: August 16, 2005Date of Patent: May 20, 2008Assignee: Fujinon CorporationInventor: Nobuaki Ueki
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Patent number: 7366218Abstract: A vertical cavity surface emitting laser diode includes a lower semiconductor reflector, an active region, an upper semiconductor reflector constituting a resonator with the lower semiconductor reflector, a metallic part being formed on the upper semiconductor reflector, which has a first aperture defining an output region of laser light generated in the active region, and a light confining region being provided between the metallic part and the lower semiconductor reflector, and having a second aperture defining an emission region of the laser light. The upper semiconductor reflector includes a lenticular medium having a convex surface toward the lower semiconductor reflector.Type: GrantFiled: June 23, 2005Date of Patent: April 29, 2008Assignee: Fuji Xerox Co., Ltd.Inventors: Naotaka Mukoyama, Nobuaki Ueki
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Publication number: 20080080583Abstract: A surface-emitting semiconductor array device includes a substrate, a plurality of light-emitting portions, an electrode pad portion formed on the substrate and disposed through the plurality of light-emitting portions and a dividing groove, and having a plurality of electrode pads formed on an insulating film, and a plurality of metal wirings for connecting each of the plurality of light-emitting portions to a corresponding electrode pad through the dividing groove, the dividing groove has a wave-shaped side wall formed on the substrate.Type: ApplicationFiled: March 26, 2007Publication date: April 3, 2008Inventors: Nobuaki Ueki, Yasuaki Miyamoto, Jun Sakurai, Terutaka Inoue