Patents by Inventor Nobuhiro Morita

Nobuhiro Morita has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 7274466
    Abstract: A surface of a dynamic object such as a polygon mirror is measured to determine configuration. In measuring the surface configuration, a light is emitted onto the surface, and interference stripes are analyzed to determine the surface configuration. In analysis of the interference stripes, a correct sign for the peak frequency is required so as to measure a configuration at a high precision level without much prior preparation. The correct sign is obtained in a substantially improved manner by using a relationship between the object light that has been reflected by an object to be measured and the reference light that has been emitted from the light source.
    Type: Grant
    Filed: March 11, 2005
    Date of Patent: September 25, 2007
    Assignee: Ricoh Company, Ltd.
    Inventor: Nobuhiro Morita
  • Publication number: 20050213102
    Abstract: A surface of a dynamic object such as a polygon mirror is measured to determine configuration. In measuring the surface configuration, a light is emitted onto the surface, and interference stripes are analyzed to determine the surface configuration. In analysis of the interference stripes, a correct sign for the peak frequency is required so as to measure a configuration at a high precision level without much prior preparation. The correct sign is obtained in a substantially improved manner by using a relationship between the object light that has been reflected by an object to be measured and the reference light that has been emitted from the light source.
    Type: Application
    Filed: March 11, 2005
    Publication date: September 29, 2005
    Inventor: Nobuhiro Morita
  • Patent number: 6885460
    Abstract: An apparatus for measuring an object's surface shape that obtains complex amplitude at a plurality of positions substantially in the directions of the optical axis of the light reflected by the object and calculates the first surface shape of the object by the depth-from-focus principle. On the other hand, using the phase data of the complex amplitude, the apparatus can measure a micro shape in the sub-fringe order by ordinary laser interference measurement. The first surface shape data are applied to a region including a step of a height greater than ½ of the light's wavelength and second surface shape data are applied to the other region.
    Type: Grant
    Filed: September 23, 2002
    Date of Patent: April 26, 2005
    Assignee: Ricoh Company, Ltd.
    Inventor: Nobuhiro Morita
  • Patent number: 6687521
    Abstract: The present device is equipped with a measurement site holder 3 that is constructed using a negative impression of the measurement site 10. As a result, variation in the measured values caused by the non-uniform distribution of components in the measurement site 10 is reduced, so that variation in the measured values caused by variations in the light path length accompanying variations in the shape of the measurement site 10, and by variations in blood flow or the like that accompany differences in the contact pressure, can be reduced. Since living-body information and measurement parameters for the patient are recorded on a recording medium 11 mounted on a measurement site holder 3 for the exclusive use of the individual patient, the erroneous acquisition of living-body information for individual patients can be prevented, and reproducible measurements can be performed.
    Type: Grant
    Filed: August 2, 2002
    Date of Patent: February 3, 2004
    Assignee: Hamamatsu Photonics K.K.
    Inventors: Katsuhiko Sato, Nobuhiro Morita, Yukio Ueda, Toshihiko Mizuno, Shigeru Sakamoto, Koji Yamanaka, Toshiyuki Tanaka, Hideo Takahashi, Keiji Suyama, Seiichiro Hashimoto
  • Publication number: 20030067609
    Abstract: An apparatus for measuring an object's surface shape that obtains complex amplitude at a plurality of positions substantially in the directions of the optical axis of the light reflected by the object and calculates the first surface shape of the object by the depth-from-focus principle. On the other hand, using the phase data of the complex amplitude, the apparatus can measure a micro shape in the sub-fringe order by ordinary laser interference measurement. The first surface shape data are applied to a region including a step of a height greater than ½ of the light's wavelength and second surface shape data are applied to the other region.
    Type: Application
    Filed: September 23, 2002
    Publication date: April 10, 2003
    Inventor: Nobuhiro Morita
  • Publication number: 20030023171
    Abstract: The present device is equipped with a measurement site holder 3 that is constructed using a negative impression of the measurement site 10. As a result, variation in the measured values caused by the non-uniform distribution of components in the measurement site 10 is reduced, so that variation in the measured values caused by variations in the light path length accompanying variations in the shape of the measurement site 10, and by variations in blood flow or the like that accompany differences in the contact pressure, can be reduced. Since living-body information and measurement parameters for the patient are recorded on a recording medium 11 mounted on a measurement site holder 3 for the exclusive use of the individual patient, the erroneous acquisition of living-body information for individual patients can be prevented, and reproducible measurements can be performed.
    Type: Application
    Filed: August 2, 2002
    Publication date: January 30, 2003
    Inventors: Katsuhiko Sato, Nobuhiro Morita, Yukio Ueda, Toshihiko Mizuno, Shigeru Sakamoto, Koji Yamanaka, Toshiyuki Tanaka, Hideo Takahashi, Keiji Suyama, Seiichiro Hashimoto
  • Patent number: 6266141
    Abstract: Transmission light from a detection lens is directed to a polarization element as incident light. The polarization element is rotated, and the light is received and detected by an array-state light-receiving element, and the birefringence of the detection lens is calculated. The distance between a lens for radiating the diffusion light onto the detection lens and the detection lens itself can be optionally set. Observing the transmission image of the detection lens, the distance between the detection lens and the lens is determined. Thereby, it is possible to obtain optical elasticity interference fringes which at most are scarcely affected by optical distortions. In addition, a focusing magnification rate is most suitably set to match states of birefringence occurrence which are different in accordance with the detection lens or the placement thereof.
    Type: Grant
    Filed: April 22, 1999
    Date of Patent: July 24, 2001
    Assignee: Ricoh Company, Ltd.
    Inventor: Nobuhiro Morita
  • Patent number: 5844670
    Abstract: Accurate yet cost-effective measurement methods and systems determine eccentricity at a particular location of the aspherical lens surface. Since an aspherical lens generally has varying degrees of curvature along the aspherical surface, the eccentricity at the selected location on the aspherical lens surface provides precise information in determining the quality of a certain type of an aspherical lens component. Furthermore, these improved methods and systems according to the current invention are applicable to measure eccentricity of a selected aspherical lens surface in a complex lens assembly containing a plurality of aspherical lens components.
    Type: Grant
    Filed: July 29, 1996
    Date of Patent: December 1, 1998
    Assignee: Ricoh Co., Ltd.
    Inventors: Nobuhiro Morita, Masayuki Takai
  • Patent number: 5548396
    Abstract: In a method and an apparatus for measuring eccentricity of an aspherical lens, a detected lens as the aspherical lens is supported by a holding device and is rotated by a driving device around a rotating axis approximately conforming to an optical axis of the detected lens. Light is irradiated from a light source to the detected lens through a beam splitter and an optical system. Light reflected on the detected lens is reversely transmitted through the optical system and is focused and formed as a spot image. A pressing face of an alignment adjusting device is arranged in a position separated from the optical axis by a radius of the detected lens. The pressing face pushes an outer circumferential edge of the detected lens deflected outward by rotating the detected lens. Thus, the pressing face moves the detected lens and coarsely adjusts a position of the detected lens by approximately conforming the optical and rotating axes to each other.
    Type: Grant
    Filed: July 26, 1994
    Date of Patent: August 20, 1996
    Assignee: Ricoh Company, Ltd.
    Inventors: Nobuhiro Morita, Takeshi Tada