Abstract: The present invention comprises: an input unit that enters scene information indicating the state of a prescribed scene in a container that stores an object; a processing unit that, on the basis of the scene information entered into the input unit, sorts objects in the container by size and, on the basis of the number of sorted objects of different sizes, detects objects of sizes that are not acceptable for storage in the container; and an output unit that outputs the results of processing by the processing unit.

Abstract: A ranking of each of a plurality of users is set, and based on a numerical value indicating the ranking, an indicator is calculated such that the smaller the numerical value, the greater a value of the indicator. Then, the indicator calculated for the user is displayed. The indicator is displayed such that the higher the ranking, the greater the value of the indicator. This can enhance the motivation of a user.

Abstract: Product management and/or prompt defect analysis of a semiconductor device may be carried out without reducing the throughput in assembly and testing. Unique identification information is attached to a plurality of substrates (lead frames) used in manufacturing a semiconductor device (QFP) and to a transport unit for transporting a plurality of substrates, respectively. Identification information (rack ID) of the transport unit and identification information (substrate ID) of the substrate stored into the transport unit are associated with each other. The substrate is taken out from the transport unit set to a loader unit of each manufacturing apparatus and supplied to a processing unit, of the apparatus and in storing the substrate, the processing of which is complete, into a transport unit of an unloader unit of the apparatus, an association between identification information of the transport unit and the identification information of the substrate is checked.

Abstract: Product management and/or prompt defect analysis of a semiconductor device may be carried out without reducing the throughput in assembly and testing. Unique identification information is attached to a plurality of substrates (lead frames) used in manufacturing a semiconductor device (QFP) and to a transport unit for transporting a plurality of substrates, respectively. Identification information (rack ID) of the transport unit and identification information (substrate ID) of the substrate stored into the transport unit are associated with each other. The substrate is taken out from the transport unit set to a loader unit of each manufacturing apparatus and supplied to a processing unit, of the apparatus and in storing the substrate, the processing of which is complete, into a transport unit of an unloader unit of the apparatus, an association between identification information of the transport unit and the identification information of the substrate is checked.

Abstract: Product management and/or prompt defect analysis of a semiconductor device may be carried out without reducing the throughput in assembly and testing. Unique identification information is attached to a plurality of substrates (lead frames) used in manufacturing a semiconductor device (QFP) and to a transport unit for transporting a plurality of substrates, respectively. Identification information (rack ID) of the transport unit and identification information (substrate ID) of the substrate stored into the transport unit are associated with each other. The substrate is taken out from the transport unit set to a loader unit of each manufacturing apparatus and supplied to a processing unit, of the apparatus and in storing the substrate, the processing of which is complete, into a transport unit of an unloader unit of the apparatus, an association between identification information of the transport unit and the identification information of the substrate is checked.

Abstract: A ranking of each of a plurality of users is set, and based on a numerical value indicating the ranking, an indicator is calculated such that the smaller the numerical value, the greater a value of the indicator. Then, the indicator calculated for the user is displayed. The indicator is displayed such that the higher the ranking, the greater the value of the indicator. This can enhance the motivation of a user.

Abstract: Product management and/or prompt defect analysis of a semiconductor device may be carried out without reducing the throughput in assembly and testing. Unique identification information is attached to a plurality of substrates (lead frames) used in manufacturing a semiconductor device (QFP) and to a transport unit for transporting a plurality of substrates, respectively. Identification information (rack ID) of the transport unit and identification information (substrate ID) of the substrate stored into the transport unit are associated with each other. The substrate is taken out from the transport unit set to a loader unit of each manufacturing apparatus and supplied to a processing unit, of the apparatus and in storing the substrate, the processing of which is complete, into a transport unit of an unloader unit of the apparatus, an association between identification information of the transport unit and the identification information of the substrate is checked.

Abstract: A clutch control arrangement designed to prevent intentional starting of a vehicle while a clutch-stroke-position learning is being performed. The clutch control arrangement includes a mechanism for automatically disengaging and engaging a clutch. The vehicle has a manual transmission of which gear position (shift position) is changed as a driver operates a shift lever. The clutch control arrangement further includes a learning unit for learning a stroke position of the clutch, and a unit for interrupting the operation of the learning unit when the shift lever is operated toward a transmission gear engaged position during the clutch-stroke-position learning. Preferably, the automatic disengagement and engagement mechanism automatically disengages or engages the clutch depending upon a gear engaged condition of the manual transmission after interrupting the clutch-stroke-position learning.