Patents by Inventor Nobuyoshi TADA

Nobuyoshi TADA has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 11561184
    Abstract: The purpose of the present invention is to increase accuracy of a specific test using an electronic microscope and improve work efficiency. Provided is a system that identifies test recipe information corresponding to an object to be tested on the basis of attribute information about a testing sample, and analyzes and evaluates the object to be tested contained in the testing sample by checking image data and element analysis data that are acquired by a measuring device in accordance with a control program for the test recipe information, against reference image data and reference element analysis data that are used as evaluation references for the object to be tested.
    Type: Grant
    Filed: September 25, 2018
    Date of Patent: January 24, 2023
    Assignee: HITACHI HIGH-TECH CORPORATION
    Inventors: Nobuyoshi Tada, Shigeya Tanaka, Minori Noguchi, Yuusuke Oominami, Maya Goto
  • Publication number: 20200278303
    Abstract: The purpose of the present invention is to increase accuracy of a specific test using an electronic microscope and improve work efficiency. Provided is a system that identifies test recipe information corresponding to an object to be tested on the basis of attribute information about a testing sample, and analyzes and evaluates the object to be tested contained in the testing sample by checking image data and element analysis data that are acquired by a measuring device in accordance with a control program for the test recipe information, against reference image data and reference element analysis data that are used as evaluation references for the object to be tested.
    Type: Application
    Filed: September 25, 2018
    Publication date: September 3, 2020
    Inventors: Nobuyoshi TADA, Shigeya TANAKA, Minori NOGUCHI, Yuusuke OOMINAMI, Maya GOTO
  • Publication number: 20150276557
    Abstract: A state monitoring system enabling a sign of abnormality of equipment to be detected is disclosed, which includes: a storage unit to be stored with normal models obtained by analyzing, per series of manipulations, time-series learning data of sensor outputs indicated by respective units of processing equipment when normally finishing processing a raw material through the series of manipulations according to a default sequence; and a processing unit to diagnose a state of the processing equipment on the occasion of processing a specified raw material, upon an input of time-series evaluation data of the sensor output indicated by each of the units of the processing equipment on the occasion of finishing processing the specified raw material through the series of manipulations, on the basis of a comparison between the inputted data and the normal model.
    Type: Application
    Filed: March 27, 2015
    Publication date: October 1, 2015
    Inventors: Toshio MASUDA, Mutsuki KOGA, Hideo NISHIKAWA, Junichi KOKUMA, Nobuyoshi TADA