Abstract: A host lattice modified GOS scintillating material and a method for using a host lattice modified GOS scintillating material is provided. The host lattice modified GOS scintillating material has a shorter afterglow than conventional GOS scintillating material. In addition, a radiation detector and an imaging device incorporating a host lattice modified GOS scintillating material are provided. A spectral filter may be used in conjunction with the GOS scintillating material.

Abstract: An imaging system (100) includes a radiation source (110) and a radiation sensitive detector array (116), which includes a scintillator array (118) and a photosensor array (120) optically coupled to the scintillator array, wherein the scintillator array includes Gd2O2S:Pr,Tb,Ce. A method includes detecting radiation with a radiation sensitive detector array (116) of an imaging system (100), wherein the radiation sensitive detector array includes a Gd2O2S:Pr,Tb,Ce based scintillator array (118). A radiation sensitive detector array (116) includes a scintillator array (118) and a photosensor array (120) optically coupled to the scintillator array, wherein the scintillator array includes Gd2O2S:Pr,Tb,Ce, and an amount of Tb3+ in the Gd2O2S:Pr,Tb,Ce is equal to or less than two hundred mole parts per million.

Abstract: A host lattice modified GOS scintillating material and a method for using a host lattice modified GOS scintillating material is provided. The host lattice modified GOS scintillating material has a shorter afterglow than conventional GOS scintillating material. In addition, a radiation detector and an imaging device incorporating a host lattice modified GOS scintillating material are provided. A spectral filter may be used in conjunction with the GOS scintillating material.

Abstract: A host lattice modified GOS scintillating material and a method for using a host lattice modified GOS scintillating material is provided. The host lattice modified GOS scintillating material has a shorter afterglow than conventional GOS scintillating material. In addition, a radiation detector and an imaging device incorporating a host lattice modified GOS scintillating material are provided. A spectral filter may be used in conjunction with the GOS scintillating material.

Abstract: An imaging system (100) includes a radiation source (110) and a radiation sensitive detector array (116), which includes a scintillator array (118) and a photosensor array (120) optically coupled to the scintillator array, wherein the scintillator array includes Gd2O2S:Pr,Tb,Ce. A method includes detecting radiation with a radiation sensitive detector array (116) of an imaging system (100), wherein the radiation sensitive detector array includes a Gd2O2S:Pr,Tb,Ce based scintillator array (118). A radiation sensitive detector array (116) includes a scintillator array (118) and a photosensor array (120) optically coupled to the scintillator array, wherein the scintillator array includes Gd2O2S:Pr,Tb,Ce, and an amount of Tb3+ in the Gd2O2S:Pr,Tb,Ce is equal to or less than two hundred mole parts per million.

Abstract: The invention relates to a Gd2O2S:Nd fluorescent material and the use of Nd3+ as emitter in suitable materials.

Abstract: Scattered radiation has non-intuitive properties. A signalling system (28) is presented which provides a perceptible signal (34) being indicative of a predicted or measured spatial distribution of scattered radiation. An embodiment provides for easy assessment of the individual risk of scattered radiation exposure for personnel working in an environment exposed to scattered radiation. A method for predicting a distribution of scattered radiation takes into account at least one object related parameter (18) and at least one radiation related parameter (22) and, in response hereto, predicts a distribution of scattered radiation.

Abstract: A host lattice modified GOS scintillating material and a method for using a host lattice modified GOS scintillating material is provided. The host lattice modified GOS scintillating material has a shorter afterglow than conventional GOS scintillating material. In addition, a radiation detector and an imaging device incorporating a host lattice modified GOS scintillating material are provided.

Abstract: A host lattice modified GOS scintillating material and a method for using a host lattice modified GOS scintillating material is provided. The host lattice modified GOS scintillating material has a shorter afterglow than conventional GOS scintillating material. In addition, a radiation detector and an imaging device incorporating a host lattice modified GOS scintillating material are provided.

Abstract: The invention relates to a Gd2O2S:Nd fluorescent material and the use of Nd3+ as emitter in suitable materials.

Abstract: A scintillation element comprises a scintillation material, and a reflective layer, wherein the reflective layer is formed as an intrinsic part of the scintillation material. Preferably, a plurality of scintillation elements may be arranged to form a scintillation array. A method for producing a scintillation element comprises providing a scintillation material, and producing a reflective layer at the scintillation material by exposing the scintillation material to physical and/or chemical conditions in such a way that the reflective layer is formed out of a part of the scintillation material.

Abstract: Scattered radiation has non-intuitive properties. A signalling system (28) is presented which provides a perceptible signal (34) being indicative of a predicted or measured spatial distribution of scattered radiation. An embodiment provides for easy assessment of the individual risk of scattered radiation exposure for personnel working in an environment exposed to scattered radiation. A method for predicting a distribution of scattered radiation takes into account at least one object related parameter (18) and at least one radiation related parameter (22) and, in response hereto, predicts a distribution of scattered radiation.

Abstract: A scintillation element comprises a scintillation material, and a reflective layer, wherein the reflective layer is formed as an intrinsic part of the scintillation material. Preferably, a plurality of scintillation elements may be arranged to form a scintillation array. A method for producing a scintillation element comprises providing a scintillation material, and producing a reflective layer at the scintillation material by exposing the scintillation material to physical and/or chemical conditions in such a way that the reflective layer is formed out of a part of the scintillation material.

Abstract: The invention relates to a method of reading out the sensor elements of a sensor (1) with a matrix of light-sensitive or X-ray-sensitive sensor elements (S1,2; S1,2 . . . ) which are arranged in rows and columns and generate charges in dependence on the incident quantity of radiation, the switches (3) of the relevant sensor elements being activated via address lines (4, . . . , 8, . . . ) and the charges of the respective activated sensor elements being drained via read-out lines (9, 10, 11, . . . ) so as to be processed further by way of amplifiers (14, . . . , 18, . . . ) and transfer means (19). The invention also relates to a corresponding sensor as well as to an X-ray examination apparatus which includes an X-ray source for emitting an X-ray beam for irradiating an object in order to form an X-ray image, as well as a detector for generating an electrical image signal from said X-ray image.

Abstract: The invention relates to a method of reading out the sensor elements of a sensor (1) with a matrix of light-sensitive or X-ray-sensitive sensor elements (S1,2; S1,2 . . . ) which are arranged in rows and columns and generate charges in dependence on the incident quantity of radiation, the switches (3) of the relevant sensor elements being activated via address lines (4, . . . , 8, . . . ) and the charges of the respective activated sensor elements being drained via read-out lines (9, 10, 11, . . . ) so as to be processed further by way of amplifiers (14, . . . , 18, . . . ) and transfer means (19). The invention also relates to a corresponding sensor as well as to an X-ray examination apparatus which includes an X-ray source for emitting an X-ray beam for irradiating an object in order to form an X-ray image, as well as a detector for generating an electrical image signal from said X-ray image.

Abstract: An image detector includes a sensor matrix with a plurality of sensor elements for converting radiation into electrical charges and with several line conductors. The sensor elements are arranged in columns and rows. Separate sensor elements are coupled to at least one of the line conductors. Separate groups of sensor elements in one column and/or in one row of the matrix are coupled to different line conductors and at least one line conductor is coupled to sensor elements of at least two columns or of at least two rows.

Abstract: An x-ray examination apparatus comprises an x-ray image sensor matrix (1) for deriving an initial image signal from the x-ray image. The sensor elements of the x-ray sensor matrix convert incident x-rays into electric charges. These electric charges are read-out and converted into the initial image signal. Further a correction unit (2) is provided for correcting the initial image signal, notably for disturbances due to delayed transferred charges, that have been retained in the sensor elements for some time. The correction unit (2) is provided with a memory which stores correction values. Further the correction provided with a selection unit (5) for selecting appropriate correction values from the memory (3).

Abstract: An x-ray examination apparatus comprises an x-ray image sensor matrix (1) for deriving an initial image signal from the x-ray image. The sensor elements of the x-ray sensor matrix convert incident x-rays into electric charges. These electric charges are read-out and converted into the initial image signal. Further a correction unit (2) is provided for correcting the initial image signal, notably for disturbances due to delayed transferred charges, that have been retained in the sensor elements for some time. The correction unit (2) is provided with a memory which stores correction values. Further the correction provided with a selection unit (5) for selecting appropriate correction values from the memory (3).

Abstract: A medical X-ray apparatus is provided with image detector elements 30 which are arranged in a matrix of rows and columns. In order to improve the noise behaviour of the read amplifiers 46 during the reading per row, a plurality of column conductors 36 is provided per column so that the read time is prolonged in proportion to the number of column conductors and the stray capacitance is reduced proportionally. Both steps reduce the noise in known manner. In the case of an integrated implementation, the conductors for driving the reading per row cannot be arranged arbitrarily close to one another because of their mutual capacitance, so that these conductors require a comparatively large surface area.

Abstract: An x-ray examination apparatus includes an x-ray source for emitting x-rays and an x-ray detector for deriving an image signal from an x-ray image. The x-ray detector has a semiconductor element including one or several sensor elements. Further the x-ray examination apparatus is provided with a bias radiation source for irradiating the x-ray detector with electromagnetic radiation. In particular, the x-ray detector is an x-ray sensor matrix having a multitude of semiconductor sensor elements. Preferably the bias radiation source is arranged to emit infrared radiation.