Abstract: An infrared (IR) spectrometer (20) for IR spectroscopic investigation of a test sample (1) in a first wavenumber range WB1, comprising a sample container (1a) for the test sample (1), wherein the sample container (1a) is transparent to IR radiation in the first wavenumber range WB1, and wherein the IR spectrometer (20) comprises a measuring device for determining the temperature of the test sample (1), is characterized in that the measuring device comprises an IR sensor (2) which measures, without contact, the intensity of the IR radiation emitted by the sample container (1a), and the sample container (1a) is opaque to IR radiation in the second wavenumber range WB2. A simple and reliable measurement of the temperature of a test sample in an IR spectrometer is thereby enabled.

Abstract: An infrared (IR) spectrometer (20) for IR spectroscopic investigation of a test sample (1) in a first wavenumber range WB1, comprising a sample container (1a) for the test sample (1), wherein the sample container (1a) is transparent to IR radiation in the first wavenumber range WB1, and wherein the IR spectrometer (20) comprises a measuring device for determining the temperature of the test sample (1), is characterized in that the measuring device comprises an IR sensor (2) which measures, without contact, the intensity of the IR radiation emitted by the sample container (1a), and the sample container (1a) is opaque to IR radiation in the second wavenumber range WB2. A simple and reliable measurement of the temperature of a test sample in an IR spectrometer is thereby enabled.

Abstract: The present invention relates to an FTIR spectrometer comprising a single-element detector to analyze a detector light beam emitted by a sample, with a unit to digitize the voltage available at the detector output and with a unit to process the digitized voltage. The single-element detector and the dedicated unit to digitize the detector voltage are located immediately adjacent to each other.

Abstract: The present invention relates to an FTIR spectrometer comprising a single-element detector to analyze a detector light beam emitted by a sample, with a unit to digitize the voltage available at the detector output and with a unit to process the digitized voltage. The single-element detector and the dedicated unit to digitize the detector voltage are located immediately adjacent to each other.

Abstract: A method for taking a spatially resolved spectrum, in particular an infrared (IR) spectrum, of a sample by means of a Fourier-transform (FT)-spectrometer, is described wherein light emitted by a light source is fed to an interferometer, directed onto the sample and detected by an array-detector, wherein a movable reflector of the interferometer is displaced over a distance s and the array-detector is read out at a number n of predetermined discrete way points s1, . . . , sn of the distance s, respectively. When the movable reflector is displaced over the distance s, the array-detector is first read out at respective non-adjacent way points sd separated by at least one respective intermediate way point si, and that the movable reflector is displaced over the distance s at least twice, wherein the array-detector is read out at the way points si upon a second or further repeated displacement over the distance s.

Abstract: The present invention relates to an FTIR spectrometer comprising a single-element detector to analyze a detector light beam emitted by a sample, with a unit to digitize the voltage available at the detector output and with a unit to process the digitized voltage. The single-element detector and the dedicated unit to digitize the detector voltage are located immediately adjacent to each other.

Abstract: A method for taking a spatially resolved spectrum, in particular an infrared (IR) spectrum, of a sample by means of a Fourier-transform (FT)-spectrometer, is described wherein light emitted by a light source is fed to an interferometer, directed onto the sample and detected by an array-detector, wherein a movable reflector of the interferometer is displaced over a distance s and the array-detector is read out at a number n of predetermined discrete way points s1, . . . , sn of the distance s, respectively. When the movable reflector is displaced over the distance s, the array-detector is first read out at respective non-adjacent way points sd separated by at least one respective intermediate way point si, and that the movable reflector is displaced over the distance s at least twice, wherein the array-detector is read out at the way points si upon a second or further repeated displacement over the distance s.

Abstract: An optical spectrometer (1) with an interferometer having a means for varying the optical path difference comprising a drive (8), and with a detector (6) for recording optical signals from the interferometer and converting them into electrical analog signals, wherein an analog-to-digital converter (ADC) (9) is connected to the detector (6) digitizing the electrical analog signals in a time-equidistant manner, is characterized in that the data acquisition electronics (17) are supplied by a switched power supply (14), the clock of which is derived from the same reference oscillator (16) as the clock of the signal digitization by the ADC (9). In contrast to known spectrometers with spatially equidistant sampling of the detector signal, the design of the spectrometer according to the invention is considerably cheaper and more compact with respect to its voltage supply elements. Galvanic separation of the data acquisition electronics and the electronic control unit of the linear drive is no longer required.

Abstract: A method of obtaining an FT spectrum according to Brault is improved in that the compensation filter is determined by recording a broad-band effective interferogram, carrying out complex Fourier transformation, forming a mean value of the phase spectra, converting the abscissa values into electrical frequencies, and establishing the transfer function of the detector and of the further signal processing elements, wherein the free parameters of the transfer function are chosen such that the phase response of the transfer function deviates as little as possible from the mean value of the phase spectrum of the effective recorded interferogram. If necessary, the determined transfer function is then digitized. The compensation filter is then determined as the inverse of the discrete transfer function. In this way, deconvolution of the signal processing elements transfer function from the spectra is facilitated in a particularly simple and effective manner.

Abstract: In an analytic spectrometer (50) having a central computer (9), permanently installed and exchangeable components (5), such as a radiation source, a detector, a beam splitter, a filter, external measurement probes and the like, each of which exhibiting a readable data carrier (7) with encoded data of parameters characterizing the respective component (5), the data media (7) can be written to and contains changeable time dependent data concerning the history and/or the actual properties of the corresponding component (5) for example length of operation, performance deterioration parameters or calibration curves of the component (5). These data can be continuously adjusted by the central computer (9) to the current state of the component (5) so that the data medium (7) connected to the component (5) can immediately supply information concerning the current actual properties of the component (5) when installing the component (5) in another spectrometer.

Abstract: An infrared Fourier transformation spectrometer comprising a non-linear analog-to-digital converter device having at least one amplifier and one sample and hold circuit connected downstream thereof, as well as an an analog-to-digital converter following the latter, wherein an input signal to be converted is to be supplied to one input of the amplifier and the gain of the input signal is a function of the magnitude fo the input signal, and wherein the output signal of the analog-to-digital converter is evaluated giving regard to the respective gain, is characterized by the fact that at least two analog-to-digital converters are provided whose outputs are connected to a first controllable switching arrangement for supplying selectively the output signals of one of the said analog-to-digital converters to another evaulation means and that the input signal is supplied to each of the said analog-to-digital converters amplified by a different amplification factor.