Patents by Inventor Noritsugu Ono

Noritsugu Ono has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 10807206
    Abstract: Measuring apparatus includes an upper support supporting a first end of a columnar work piece in an axis direction, a lower support supporting a second end of the work piece in the axis direction, a probe measuring the work piece supported by the upper support and lower support, a rotary table coupled to the lower support and capable of rotating centered in the axis direction, and a post provided to the rotary table and mounting a first position determiner and a second position determiner so as to be switchable, the first and second position determiner determining a position of the work piece with respect to the rotary table. When a first columnar work piece as the work piece is supported by the upper support and lower support, the first position determiner is mounted to the post to determine a position by contacting the first work piece.
    Type: Grant
    Filed: May 9, 2017
    Date of Patent: October 20, 2020
    Assignee: MITUTOYO CORPORATION
    Inventors: Mitsuru Fukuda, Noritsugu Ono, Hirotada Anzai
  • Publication number: 20170341192
    Abstract: Measuring apparatus includes an upper support supporting a first end of a columnar work piece in an axis direction, a lower support supporting a second end of the work piece in the axis direction, a probe measuring the work piece supported by the upper support and lower support, a rotary table coupled to the lower support and capable of rotating centered in the axis direction, and a post provided to the rotary table and mounting a first position determiner and a second position determiner so as to be switchable, the first and second position determiner determining a position of the work piece with respect to the rotary table. When a first columnar work piece as the work piece is supported by the upper support and lower support, the first position determiner is mounted to the post to determine a position by contacting the first work piece.
    Type: Application
    Filed: May 9, 2017
    Publication date: November 30, 2017
    Applicant: MITUTOYO CORPORATION
    Inventors: Mitsuru FUKUDA, Noritsugu ONO, Hirotada ANZAI
  • Patent number: 8676527
    Abstract: A coordinate measuring machine (industrial machine) includes: a column and a support that extend along the Z-axis; a beam being provided between the column and the support; a slider being movable on the beam; a ram being held on the slider movably along the Z-axis direction; a temperature detecting sensor and a temperature detector that detect the respective temperatures of the column, the support and the ram; and a shift amount calculator that calculates a Z-axis shift amount based on the respective temperatures of the column, the support and the ram, reference position data indicating a positional relationship between the column, the support and the ram at a reference temperature, and respective thermal expansion coefficients for the column, the support and the ram.
    Type: Grant
    Filed: July 26, 2011
    Date of Patent: March 18, 2014
    Assignee: Mitutoyo Corporation
    Inventors: Noritsugu Ono, Kazuaki Kawarai, Seiichi Otsubo, Hirotada Anzai, Kazumi Mizukami
  • Publication number: 20120029857
    Abstract: A coordinate measuring machine (industrial machine) includes: a column and a support that extend along the Z-axis; a beam being provided between the column and the support; a slider being movable on the beam; a ram being held on the slider movably along the Z-axis direction; a temperature detecting sensor and a temperature detector that detect the respective temperatures of the column, the support and the ram; and a shift amount calculator that calculates a Z-axis shift amount based on the respective temperatures of the column, the support and the ram, reference position data indicating a positional relationship between the column, the support and the ram at a reference temperature, and respective thermal expansion coefficients for the column, the support and the ram.
    Type: Application
    Filed: July 26, 2011
    Publication date: February 2, 2012
    Applicant: MITUTOYO CORPORATION
    Inventors: Noritsugu ONO, Kazuaki KAWARAI, Seiichi OTSUBO, Hirotada ANZAI, Kazumi MIZUKAMI
  • Patent number: 4805314
    Abstract: A method of and apparatus for effecting spatial coordinate measurement of the contour or the like of an object to be measured in which a plurality of probes are successively used in accordance with the modes of measurement. In one of the probes adapted for measuring the roundness or the like the object, the posture of the probing tip can be changed relative to the main body of the probe by the driving operation of a threaded shaft which extends in the direction perpendicular to the axis of the main body of the probe. A means for driving this threaded shaft is disposed on the side of a probe stocker. The posture of the probing tip is thereby preliminarily changed so as to enable a corresponding predetermined measuring process in which the probe will be used.
    Type: Grant
    Filed: April 17, 1987
    Date of Patent: February 21, 1989
    Assignee: Mitutoyo Corporation
    Inventors: Koji Hayashi, Susumu Yoshioka, Noritsugu Ono
  • Patent number: 4631834
    Abstract: A coordinate measuring instrument including: a table (50) movable in the direction of Y-axis on a bedplate (10); a slider (110) movable in the direction of X-axis through supports (90) and a beam member (100); a Z-axis structure (180) supported by this slider (110) in a manner to be movable in the direction of Z-axis; a probe stocker (290) fixed to the table (50) and capable of resting thereon a plurality of probe holders (250) each having a signal producing probe (280); and a probe mounting-removing mechanism (200) provided in the Z-axis structure (180), the probe mounting-removing mechanism (200) being capable of selectively installing a signal producing probe (250) most suitable for the shape of a work (320) to be measured.
    Type: Grant
    Filed: August 29, 1985
    Date of Patent: December 30, 1986
    Assignee: Mitutuoyo Mfg. Co., Ltd.
    Inventors: Koji Hayashi, Susumu Yoshioka, Noritsugu Ono