Abstract: An apparatus and method for determining a bitting pattern of a key comprising a housing used for optically outlining at least the profile of the blade of the key so as to form an image. The image is digitized and information created therefrom, including information about the width of the blade of the key at a plurality of selected longitudinal positions along the length to include the width of the blade at the location of at least one cut of the bitting pattern. The information about the bitting pattern of the key digitized can then be used to cut the bitting patten into a key blank. Alternatively, the information can be compared to stored information and the detected width of the blade adjusted at a location of at least one cut to be one of a plurality of predetermined widths from the manufacturer, thereby creating a regenerated bitting pattern of the key.

Abstract: An apparatus and method for determining a bitting pattern of a key comprising a housing used for optically outlining at least the profile of the blade of the key so as to form an image. The image is digitized and information created therefrom, including information about the width of the blade of the key at a plurality of selected longitudinal positions along the length to include the width of the blade at the location of at least one cut of the bitting pattern. The information about the bitting pattern of the key digitized can then be used to cut the bitting patten into a key blank. Alternatively, the information can be compared to stored information and the detected width of the blade adjusted at a location of at least one cut to be one of a plurality of predetermined widths from the manufacturer, thereby creating a regenerated bitting pattern of the key.

Abstract: An apparatus and method for identifying a key using a housing having a support that allows light to pass therethrough adjacent the key, a light source for emitting light through at least a portion of the support so as to form a first image of at least a portion of the profile of the key, a substantially planar light beam directed at the key so as to form a second image as the light beam interfaces with the side of the key, and a receiving means for receiving the first image of the profile of the key and receiving the second image so that the non-planar portion of the side of the key forms a non-linear segment across the width of the key. The present invention then can digitize the first and second images and create key information from the digitized images, in which the information is compared to stored information about a plurality of reference keys.

Abstract: An optical photodetection apparatus for glass surface defect photodetection includes a source for directing light, as an incident beam thereof against a glass surface target, which source is selected to emit light at wavelengths substantially overlapping a target-glass-absorbed bandwidth. The apparatus further includes a first optical polarizer for polarizing light emitted from the source, such that the first optical polarizer passes a resultant, polarized, incident beam against a target glass surface. The detector comprises an at least one silicon photodetector, and further includes a second optical polarizer arranged in cross-polarized relation to the first optical polarizer. The detector is aligned in defect scattered light beam detecting relation relative to the incident beam, preferably at an angle in the Brewster range, and is operable to generate a detected signal in response to light scattered through defects in said target surface.

Abstract: The present invention is directed to an improved method and apparatus for detecting defects in photomasks containing features with different arbitrary orientations, said apparatus including in one form therof a detector for detecting orientations of the features so that the optical signals from the features may be suppressed by suitable apparatus such as spatial filtering. The spatial filtering is adjusted electronically based on the determined orientation of the mask features. In one form of the invention the spatial filtering is effected by accepting photodetected signals from only a selected number of photodetectors in a photodetector array, the selection being determined by the orientation of the mask features.

Abstract: An automatic high speed microfilm searching system is disclosed for locating a desired frame of microfilm. Each frame consists of information data and index data. The index data comprises a sequence of vertically-aligned data bar groups, each representing a half character of a sequence of characters of a unique index code for the associated frame. A pair of synchronization bars, each half the width of a data bar, is vertically aligned with each data bar group. Additional synchronization pulses both precede and follow the data bar groups. Depending on which direction the microfilm is moving, the leading synchronization bars are sensed by a bar sensing unit on the left or on the right of the viewing screen. Each sensing bar unit comprises a plurality of vertically-aligned data bar sensors and synchronization bar sensors, with three sensors assigned to each vertical bar in a data bar group, and three sensors assigned to reading the synchronization bars.

Abstract: An optical inspection system is adapted to provide a null when an inspected object is of prescribed geometry. An optical beam forms an image of the object to be inspected and detectors are placed in pairs at like positions, dictated by the symmetry of the image, to exhibit like signals when those positions in the image actually are alike. The system is adaptable to assembly line operation by the placement of detectors at like positions with respect to each of two consecutive images similarly generating like signals when like portions of the images are identical.