Abstract: The disclosure features methods and systems that include positioning a surface of a coverslip overlying a sample relative to an object plane of a microscope system, projecting a two-dimensional pattern of light onto the surface, where a focal plane of the two-dimensional pattern at a position of the surface is rotated by an angle ? relative to the object plane, obtaining a two-dimensional image of the pattern of light reflected from the surface using a detector that includes an imaging sensor oriented perpendicular to a direction of propagation of the reflected pattern of light at the sensor, analyzing the image to determine a line of best focus of the pattern within the image, determining an offset of the line of best focus from an expected position of the line of best focus within the image, and determining a position adjustment of the surface based on the offset.

Abstract: Certain configurations are described of methods and systems that can be used to image three-dimensional objects such as biological cells, biological tissues or biological organisms. The methods and systems can image the three-dimensional objects at reduced imaging times and with reduced data volumes.

Abstract: The disclosure features methods and systems that include positioning a surface of a coverslip overlying a sample relative to an object plane of a microscope system, projecting a two-dimensional pattern of light onto the surface, where a focal plane of the two-dimensional pattern at a position of the surface is rotated by an angle ? relative to the object plane, obtaining a two-dimensional image of the pattern of light reflected from the surface using a detector that includes an imaging sensor oriented perpendicular to a direction of propagation of the reflected pattern of light at the sensor, analyzing the image to determine a line of best focus of the pattern within the image, determining an offset of the line of best focus from an expected position of the line of best focus within the image, and determining a position adjustment of the surface based on the offset.

Abstract: A method for analyzing chemical and/or biological samples comprises the production of a particle image (42) of at least one particle included in the sample. Subsequently, a particle surface (10) of the at least one particle included in the particle image (42) is divided into particle zones (14,18). According to the invention, zone-dependent particle data are subsequently acquired in different states (z1, z2, z3), which then can be evaluated.

Abstract: A method for analyzing chemical and/or biological samples comprises the production of a particle image (42) of at least one particle included in the sample. Subsequently, a particle surface (10) of the at least one particle included in the particle image (42) is divided into particle zones (14,18). According to the invention, zone-dependent particle data are subsequently acquired in different states (z1, z2, z3), which then can be evaluated.

Abstract: A method for analyzing chemical and/or biological samples comprises the production of a particle image (42) of at least one particle included in the sample. Subsequently, a particle surface (10) of the at least one particle included in the particle image (42) is divided into particle zones (14,18). According to the invention, zone-dependent particle data are subsequently acquired in different states (z1, z2, z3), which then can be evaluated.