Patents by Inventor Oleg Byl

Oleg Byl has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20240136145
    Abstract: Described are ion implantation devices, systems, and methods, and in particular to an ion source that is useful for generating an aluminum ion beam.
    Type: Application
    Filed: December 11, 2023
    Publication date: April 25, 2024
    Inventors: Ying Tang, Joe R. Despres, Joseph D. Sweeney, Oleg Byl, Barry Lewis Chambers
  • Publication number: 20240124776
    Abstract: Novel high purity dimethylaluminium chloride compositions are provided that are suitable for semiconductor applications, such as atomic layer etch and aluminum ion implantation. The reduction or minimization of specified gaseous impurities allows the vapor phase of the DMAC to have purity levels of 99.9 mol % or higher to selectively etch various atomic layers with high selectivity and high etch precision at acceptable etch rates and 99 mol % or higher to ion implant aluminum ions without substantial implantation of C2H3 ions into a wafer device, thereby avoiding degradation or failure of the wafer device. Storage conditions are established that are conducive to maintaining the high purity levels required for such semiconductor applications.
    Type: Application
    Filed: June 13, 2023
    Publication date: April 18, 2024
    Inventors: Laurence E. Spurgeon, Ashwini K. Sinha, Douglas C. Heiderman, Stanley M. Smith, Oleg Byl
  • Patent number: 11881376
    Abstract: Described are ion implantation devices, systems, and methods, and in particular to an ion source that is useful for generating an aluminum ion beam.
    Type: Grant
    Filed: October 1, 2021
    Date of Patent: January 23, 2024
    Assignee: ENTEGRIS, INC.
    Inventors: Ying Tang, Joe R. Despres, Joseph D. Sweeney, Oleg Byl, Barry Lewis Chambers
  • Patent number: 11827973
    Abstract: The current disclosure is directed to methods and assemblies configured to deliver a mixture of germanium tetrafluoride (GeF4) and hydrogen (H2) gases to an ion implantation apparatus, so H2 is present in an amount in the range of 25%-67% (volume) of the gas mixture, or the GeF4 and H2 are present in a volume ratio (GeF4:H2) in the range of 3:1 to 33:67. The use of the H2 gas in an amount in mixture or relative to the GeF4 gas prevents the volatilization of cathode material, thereby improving performance and lifetime of the ion implantation apparatus. Gas mixtures according to the disclosure also result in a significant Ge+ current gain and W+ peak reduction during au ion implantation procedure.
    Type: Grant
    Filed: March 7, 2022
    Date of Patent: November 28, 2023
    Assignee: ENTEGRIS, INC.
    Inventors: Oleg Byl, Ying Tang, Joseph R. Despres, Joseph D. Sweeney, Sharad N. Yedave
  • Publication number: 20230235856
    Abstract: Described are systems and methods of storing adsorbing diborane on carbon adsorption medium.
    Type: Application
    Filed: January 27, 2023
    Publication date: July 27, 2023
    Inventors: Oleg Byl, John Robert Morris, Nathan Ballard Jones, Diego Troya
  • Publication number: 20230227309
    Abstract: Described are storage and dispensing systems and related methods for the selective dispensing germane (GeH4) as a reagent gas from a vessel in which the germane is held in sorptive relationship to a solid adsorbent medium that includes zeolitic imidazolate framework.
    Type: Application
    Filed: January 6, 2023
    Publication date: July 20, 2023
    Inventor: Oleg Byl
  • Patent number: 11682540
    Abstract: A system and method for ion implantation is described, which includes a gas or gas mixture including at least one ionizable gas used to generate ionic species and an arc chamber that includes two or more different arc chamber materials. Using the system ionic species are generated in the arc chamber with liner combination, and one or more desired ionic species display a higher beam current among the ionic species generated, which is facilitated by use of the different materials. In turn improved implantation of the desired ionic species into a substrate can be achieved. Further, the system can minimize formation of metal deposits during system operation, thereby extending source life and promoting improved system performance.
    Type: Grant
    Filed: September 3, 2021
    Date of Patent: June 20, 2023
    Assignee: ENTEGRIS, INC.
    Inventors: Ying Tang, Sharad N. Yedave, Joseph R. Despres, Joseph D. Sweeney, Oleg Byl
  • Patent number: 11621148
    Abstract: Described are plasma immersion ion implantation methods that use multiple precursor gases, particularly for the purpose of controlling an amount of a specific atomic dopant species that becomes implanted into a workpiece relative to other atomic species that also become implanted into the workpiece during the implantation process.
    Type: Grant
    Filed: September 17, 2020
    Date of Patent: April 4, 2023
    Assignee: ENTEGRIS, INC.
    Inventors: Ying Tang, Bryan C. Hendrix, Oleg Byl, Sharad N. Yedave
  • Publication number: 20230094492
    Abstract: Described are storage and dispensing systems, and related methods, for storing and selectively dispensing high purity reagent gas from a storage vessel in which the reagent gas is held in sorptive relationship to pyrolyzed carbon adsorption particles.
    Type: Application
    Filed: September 26, 2022
    Publication date: March 30, 2023
    Inventors: Oleg Byl, Joe R. Despres, Ed A. Sturm
  • Publication number: 20220349528
    Abstract: A storage vessel to contain reagent material. The storage vessel includes a vessel with a bottom, a top, an outlet at the top, sidewalls extending from the bottom to the top, a valve at the outlet, and an interior defined by the bottom, the top, and the sidewalls, the interior including a volume, and an extension tube having a first end engaged with the valve and a second end located toward a center of the interior volume from the first end such that, regardless of orientation of the vessel, the second end is above at least 25 percent of a volume of the interior volume.
    Type: Application
    Filed: April 28, 2022
    Publication date: November 3, 2022
    Inventors: Oleg Byl, Douglas Edwards, Jessica Verbisky
  • Publication number: 20220234105
    Abstract: Described are three-dimensional structures that contain metal-organic-framework adsorbent material and that are prepared by additive manufacturing techniques, as well as methods of preparing the structures by additive manufacturing methods.
    Type: Application
    Filed: January 25, 2022
    Publication date: July 28, 2022
    Inventors: Edward A. Sturm, Oleg Byl, Montray Leavy, Subhash Guddati, Thines Kumar Perumal
  • Publication number: 20220194804
    Abstract: Described are gas storage medium and methods of storing source gases in the gas storage medium, particularly relating to using hydroxylated metal oxides or hydroxylated metalloid oxides as a storage medium for storing diborane.
    Type: Application
    Filed: December 14, 2021
    Publication date: June 23, 2022
    Inventors: Oleg Byl, Diego Troya, Nathan B. Jones, John R. Morris
  • Publication number: 20220186358
    Abstract: The current disclosure is directed to methods and assemblies configured to deliver a mixture of germanium tetrafluoride (GeF4) and hydrogen (H2) gases to an ion implantation apparatus, so H2 is present in an amount in the range of 25%-67% (volume) of the gas mixture, or the GeF4 and H2 are present in a volume ratio (GeF4:H2) in the range of 3:1 to 33:67. The use of the H2 gas in an amount in mixture or relative to the GeF4 gas prevents the volatilization of cathode material, thereby improving performance and lifetime of the ion implantation apparatus. Gas mixtures according to the disclosure also result in a significant Ge+ current gain and W+ peak reduction during au ion implantation procedure.
    Type: Application
    Filed: March 7, 2022
    Publication date: June 16, 2022
    Inventors: Oleg Byl, Ying Tang, Joseph R. Despres, Joseph D. Sweeney, Sharad N. Yedave
  • Publication number: 20220112986
    Abstract: Described are storage and dispensing systems and related methods, for the selective dispensing germane (GeH4) as a reagent gas from a vessel in which the germane is held in sorptive relationship to a solid adsorbent medium that includes a zeolitic imidazolate framework.
    Type: Application
    Filed: October 6, 2021
    Publication date: April 14, 2022
    Inventor: Oleg BYL
  • Patent number: 11299802
    Abstract: The current disclosure is directed to methods and assemblies configured to deliver a mixture of germanium tetrafluoride (GeF4) and hydrogen (H2) gases to an ion implantation apparatus, so H2 is present in an amount in the range of 25%-67% (volume) of the gas mixture, or the GeF4 and H2 are present in a volume ratio (GeF4:H2) in the range of 3:1 to 33:67. The use of the H2 gas in an amount in mixture or relative to the GeF4 gas prevents the volatilization of cathode material, thereby improving performance and lifetime of the ion implantation apparatus. Gas mixtures according to the disclosure also result in a significant Ge+ current gain and W+ peak reduction during an ion implantation procedure.
    Type: Grant
    Filed: March 15, 2019
    Date of Patent: April 12, 2022
    Assignee: ENTEGRIS, INC.
    Inventors: Oleg Byl, Ying Tang, Joseph R. Despres, Joseph Sweeney, Sharad N. Yedave
  • Publication number: 20220108863
    Abstract: Described are ion implantation devices, systems, and methods, and in particular to an ion source that is useful for generating an aluminum ion beam.
    Type: Application
    Filed: October 1, 2021
    Publication date: April 7, 2022
    Inventors: Ying TANG, Joe R. DESPRES, Joseph D. SWEENEY, Oleg BYL, Barry Lewis CHAMBERS
  • Publication number: 20220044908
    Abstract: Compositions, methods, and apparatus are described for carrying out nitrogen ion implantation, which avoid the incidence of severe glitching when the nitrogen ion implantation is followed by another ion implantation operation susceptible to glitching, e.g., implantation of arsenic and/or phosphorus ionic species. The nitrogen ion implantation operation is advantageously conducted with a nitrogen ion implantation composition introduced to or formed in the ion source chamber of the ion implantation system, wherein the nitrogen ion implantation composition includes nitrogen (N2) dopant gas and a glitching-suppressing gas including one or more selected from the group consisting of NF3, N2F4, F2, SiF4, WF6, PF3, PF5, AsF3, AsF5, CF4 and other fluorinated hydrocarbons of CxFy (x?1, y?1) general formula, SF6, HF, COF2, OF2, BF3, B2F4, GeF4, XeF2, O2, N2O, NO, NO2, N2O4, and O3, and optionally hydrogen-containing gas, e.g.
    Type: Application
    Filed: August 25, 2021
    Publication date: February 10, 2022
    Inventors: Barry Lewis CHAMBERS, Biin-Tsair TIEN, Oleg BYL, Ying TANG, Joseph D. SWEENEY, Steven E. BISHOP, Sharad N. YEDAVE
  • Publication number: 20210398773
    Abstract: A system and method for ion implantation is described, which includes a gas or gas mixture including at least one ionizable gas used to generate ionic species and an arc chamber that includes two or more different arc chamber materials. Using the system ionic species are generated in the arc chamber with liner combination, and one or more desired ionic species display a higher beam current among the ionic species generated, which is facilitated by use of the different materials. In turn improved implantation of the desired ionic species into a substrate can be achieved. Further, the system can minimize formation of metal deposits during system operation, thereby extending source life and promoting improved system performance.
    Type: Application
    Filed: September 3, 2021
    Publication date: December 23, 2021
    Inventors: Ying TANG, Sharad N. YEDAVE, Joseph R. DESPRES, Joseph D. SWEENEY, Oleg BYL
  • Publication number: 20210370259
    Abstract: Adsorbents of varying types and forms are described, as usefully employed in gas supply packages that include a gas storage and dispensing vessel holding such adsorbent for storage of sorbate gas thereon, and a gas dispensing assembly secured to the vessel for discharging the sorbate gas from the gas supply package under dispensing conditions thereof. Corresponding gas supply packages are likewise described, and various methods of processing the adsorbent, and manufacturing the gas supply packages.
    Type: Application
    Filed: August 10, 2021
    Publication date: December 2, 2021
    Inventors: Lawrence H. Dubois, Donald J. Carruthers, Melissa A. Petruska, Edward A. Sturm, Shaun M. Wilson, Steven M. Lurcott, Bryan C. Hendrix, Joseph D. Sweeney, Michael J. Wodjenski, Oleg Byl, Ying Tang, Joseph R. Despres, Matthew Thomas Marlow, Christopher Scannell, Daniel Elzer, Kavita Murthi
  • Patent number: 11139145
    Abstract: A system and method for ion implantation is described, which includes a gas or gas mixture including at least one ionizable gas used to generate ionic species and an arc chamber that includes two or more different arc chamber materials. Using the system ionic species are generated in the arc chamber with liner combination, and one or more desired ionic species display a higher beam current among the ionic species generated, which is facilitated by use of the different materials. In turn improved implantation of the desired ionic species into a substrate can be achieved. Further, the system can minimize formation of metal deposits during system operation, thereby extending source life and promoting improved system performance.
    Type: Grant
    Filed: June 17, 2020
    Date of Patent: October 5, 2021
    Assignee: Entegris, Inc.
    Inventors: Ying Tang, Sharad N. Yedave, Joseph R. Despres, Joseph D. Sweeney, Oleg Byl