Patents by Inventor Oleh Petro Karpenko

Oleh Petro Karpenko has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Photovoltaic back contact
    Patent number: 9252302
    Abstract: A method to preparing Cadmium telluride surface before forming metal back contact is disclosed. The method can include removing carbon from Cadmium telluride surface.
    Type: Grant
    Filed: November 5, 2013
    Date of Patent: February 2, 2016
    Assignee: First Solar, Inc.
    Inventors: Pratima V. Addepalli, John S. Deeken, Oleh Petro Karpenko
  • System and method for estimating the short circuit current of a solar device
    Patent number: 9246434
    Abstract: Described herein is a method and system for determining a short-circuit current of a solar device before the solar device is tested in a solar simulator. A solar device includes a substrate layer, a front contact layer, a window/emitter layer, an absorber layer and a back contact. A thickness of the window/emitter layer and an absorption wavelength of the absorber layer are determined. The window/emitter layer thickness and absorber layer absorption wavelength are used with a fitting parameter that corresponds to transmission properties of the substrate and first contact layers in order to determine the solar device's short-circuit current.
    Type: Grant
    Filed: September 12, 2012
    Date of Patent: January 26, 2016
    Assignee: FIRST SOLAR, INC
    Inventors: Arnold Allenic, Oleh Petro Karpenko
  • In-line metrology system
    Patent number: 9123584
    Abstract: A metrology system for gauging and spatially mapping a semiconductor material on a substrate can be used in controlling deposition and thermal activation processes.
    Type: Grant
    Filed: November 5, 2013
    Date of Patent: September 1, 2015
    Assignee: FIRST SOLAR, INC
    Inventors: Arnold Allenic, Stephan Paul George, II, Sreenivas Jayaraman, Oleh Petro Karpenko, Chong Lim
  • IN-LINE METROLOGY SYSTEM
    Publication number: 20140065731
    Abstract: A metrology system for gauging and spatially mapping a semiconductor material on a substrate can be used in controlling deposition and thermal activation processes.
    Type: Application
    Filed: November 5, 2013
    Publication date: March 6, 2014
    Applicant: FIRST SOLAR, INC
    Inventors: Arnold Allenic, Stephan Paul George, II, Sreenivas Jayaraman, Oleh Petro Karpenko, Chong Lim
  • PHOTOVOLTAIC BACK CONTACT
    Publication number: 20140057389
    Abstract: A method to preparing Cadmium telluride surface before forming metal back contact is disclosed. The method can include removing carbon from Cadmium telluride surface.
    Type: Application
    Filed: November 5, 2013
    Publication date: February 27, 2014
    Applicant: First Solar, Inc.
    Inventors: Pratima V. Addepalli, John S. Deeken, Oleh Petro Karpenko
  • SURFACE MEASUREMENT
    Publication number: 20130115720
    Abstract: A method and apparatus for determining grain size of a surface. A light source is directed at the surface. Reflected light from the surface is detected. A peak surface grain wavelength is determined from the reflected light. The peak surface grain wavelength is converted to a grain size. Grain size of a semiconductor surface is used as a feedback input to control a manufacturing process.
    Type: Application
    Filed: November 7, 2011
    Publication date: May 9, 2013
    Inventors: Arnold Allenic, Oleh Petro Karpenko, Erel Milshtein, Ming L. Yu
  • SYSTEM AND METHOD FOR ESTIMATING THE SHORT CIRCUIT CURRENT OF A SOLAR DEVICE
    Publication number: 20130076367
    Abstract: Described herein is a method and system for determining a short-circuit current of a solar device before the solar device is tested in a solar simulator. A solar device includes a substrate layer, a front contact layer, a window/emitter layer, an absorber layer and a back contact. A thickness of the window/emitter layer and an absorption wavelength of the absorber layer are determined. The window/emitter layer thickness and absorber layer absorption wavelength are used with a fitting parameter that corresponds to transmission properties of the substrate and first contact layers in order to determine the solar device's short-circuit current.
    Type: Application
    Filed: September 12, 2012
    Publication date: March 28, 2013
    Applicant: FIRST SOLAR, INC
    Inventors: Arnold Allenic, Oleh Petro Karpenko