Abstract: The present disclosure relates to a method of removing, by an imaging processing device, remanence artifacts from an image (fn) of a sequence of images captured by an infrared imaging device, the method comprising: inpainting a zone of remanence in the image (fn) to generate an inpainted image; generating a remanence measure for at least some pixels in the image (fn) based on the inpainted image; and removing remanence artifacts from at least some pixels of the image (fn) based on a remanence estimation for each of the at least some pixels, each remanence estimation being generated based on the remanence measures of a plurality of the images in the sequence.

Abstract: The present disclosure relates to a method of removing, by an imaging processing device, remanence artifacts from an image (fn) of a sequence of images captured by an infrared imaging device, the method comprising: generating a remanence measure for at least some pixels in the image (fn) based on a difference between the pixels values of the image (fn) and the pixel values a previous image (fn?1) of the sequence; and removing remanence artifacts from at least some pixels of the image (fn) based on a remanence estimation for each of the at least some pixels, each remanence estimation being generated based on the remanence measure and on one or more previous remanence estimations of the at least some pixels and on a model of the exponential decay of the remanence.

Abstract: The present disclosure relates to a method of removing, by an imaging processing device, remanence artifacts from an image (fn) of a sequence of images captured by an infrared imaging device, the method comprising: generating a remanence measure for at least some pixels in the image (fn) based on a difference between the pixels values of the image (fn) and the pixel values a previous image (fn?1) of the sequence; and removing remanence artifacts from at least some pixels of the image (fn) based on a remanence estimation for each of the at least some pixels, each remanence estimation being generated based on the remanence measure and on one or more previous remanence estimations of the at least some pixels and on a model of the exponential decay of the remanence.

Abstract: The present disclosure relates to a method of removing, by an imaging processing device, remanence artifacts from an image (fn) of a sequence of images captured by an infrared imaging device, the method comprising: inpainting a zone of remanence in the image (fn) to generate an inpainted image; generating a remanence measure for at least some pixels in the image (fn) based on the inpainted image; and removing remanence artifacts from at least some pixels of the image (fn) based on a remanence estimation for each of the at least some pixels, each remanence estimation being generated based on the remanence measures of a plurality of the images in the sequence.

Abstract: The invention is a method for estimating a retention time of a particle in a chromatography column, and more particularly in a chromatography column one parameter of which, such as temperature, is modulated. The retention time is estimated on a probabilistic basis by sequentially modelling the transit of the particle in the column. When this stochastic approach is adopted for a set of particles of a given type, it allows a statistical distribution of the retention time in the column to be determined.

Abstract: The invention is a method for estimating a quantity or a concentration of particles using a detector disposed at the exit of a chromatography column. The estimation is carried out on the basis of a selection of a plurality of retention times within the histogram, each retention time being associated with an individual particle. The method aims to classify each retention time into one or more classes, each class being representative of a species of particles. The method can include an estimation of the number of classes.

Abstract: The invention is a method for estimating a retention time of a particle in a chromatography column, and more particularly in a chromatography column one parameter of which, such as temperature, is modulated. The retention time is estimated on a probabilistic basis by sequentially modelling the transit of the particle in the column. When this stochastic approach is adopted for a set of particles of a given type, it allows a statistical distribution of the retention time in the column to be determined.

Abstract: A method for determining a composition of a gas sample comprising the following steps: running the sample through a processing chain comprising a gas chromatography column and a gas detector arranged at the outlet of the gas chromatography column; obtaining, at the output of the detector, a representative electrical signal of the composition; determining the gas composition by processing this electrical signal. The determination of the composition of the sample is performed on the basis of a combination of a direct probabilistic model of the chromatography column, this model comprising at least one law of probability defining, for at least one gas species liable to be found in the sample, a probability at each moment that a molecule of this gas species is discharged from the chromatography column, and an impulse response model of the detector. It is performed by inverting this combination of models using the electrical signal.