Patents by Inventor Pandu Devarakota

Pandu Devarakota has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 8346684
    Abstract: For assigning a test pattern to a class chosen from a predefined set of classes, the class membership probability for the test pattern is calculated as well as the confidence interval for the class membership probability based upon a number of training patterns in a neighborhood of the test pattern in the feature space. The number of training patterns in the neighborhood of the test pattern is obtained from computing a convolution of a density function of the training patterns with a Gaussian smoothing function centered on the test pattern, where the density function of the training patterns is represented as a mixture of Gaussian functions. The convolution of the smoothing function and the mixture of Gaussian functions can be expressed analytically.
    Type: Grant
    Filed: July 17, 2007
    Date of Patent: January 1, 2013
    Assignee: IEE International Electronics & Engineering S.A.
    Inventors: Bruno Mirbach, Pandu Devarakota
  • Publication number: 20090319451
    Abstract: For assigning a test pattern to a class chosen from a predefined set of classes, the class membership probability for the test pattern is calculated as well as the confidence interval for the class membership probability based upon a number of training patterns in a neighbourhood of the test pattern in the feature space. The number of training patterns in the neighbourhood of the test pattern is obtained from computing a convolution of a density function of the training patterns with a Gaussian smoothing function centred on the test pattern, where the density function of the training patterns is represented as a mixture of Gaussian functions. The convolution of the smoothing function and the mixture of Gaussian functions can be expressed analytically.
    Type: Application
    Filed: July 17, 2007
    Publication date: December 24, 2009
    Applicant: IEE INTERNATIONAL ELECTRONICS & ENGINEERING S.A.
    Inventors: Bruno Mirbach, Pandu Devarakota