Patents by Inventor Pao Meng Lee

Pao Meng Lee has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Three dimensional lead inspection system
    Patent number: 6567161
    Abstract: A semiconductor device lead inspection apparatus and method are provided for capturing images of the semiconductor edges and leads along two optical axes which have different directions in a plane perpendicular to the semiconductor device edge. One image is a direct backlit image of the device. A second image taken along a direction corresponding to a second optical axis is reflected into a direction corresponding to the first optical axis. By forming two images it is possible to locate the leads of the semiconductor device in three dimensions.
    Type: Grant
    Filed: November 28, 2000
    Date of Patent: May 20, 2003
    Assignee: ASTI Holdings Limited
    Inventor: Pao Meng Lee
  • Three dimensional lead inspection system
    Patent number: 6445518
    Abstract: A semiconductor device lead inspection apparatus and method are provided for capturing images of the semiconductor edges and leads along two optical axes which have different directions in a plane perpendicular to the semiconductor device edge. A first image is reflected off an optical surface of a prism to a direction corresponding to the camera optical axis. A second image is reflected by two optical surfaces of the prism to a direction corresponding to the camera optical axis.
    Type: Grant
    Filed: November 28, 2000
    Date of Patent: September 3, 2002
    Assignee: Semiconductor Technologies & Instruments, Inc.
    Inventor: Pao Meng Lee