Patents by Inventor Pascal SANDREZ

Pascal SANDREZ has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20240080035
    Abstract: A sigma-delta ADC comprising: a first-input-resistor connected in series between a first-input-terminal and a first-feedback-node; a second-input-resistor connected in series between a second-input-terminal and a second-feedback-node; a third-input-resistor connected in series between a third-input-terminal and a third-feedback-node; a first-multiplexer-switch connected in series between the first-feedback-node and a first-amplifier-second-input-terminal; a second-multiplexer-switch connected in series between the second-feedback-node and a first-amplifier-first-input-terminal; a third-multiplexer-switch connected in series between the third-feedback-node and the first-amplifier-second-input-terminal; a first-feedback-current-source having a first terminal and second terminal, wherein the second terminal is connected to a reference-terminal; a second-feedback-current-source having a first terminal and second terminal, wherein the second terminal is connected to the reference-terminal; a first-feedback-selecti
    Type: Application
    Filed: August 24, 2023
    Publication date: March 7, 2024
    Inventors: Thierry Dominique Yves Cassagnes, Francesco d'Esposito, Pascal Sandrez, Olivier Tico, Simon Brule
  • Patent number: 11509326
    Abstract: A sigma-delta ADC comprising: a first-input-terminal configured to receive a first-high-voltage-analogue-input-signal; a second-input-terminal configured to receive a second-high-voltage-analogue-input-signal; an output-terminal configured to provide an output-digital-signal, wherein the output-digital-signal is representative of the difference between the first-high-voltage-analogue-input-signal and the second-high-voltage-analogue-input-signal. The sigma-delta ADC also includes a feedback-current-block, which comprises: a first-feedback-transistor having a conduction channel; a second-feedback-transistor having a conduction channel; a first-feedback-switch; a second-feedback-switch; a first-feedback-current-source; and a second-feedback-current-source.
    Type: Grant
    Filed: May 17, 2021
    Date of Patent: November 22, 2022
    Assignee: NXP USA, Inc.
    Inventors: Simon Brule, Thierry Dominique Yves Cassagnes, Pascal Sandrez, Soufiane Serser
  • Publication number: 20210399738
    Abstract: A sigma-delta ADC comprising: a first-input-terminal configured to receive a first-high-voltage-analogue-input-signal; a second-input-terminal configured to receive a second-high-voltage-analogue-input-signal; an output-terminal configured to provide an output-digital-signal, wherein the output-digital-signal is representative of the difference between the first-high-voltage-analogue-input-signal and the second-high-voltage-analogue-input-signal. The sigma-delta ADC also includes a feedback-current-block, which comprises: a first-feedback-transistor having a conduction channel; a second-feedback-transistor having a conduction channel; a first-feedback-switch; a second-feedback-switch; a first-feedback-current-source; and a second-feedback-current-source.
    Type: Application
    Filed: May 17, 2021
    Publication date: December 23, 2021
    Inventors: Simon Brule, Thierry Dominique Yves Cassagnes, Pascal Sandrez, Soufiane Serser
  • Patent number: 10539609
    Abstract: A method comprising: recording test code defined in a high-level test specification language; and automated analysis of the test code defined in the high-level test specification language before a conversion of the high-level test specification language to a low-level test implementation language configured to enable testing of a target by a test module.
    Type: Grant
    Filed: May 8, 2015
    Date of Patent: January 21, 2020
    Assignee: NXP USA, Inc.
    Inventors: Arthur Freitas, Cedric Fau, Cedric Labouesse, Philippe Soleil, Pascal Sandrez
  • Patent number: 10496114
    Abstract: A detector (110) detects an unwanted oscillation generated by a closed-loop system (112) due to disconnection, improper usage, or absence of a stability-controlling element (104) necessary for the closed-loop system to function properly. An integrated circuit (102) includes the closed-loop system, the detector, and a supervisory system (114) that disables the closed-loop system upon disconnection of the stability-controlling element from the closed-loop system.
    Type: Grant
    Filed: August 13, 2018
    Date of Patent: December 3, 2019
    Assignee: NXP USA, Inc.
    Inventors: Guillaume Mouret, Matthew Bacchi, Pascal Sandrez, Alexis Nathanael Huot-Marchand
  • Publication number: 20190109562
    Abstract: A detector (110) detects an unwanted oscillation generated by a closed-loop system (112) due to disconnection, improper usage, or absence of a stability-controlling element (104) necessary for the closed-loop system to function properly. An integrated circuit (102) includes the closed-loop system, the detector, and a supervisory system (114) that disables the closed-loop system upon disconnection of the stability-controlling element from the closed-loop system.
    Type: Application
    Filed: August 13, 2018
    Publication date: April 11, 2019
    Inventors: Guillaume MOURET, Matthew BACCHI, Pascal SANDREZ, Alexis Nathanael HOUT-MARCHAND
  • Patent number: 9654000
    Abstract: A buck converter has an output node and a ground node, wherein a load is connected between the output node and the ground node and is arranged to drive an output current I_out through the output node, generating an output voltage V_out. A current control unit arranged to control the output current I_out in dependence on a control voltage V_ctl provided at a control node; and a voltage control unit arranged to provide the control voltage V_ctl. The voltage control unit comprises: an integrator unit arranged to control the control voltage V_ctl in dependence on a time integral of a difference between the output voltage and the reference voltage; at least one of an overshoot detector arranged to detect an overshoot of the output voltage V_out, and an undershoot detector arranged to detect an undershoot of the output voltage V_out.
    Type: Grant
    Filed: June 18, 2013
    Date of Patent: May 16, 2017
    Assignee: NXP USA, Inc.
    Inventors: Pascal Sandrez, Philippe Goyhenetche
  • Publication number: 20160161544
    Abstract: A method comprising: recording test code defined in a high-level test specification language; and automated analysis of the test code defined in the high-level test specification language before a conversion of the high-level test specification language to a low-level test implementation language configured to enable testing of a target by a test module.
    Type: Application
    Filed: May 8, 2015
    Publication date: June 9, 2016
    Applicant: FREESCALE SEMICONDUCTOR, INC.
    Inventors: ARTHUR FREITAS, CEDRIC FAU, CEDRIC LABOUESSE, PHILIPPE SOLEIL, PASCAL SANDREZ
  • Publication number: 20160126841
    Abstract: A buck converter has an output node and a ground node, wherein a load is connected between the output node and the ground node and is arranged to drive an output current I_out through the output node, generating an output voltage V_out. A current control unit arranged to control the output current I_out in dependence on a control voltage V_ctl provided at a control node; and a voltage control unit arranged to provide the control voltage V_ctl. The voltage control unit comprises: an integrator unit arranged to control the control voltage V_ctl in dependence on a time integral of a difference between the output voltage and the reference voltage; at least one of an overshoot detector arranged to detect an overshoot of the output voltage V_out, and an undershoot detector arranged to detect an undershoot of the output voltage V_out.
    Type: Application
    Filed: June 18, 2013
    Publication date: May 5, 2016
    Applicant: Freescale Semiconductor, Inc.
    Inventors: Pascal SANDREZ, Philippe GOYHENETCHE