Patents by Inventor Pascal Silberzan

Pascal Silberzan has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Atomic force microscope
    Patent number: 6862923
    Abstract: This atomic force microscope has a probe for surface analysis of a sample (E), comprising a support body and an elastically deformable strip linked to the body, the strip being provided with a tip designed to come into contact with the sample (E) to be analysed. The microscope also has a mechanism for relative displacement of the analysis probe with respect to the surface of the sample (E), a detector for determining the position of the strip, and elements for vibrating the strip. These means for vibrating the strip include elements for conduction of electricity along a continuous path forming a loop, an alternating-current generator, and a magnetic-field source designed to set up a magnetic field ({right arrow over (B)}) in the region of the strip of the analysis probe.
    Type: Grant
    Filed: March 30, 2001
    Date of Patent: March 8, 2005
    Assignee: Centre National de la Recherche Scientifique (C.N.R.S.)
    Inventors: Axel Buguin, Pascal Silberzan
  • Atomic force microscope
    Publication number: 20030167830
    Abstract: This atomic force microscope has a probe for surface analysis of a sample (E), comprising a support body and an elastically deformable strip linked to the body, the strip being provided with a tip designed to come into contact with the sample (E) to be analysed. The microscope also has a mechanism for relative displacement of the analysis probe with respect to the surface of the sample (E), a detector for determining the position of the strip, and elements for vibrating the strip. These means for vibrating the strip include elements for conduction of electricity along a continuous path forming a loop, an alternating-current generator, and a magnetic-field source designed to set up a magnetic field ({right arrow over (B)}) in the region of the strip of the analysis probe.
    Type: Application
    Filed: April 2, 2003
    Publication date: September 11, 2003
    Inventors: Axel Buguin, Pascal Silberzan