Abstract: A method for determining a value representative of the remaining useful life, RUL, of a capacitor, the method comprising the following operations: repeating for several iterations 1 to k, k being an integer greater than 1: acquiring environment measurements that are representative of the environment of the capacitor at a current iteration; based on previous environment measurements acquired at previous iterations 1 to k?1 before the current iteration, and on the received environment measurements at iteration k, calculating at least one aging model; based on the at least one calculated aging model, determining the value representative of the RUL of the capacitor.

Abstract: A method for determining a value representative of the remaining useful life, RUL, of a capacitor, the method comprising the following operations: repeating for several iterations 1 to k, k being an integer greater than 1: acquiring (304) environment measurements that are representative of the environment of the capacitor at a current iteration; based on previous environment measurements acquired at previous iterations 1 to k-1 before the current iteration, and on the received environment measurements at iteration k, calculating at least one aging model; based on the at least one calculated aging model, determining the value representative of the RUL of the capacitor

Abstract: A method for determining the maximum time when a capacitor should be replaced before failure is provided. The method includes obtaining a first group of data relative to the capacitor, the first group of data comprising at least the value of the capacitance of the capacitor and the value of the equivalent series resistance of the capacitor, providing an ageing law for at least the capacitance, an ageing law predicting the evolution with time of a data, computing the remaining lifetime of the capacitor, based on the obtained first group of data, on each provided ageing law and on a lifetime criterion, and determining the maximum time when the capacitor should be replaced before failure, based on the computed remaining lifetime of the capacitor. A device and apparatus are also provided.

Abstract: A method and device for predicting defects of a capacitor, the method including determining the ripple voltage (Udc), the temperature (TP), and the current (Ic) of the capacitor, determining the value of an equivalent series resistance (ESR) of the capacitor, and the capacitance value (C) of the capacitor using a digital filter, determining information representative of the state of aging of the capacitor according to the temperature of the capacitor, and displaying that information and information representative of the value of the capacitance (C) and/or information representative of a cause associated with the state of aging according to the capacitance value. The device may include a converter and an uninterruptible power supply.

Abstract: A method for predicting defects of at least one capacitor comprising: determining the ripple voltage, the temperature, and the current of the capacitor, determining the value of an equivalent series resistance of the capacitor and the capacitance value of the capacitor by means of a digital filter, determining an item of information representative of the state of ageing of the capacitor according to the temperature of the capacitor, and displaying said information and information representative of the value of the capacitance or/and information representative of at least one cause associated with the state of ageing according to the capacitance value. A device for predicting defects of at least one capacitor to implement the method. A converter and uninterruptible power supply comprising the device.