Patents by Inventor Patricia Galindo

Patricia Galindo has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 7121133
    Abstract: A glide head calibration technique uses two fly height calibrations on a disk media certifier. The first calibration point uses a spin down on bump technique at a first height, and the second calibration point uses a spin down on disk media roughness at a second lower height. With two height data points, a fly height curve of each glide head is approximated very accurately. Once the fly height curve is derived for each head, any fly height can be dialed-in by the disk media certifier for glide testing. This technique achieves glide fly heights between about 4 nm and 8 nm and does so with improved tolerances.
    Type: Grant
    Filed: May 28, 2004
    Date of Patent: October 17, 2006
    Assignee: Hitachi Global Storage Technologies Netherlands B.V.
    Inventors: Norman Chu, Shanlin Duan, Patricia Galindo, Hang Fai Ngo, Yu Lo, Nalin Zhou
  • Patent number: 7064659
    Abstract: A method is presented for glide testing a disk which tests the glide head fly-height by inducing a collision between the glide head and a disk under test. The glide test system is initially calibrated using calibration disks. The method of the invention periodically tests the calibration without interrupting the production testing by lowering the rotation rate until the glide head collides with the rotating disk surface. The rotation rate at which the collision occurs is then compared with the value expected based on knowledge of disk samples and the initial calibration. Parameters for acceptable high and low values are established to detect changes in the glide test system performance to trigger automatic or manual recalibration.
    Type: Grant
    Filed: August 31, 2004
    Date of Patent: June 20, 2006
    Assignee: Hitachi Global Storage Technologies Netherlands B.V.
    Inventors: Bradley Frederick Baumgartner, Norman Chu, Patricia Galindo, Hang Fai Ngo, Yu Lo, Nalin Zhou
  • Publication number: 20060042073
    Abstract: A method is presented for glide testing a disk which tests the glide head fly-height by inducing a collision between the glide head and a disk under test. The glide test system is initially calibrated using calibration disks. The method of the invention periodically tests the calibration without interrupting the production testing by lowering the rotation rate until glide head collides with the rotating disk surface. The rotation rate at which the collision occurs is then compared with the value expected based on knowledge of disk samples and the initial calibration. Parameters for acceptable high and low values are established to detect changes in the glide test system performance to trigger automatic or manual recalibration.
    Type: Application
    Filed: August 31, 2004
    Publication date: March 2, 2006
    Inventors: Bradley Baumgartner, Norman Chu, Patricia Galindo, Hang Ngo, Yu Lo, Nalin Zhou
  • Publication number: 20050262922
    Abstract: A glide head calibration technique uses two fly height calibrations on a disk media certifier. The first calibration point uses a spin down on bump technique at a first height, and the second calibration point uses a spin down on disk media roughness at a second lower height. With two height data points, a fly height curve of each glide head is approximated very accurately. Once the fly height curve is derived for each head, any fly height can be dialed-in by the disk media certifier for glide testing. This technique achieves glide fly heights between about 4 nm and 8 nm and does so with improved tolerances.
    Type: Application
    Filed: May 28, 2004
    Publication date: December 1, 2005
    Inventors: Norman Chu, Shanlin Duan, Patricia Galindo, Hang Ngo, Yu Lo, Nalin Zhou
  • Patent number: 6771453
    Abstract: A calibration method for determining the flying height of a glide slider for disk glide height testing is disclosed. The method utilizes a disk with bumps in situ on a disk glide height tester. The method automatically takes into account disk topography, mounting tolerances, and slider roll.
    Type: Grant
    Filed: November 5, 2001
    Date of Patent: August 3, 2004
    Assignee: Hitachi Global Storage Technologies Netherlands B.V.
    Inventors: Bradley Frederick Baumgartner, An-Chou Andrew Chen, Norman H. Chu, Shanlin Duan, Patricia Galindo, Roger Yu Lo, Connie H. Moy, Hang Fai Ngo
  • Publication number: 20030086197
    Abstract: A calibration method for determining the flying height of a glide slider for disk glide height testing is disclosed. The method utilizes a disk with bumps in situ on a disk glide height tester. The method automatically takes into account disk topography, mounting tolerances, and slider roll.
    Type: Application
    Filed: November 5, 2001
    Publication date: May 8, 2003
    Inventors: Bradley Frederick Baumgartner, An-Chou Andrew Chen, Norman H. Chu, Shanlin Duan, Patricia Galindo, Roger Yu Lo, Connie H. Moy, Hang Fai Ngo