Abstract: A polyalkyleneoxy polyol (P) has an average nominal functionality in the range of 2 to 8; a hydroxy number in the range of 10 to 500 mg KOH/g measured according to ASTM method D4272; and a weight average molecular weight in the range of 500 to 25,000 measured using GPC with polystyrene standard and tetrahydrofuran as solvent. The polyol (P) contains ethyleneoxy in an amount in the range of 50 to 95 wt. %, based on the overall weight of the polyol (P).

Abstract: An inspection system includes a controller including one or more processors configured to execute program instructions. The program instructions cause the one or more processors to receive at least a first portion of a first set of repeat swaths of a first scan path of a sample. The program instructions cause the one or more processors to generate an image by averaging the first portion of the first set of repeat swaths. Averaging the first portion of the first set of repeat swaths reduces a noise in the image. The program instructions cause the one or more processors to detect one or more defects in an inspection region of the sample using the image.

Abstract: A system may be configured for joint defect discovery and optical mode selection. Defects are detected during a defect discovery step. The discovered defects are accumulated into a mode selection dataset. The mode selection dataset is used to perform mode selection to determine a mode combination. The mode combination may then be used to train the defect detection model. Additional defects may then be detected by the defect detection model. The additional defects may then be provided to the mode selection dataset, for further performing mode selection and training the defect detection model. One or more run-time modes may then be determined. The system may be configured for mode selection and defect detection at an image pixel level.

Abstract: A system includes a processing unit communicatively coupled to a detector array of an optical wafer characterization system. The processing unit is configured to perform one or more steps of a method or process including the steps of acquiring one or more target images of a target location on a wafer from the detector array, applying a de-noising filter to at least the one or more target images, determining one or more difference images from one or more reference images and the one or more target images, and up-sampling the one or more difference images to generate one or more up-sampled images. One or more wafer defects are detectable in the one or more difference images or the up-sampled images.

Abstract: Methods, systems, and apparatus, including computer programs encoded on computer storage media, for dynamically injecting secrets in a pipeline integration system. One of the methods includes receiving, by a pipeline controller, a job identifying a pipeline for executing a plurality of tasks. A preparatory task is invoked for the pipeline that obtains one or more original task definitions for the identified pipeline and generates one or more modified task definitions for the pipeline, wherein each modified task definition references one or more variablized secret names specified as the value of the reserved variable of the one or more configuration files. One or more subsequent execution tasks are invoked using each respective modified task definition. One or more retrieved secrets are injected into an execution environment for each particular execution task.

Abstract: A system may be configured for joint defect discovery and optical mode selection. Defects are detected during a defect discovery step. The discovered defects are accumulated into a mode selection dataset. The mode selection dataset is used to perform mode selection to determine a mode combination. The mode combination may then be used to train the defect detection model. Additional defects may then be detected by the defect detection model. The additional defects may then be provided to the mode selection dataset, for further performing mode selection and training the defect detection model. One or more run-time modes may then be determined. The system may be configured for mode selection and defect detection at an image pixel level.

Abstract: Methods, systems, and apparatus, including computer programs encoded on computer storage media, for dynamically injecting secrets in a pipeline integration system. One of the methods includes receiving, by a pipeline controller, a job identifying a pipeline for executing a plurality of tasks. A preparatory task is invoked for the pipeline that obtains one or more original task definitions for the identified pipeline and generates one or more modified task definitions for the pipeline, wherein each modified task definition references one or more variablized secret names specified as the value of the reserved variable of the one or more configuration files. One or more subsequent execution tasks are invoked using each respective modified task definition. One or more retrieved secrets are injected into an execution environment for each particular execution task.

Abstract: A fluid-sampling system that includes a downhole tool string with a fluid-sampling tool coupled thereto, and a fluid sampling probe coupled to the tool via a probe extension arm, the fluid sampling probe having an oval pad that contacts a borehole wall, one or more fluid inlets which receive a formation fluid, and a plurality of screens between the borehole wall and the one or more fluid inlets which filter the formation fluid. The fluid-sampling system further including one or more offset arms coupled to the tool which contact the borehole wall.

Abstract: There is disclosed a conduit inspection apparatus of a type adapted to be located within and transported along a conduit such as a duct, and a method of inspecting a conduit. In one embodiment, the conduit inspection apparatus (10) comprises a body (18) adapted for location within a conduit such as a duct (14), a centralisation assembly (16) for centralising the body (18) within the duct (14), a transportation assembly (20) for transporting the body (18) along the duct (14), and a data coupling (24) for data communication between the body (18) and a control station (22). In a preferred embodiment, the apparatus (10) includes a fluid applicator (78a) for supplying a fluid to a surface of the duct (14), the fluid applicator (78a) including a rotary member in the form of an atomiser (166) for imparting a force on the fluid to direct the fluid towards a surface of the duct (14).