Abstract: A field effect transistor (FET) engager, for example, includes electrically coupling a gate driver to a gate of a FET for testing the FET. The FET engager further includes providing a probe pad for test instrument measurement of the FET without test instrument capacitance impacting operation of the FET. The FET engager can electrically couple to the gate of the FET hold the gate of the FET at a low voltage while the source and drains are stress tested. The FET engager provides fail-safe mechanisms against accidental turn-on of the FET during operation. The FET engager can provide a second probe pad for selective test instrument turn-on of a second FET. The FET engager can allow test instrument measurement of gate current of the FET without test instrument capacitance impacting operation of the FET.

Abstract: A field effect transistor (FET) engager, for example, includes electrically coupling a gate driver to a gate of a FET for testing the FET. The FET engager further includes providing a probe pad for test instrument measurement of the FET without test instrument capacitance impacting operation of the FET. The FET engager can electrically couple to the gate of the FET hold the gate of the FET at a low voltage while the source and drains are stress tested. The FET engager provides fail-safe mechanisms against accidental turn-on of the FET during operation. The FET engager can provide a second probe pad for selective test instrument turn-on of a second FET. The FET engager can allow test instrument measurement of gate current of the FET without test instrument capacitance impacting operation of the FET.

Abstract: A testing system includes: a substrate having a probe pad and having a supply input; driver circuitry having a driver output; a transistor having a gate, a source, and a drain; and a field effect transistor (FET) engager. The gate of the transistor is coupled to the driver output, and the drain of the transistor is coupled to the supply input. The FET engager is configured to couple the probe pad to the gate of the transistor and provide test instrument measurement of gate current of the transistor without test instrument probe capacitance impacting operation of the transistor.

Abstract: A field effect transistor (FET) engager, for example, includes electrically coupling a gate driver to a gate of a FET for testing the FET. The FET engager further includes providing a probe pad for test instrument measurement of the FET without test instrument capacitance impacting operation of the FET. The FET engager can electrically couple to the gate of the FET hold the gate of the FET at a low voltage while the source and drains are stress tested. The FET engager provides fail-safe mechanisms against accidental turn-on of the FET during operation. The FET engager can provide a second probe pad for selective test instrument turn-on of a second FET. The FET engager can allow test instrument measurement of gate current of the FET without test instrument capacitance impacting operation of the FET.

Abstract: A field effect transistor (FET) engager, for example, includes electrically coupling a gate driver to a gate of a FET for testing the FET. The FET engager further includes providing a probe pad for test instrument measurement of the FET without test instrument capacitance impacting operation of the FET. The FET engager can electrically couple to the gate of the FET hold the gate of the FET at a low voltage while the source and drains are stress tested. The FET engager provides fail-safe mechanisms against accidental turn-on of the FET during operation. The FET engager can provide a second probe pad for selective test instrument turn-on of a second FET. The FET engager can allow test instrument measurement of gate current of the FET without test instrument capacitance impacting operation of the FET.

Abstract: A field effect transistor (FET) engager, for example, includes electrically coupling a gate driver to a gate of a FET for testing the FET. The FET engager further includes providing a probe pad for test instrument measurement of the FET without test instrument capacitance impacting operation of the FET. The FET engager can electrically couple to the gate of the FET hold the gate of the FET at a low voltage while the source and drains are stress tested. The FET engager provides fail-safe mechanisms against accidental turn-on of the FET during operation. The FET engager can provide a second probe pad for selective test instrument turn-on of a second FET. The FET engager can allow test instrument measurement of gate current of the FET without test instrument capacitance impacting operation of the FET.

Abstract: A circuit includes a comparator that monitors a transient with respect to a predetermined threshold at the output of a voltage regulator and generates a compensation signal if the transient exceeds the predetermined threshold. A dynamic current pull-down block is triggered from the compensation signal of the comparator and operative with an output stage of the voltage regulator to mitigate the transient at the output of the voltage regulator by concurrently activating a plurality of current pull-down switches during the transient and sequentially deactivating each current pull-down switch of the plurality of current pull-down switches after its predetermined deactivation delay for each current pull-down switch.

Abstract: In response to a first reference voltage, a regulator regulates an output voltage of a line, so that the output voltage is approximately equal to a target voltage. In response to the output voltage rising above a second reference voltage, pull down circuitry draws current from the line. In response to the output voltage falling below the second reference voltage by at least a predetermined amount, the pull down circuitry ceases to draw current from the line. The first and second reference voltages are based upon a same band gap reference as one another.

Abstract: In response to a first reference voltage, a regulator regulates an output voltage of a line, so that the output voltage is approximately equal to a target voltage. In response to the output voltage rising above a second reference voltage, pull down circuitry draws current from the line. In response to the output voltage falling below the second reference voltage by at least a predetermined amount, the pull down circuitry ceases to draw current from the line. The first and second reference voltages are based upon a same band gap reference as one another.

Abstract: A circuit includes a comparator that monitors a transient with respect to a predetermined threshold at the output of a voltage regulator and generates a compensation signal if the transient exceeds the predetermined threshold. A dynamic current pull-down block is triggered from the compensation signal of the comparator and operative with an output stage of the voltage regulator to mitigate the transient at the output of the voltage regulator by concurrently activating a plurality of current pull-down switches during the transient and sequentially deactivating each current pull-down switch of the plurality of current pull-down switches after its predetermined deactivation delay for each current pull-down switch.

Abstract: An apparatus for providing a read signal at an output locus for access by an information processing device receives an input signal containing the information; the apparatus includes: (a) a read signal control unit receiving the input signal at a control unit input locus; the control unit is coupled with the output locus and controls the read signal; (b) a plurality of switches; and (c) a plurality of bias arrays coupled with the switches. A first bias array set cooperates with the plurality of switches in a first orientation to couple the first bias array set with the control unit to establish a first operational mode. A second bias array set cooperates with the plurality of switches in a second orientation to couple the second bias array set with the control unit to establish a second operational mode.

Abstract: An apparatus for providing a read signal at an output locus for access by an information processing device receives an input signal containing the information; the apparatus includes: (a) a read signal control unit receiving the input signal at a control unit input locus; the control unit is coupled with the output locus and controls the read signal; (b) a plurality of switches; and (c) a plurality of bias arrays coupled with the switches. A first bias array set cooperates with the plurality of switches in a first orientation to couple the first bias array set with the control unit to establish a first operational mode. A second bias array set cooperates with the plurality of switches in a second orientation to couple the second bias array set with the control unit to establish a second operational mode.

Abstract: A system and method are disclosed to help protect a node of associated circuitry from overshooting or undershooting, such as can be associated with power up or other transitional modes. The protection is implemented by diode connecting a transistor, which has its base electrically coupled to the node during the transitional mode. Either after a predetermined time period or after the voltage at the node has reached a desired level, the diode connection can be removed to permit normal operation to begin in which a bias can be provided to the node.

Abstract: A system and method are disclosed to help protect a node of associated circuitry from overshooting or undershooting, such as can be associated with power up or other transitional modes. The protection is implemented by diode connecting a transistor, which has its base electrically coupled to the node during the transitional mode. Either after a predetermined time period or after the voltage at the node has reached a desired level, the diode connection can be removed to permit normal operation to begin in which a bias can be provided to the node.