Abstract: A device for the collection of X-rays includes at least one multi-reflection reflector cone. The multi-reflection reflector cone has a focal axis. A first portion of the multi-reflection reflector cone is oriented at a first angle to the focal axis, and a second portion of the multi-reflection reflector cone is oriented at a second angle to the focal axis.

Abstract: A device for the collection of X-rays includes at least one multi-reflection reflector cone. The multi-reflection reflector cone has a focal axis. A first portion of the multi-reflection reflector cone is oriented at a first angle to the focal axis, and a second portion of the multi-reflection reflector cone is oriented at a second angle to the focal axis.

Abstract: In some embodiments, a system for collecting information from a sample includes a sample stage and one or more signal detectors. The sample stage includes a heating element, and the heating element is capable of heating at least a portion of the sample stage to at least 100 Celsius. The one or more signal detectors has a detection material with a silicon nitride window positioned between the detection material and the sample stage.

Abstract: A system for collecting information from a sample, the system includes an X-ray detector configured to mount to an electron microscope, the X-ray detector including a detection tip with a detection material positioned in the detection tip. The detection material includes a compound semiconductor material.

Abstract: In some embodiments, a system for collecting information from a sample includes a sample stage and one or more signal detectors. The sample stage includes a heating element, and the heating element is capable of heating at least a portion of the sample stage to at least 100 Celsius. The one or more signal detectors has a detection material with a silicon nitride window positioned between the detection material and the sample stage.

Abstract: A system for collecting information from a sample, the system includes an X-ray detector configured to mount to an electron microscope, the X-ray detector including a detection tip with a detection material positioned in the detection tip. The detection material includes a compound semiconductor material.

Abstract: A diffraction pattern is averaged with adjacent diffraction patterns to increase a signal to noise ratio thereof and improve indexing accuracy. The pixels of a diffraction pattern image are averaged with a correlated pixel from one or more adjacent diffraction patterns. Noise artifacts are reduced in intensity, while signals present in each of the patterns reinforce one another to produce an averaged diffraction pattern which is then indexed.

Abstract: A diffraction pattern is averaged with adjacent diffraction patterns to increase a signal to noise ratio thereof and improve indexing accuracy. The pixels of a diffraction pattern image are averaged with a correlated pixel from one or more adjacent diffraction patterns. Noise artifacts are reduced in intensity, while signals present in each of the patterns reinforce one another to produce an averaged diffraction pattern which is then indexed.

Abstract: The present inventions are related to systems and methods for determining characteristics of a material. The characteristics may include, but are not limited to, crystallographic texture.

Abstract: An X-ray spectroscope collects an energy-dispersive spectrum from a sample under analysis, and generates a list of candidate elements that may be present in the sample. A wavelength dispersive spectral collector is then tuned to obtain X-ray intensity measurements at the energies/wavelengths of some or all of the candidate elements, thereby verifying whether or not these candidate elements are in fact present in the sample. Additionally, the alignment of the wavelength dispersive spectral collector versus the sample can be optimized by tuning the wavelength dispersive spectral collector to the energy/wavelength of a selected one of the candidate elements—preferably one whose presence in the sample has been verified, or one which has a high likelihood of being present in the sample—and then varying the alignment of the wavelength dispersive spectral collector versus the sample until the wavelength dispersive spectral collector returns the maximum intensity reading for the selected candidate element.

Abstract: In an energy dispersive spectrometer wherein event (particle/photon) detection is performed by counting events spaced by greater than a shaping time, events which are spaced by less than the shaping time are also collected and counted. These “combined events” are treated similarly to “single events” which are spaced by greater than the shaping time, and can be used to generate combined-event spectra for comparison and/or use with the conventional single-event spectra. The combined-event spectra can be compared to the single-event spectra to provide an indication of data quality; can be subtracted from the single-event spectra to remove artifacts, and/or can be deconvolved into a single-event spectrum to increase the resolution of the single-event spectrum.

Abstract: An X-ray spectroscope collects an energy-dispersive spectrum from a sample under analysis, and generates a list of candidate elements that may be present in the sample. A wavelength dispersive spectral collector is then tuned to obtain X-ray intensity measurements at the energies/wavelengths of some or all of the candidate elements, thereby verifying whether or not these candidate elements are in fact present in the sample. Additionally, the alignment of the wavelength dispersive spectral collector versus the sample can be optimized by tuning the wavelength dispersive spectral collector to the energy/wavelength of a selected one of the candidate elements—preferably one whose presence in the sample has been verified, or one which has a high likelihood of being present in the sample—and then varying the alignment of the wavelength dispersive spectral collector versus the sample until the wavelength dispersive spectral collector returns the maximum intensity reading for the selected candidate element.

Abstract: In an energy dispersive spectrometer wherein event (particle/photon) detection is performed by counting events spaced by greater than a shaping time, events which are spaced by less than the shaping time are also collected and counted. These “combined events” are treated similarly to “single events” which are spaced by greater than the shaping time, and can be used to generate combined-event spectra for comparison and/or use with the conventional single-event spectra. The combined-event spectra can be compared to the single-event spectra to provide an indication of data quality; can be subtracted from the single-event spectra to remove artifacts, and/or can be deconvolved into a single-event spectrum to increase the resolution of the single-event spectrum.