Abstract: Relays and toggle switches for programming the electrical interconnections between automated test equipment and the pins of a DUT are replaced with manually programmable jumpers connected between various jumper terminals mounted on a jumper programmable interface board. The jumper terminals are located on the interface board in close proximity to the pins of a DUT to minimize interference and crosstalk. Pulldown and pullup resistors as well as bypass capacitors are optionally incorporated into the jumpers. The jumper terminals provide easy access to pin electronics (PE) test signals and to various power and ground plane in a multilayer interface board so that the test conditions for each pin can be manually programmed by selection of jumper connections.