Patents by Inventor Paul Fenter

Paul Fenter has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Surface topography with X-ray reflection phase-contrast microscopy
    Publication number: 20080181363
    Abstract: A system and method for monitoring a surface or interfacial area. The system and method includes an intense X-ray beam directed to a surface or interface at a low angle to achieve specular reflection with phase contrast associated with an event, such as changing topography, chemistry or magnetic state being detected by a CCD. Upstream or downstream processing can be carried out with the X-ray phase contrast system.
    Type: Application
    Filed: January 25, 2007
    Publication date: July 31, 2008
    Inventors: Paul Fenter, Wenbing Yun