Abstract: A gravity-fed housing for use in a gasification system is disclosed. The gravity-fed housing has a receiving end panel that forms a receive opening in a first plane. The receive opening is configured to receive a first plurality of heat carriers via gravity. The gravity-fed housing includes a siding connected to the receiving end panel. The siding forms a chamber and a discharge opening in a second plane that is parallel to the first plane. The discharge opening is offset with respect to the receive opening such that a line perpendicular to the receiving end panel that extends through a center point of the receive opening does not intersect a center point of the second opening. The siding includes a first panel that comprises a guiding surface that intersects the line and is angled toward the discharge opening.

Abstract: A gravity-fed housing for use in a gasification system is disclosed. The gravity-fed housing has a receiving end panel that forms a receive opening in a first plane. The receive opening is configured to receive a first plurality of heat carriers via gravity. The gravity-fed housing includes a siding connected to the receiving end panel. The siding forms a chamber and a discharge opening in a second plane that is parallel to the first plane. The discharge opening is offset with respect to the receive opening such that a line perpendicular to the receiving end panel that extends through a center point of the receive opening does not intersect a center point of the second opening. The siding includes a first panel that comprises a guiding surface that intersects the line and is angled toward the discharge opening.

Abstract: Fluid transfer device may be configured as a vacuum pump, including blood and blood constituents. Fluid transfer device used for assisting in the pumping of blood through a patient's heart for reducing the load on the patient's heart, sheer forces and blood pressure on the inner walls of the heart are reduced. Pump may be used as an implanted cardiac assist device, such as an aortic assist device, a ventricular assist device, or as a complete artificial heart. By use of a vacuum, the inventive fluid transfer device may be operated at no more than atmospheric pressure. A pre-charged pressure tank may be used dependent on the application requirements, such as in the case where fluid pressure of the pumped fluid, including the backpressure of body fluids, in the case where pressure greater than atmospheric to sufficiently expel pumped fluid.

Abstract: An approach for providing a cleave initiation using a varying ion implant dose is described. In one embodiment, there is a method of forming a substrate. In this embodiment, a semiconductor material is provided and implanted with a spatially varying dose of one or more ion species. A handler substrate is attached to the implanted semiconductor material. A cleave of the implanted semiconductor material is initiated from the handler substrate at a preferential location that is a function of a dose gradient that develops from the spatially varying dose of one or more ion species implanted into the semiconductor material.

Abstract: Fluid transfer device may be configured as a vacuum pump particularly suited for nondestructive transfer of fluids, including blood and blood constituents. Fluid transfer device may be used for assisting in the pumping of blood through a patient's heart for reducing the load on the patient's heart, so that sheer forces are reduced, and blood pressure on the inner walls of the heart is reduced. Pump may be used as an implanted cardiac assist device, such as an aortic assist device, a ventricular assist device, or as a complete artificial heart. Industrial applications include the pumping of fluids, including destructible fluids such as foodstuff with or without food constituents of various sizes within the foodstuff. Food and other fluids may be stored until they are dispensed. By use of a vacuum, the inventive fluid transfer device may be operated at no more than atmospheric pressure.

Abstract: Fluid transfer device configured as a vacuum pump particularly suited for nondestructive transfer of fluids, including blood and blood constituents. Fluid transfer device used for assisting in the pumping of blood through a patient's heart for reducing the load on the heart, reducing forces and blood pressure on the inner walls of the heart is reduced. Examples are aortic assist device, a ventricular assist device, or artificial heart. Industrial applications include the pumping of fluids, including destructible fluids such as foodstuff with or without food constituents of various sizes within the foodstuff. Food and other fluids may be stored until they are dispensed. By use of a vacuum, the device is operated at no more than atmospheric pressure. A pre-charged pressure tank may be used, such as where fluid pressure of the pumped fluid, including backpressure of body fluids, where pressure greater than atmospheric is required to expel pumped fluid.

Abstract: A system for inspecting specimens such as semiconductor wafers is provided. The system provides scanning of dual-sided specimens using a damping arrangement which filters unwanted acoustic and seismic vibration, including an optics arrangement which scans a first portion of the specimen and a translation or rotation arrangement for translating or rotating the specimen to a position where the optics arrangement can scan the remaining portion(s) of the specimen. The system further includes means for stitching the scans together, thereby providing both damping of the specimen and the need for smaller and less expensive optical elements.

Abstract: An approach for providing a cleave initiation using a varying ion implant dose is described. In one embodiment, there is a method of forming a substrate. In this embodiment, a semiconductor material is provided and implanted with a spatially varying dose of one or more ion species. A handler substrate is attached to the implanted semiconductor material.

Abstract: A system for inspecting specimens such as semiconductor wafers is provided. The system provides scanning of dual-sided specimens using a damping arrangement which filters unwanted acoustic and seismic vibration, including an optics arrangement which scans a first portion of the specimen and a translation or rotation arrangement for translating or rotating the specimen to a position where the optics arrangement can scan the remaining portion(s) of the specimen. The system further includes means for stitching the scans together, thereby providing both damping of the specimen and the need for smaller and less expensive optical elements.

Abstract: A system for inspecting specimens such as semiconductor wafers is provided. The system provides scanning of dual-sided specimens using a damping arrangement which filters unwanted acoustic and seismic vibration, including an optics arrangement which scans a first portion of the specimen and a translation or rotation arrangement for translating or rotating the specimen to a position where the optics arrangement can scan the remaining portion(s) of the specimen. The system further includes means for stitching the scans together, thereby providing both damping of the specimen and the need for smaller and less expensive optical elements.

Abstract: An inspection tool embodiment includes an illumination source for directing a light beam onto a workpiece to generate scattered light that includes the ordinary scattering pattern of the workpiece as well as light scattered from defects of the workpiece. The embodiment includes a programmable light selection array that receives light scattered from the workpiece and selectively directs the light scattered from defects onto a photosensor which detects the defect signal. Processing circuitry receives the defect signal and conducts surface analysis of the workpiece that can include the characterizing of defects of the workpiece. The programmable light selection arrays can include, but are not limited to, reflector arrays and filter arrays. The invention also includes associated surface inspection methods.

Abstract: A system for inspecting specimens such as semiconductor wafers is provided. The system provides scanning of dual-sided specimens using a damping arrangement which filters unwanted acoustic and seismic vibration, including an optics arrangement which scans a first portion of the specimen and a translation or rotation arrangement for translating or rotating the specimen to a position where the optics arrangement can scan the remaining portion(s) of the specimen. The system further includes means for stitching the scans together, thereby providing both damping of the specimen and the need for smaller and less expensive optical elements.

Abstract: An inspection tool embodiment includes an illumination source for directing a light beam onto a workpiece to generate scattered light that includes the ordinary scattering pattern of the workpiece as well as light scattered from defects of the workpiece. The embodiment includes a programmable light selection array that receives light scattered from the workpiece and selectively directs the light scattered from defects onto a photosensor which detects the defect signal. Processing circuitry receives the defect signal and conducts surface analysis of the workpiece that can include the characterizing of defects of the workpiece. The programmable light selection arrays can include, but are not limited to, reflector arrays and filter arrays. The invention also includes associated surface inspection methods.

Abstract: A system for inspecting specimens such as semiconductor wafers is provided. The system provides scanning of dual-sided specimens using a damping arrangement which filters unwanted acoustic and seismic vibration, including an optics arrangement which scans a first portion of the specimen and a translation or rotation arrangement for translating or rotating the specimen to a position where the optics arrangement can scan the remaining portion(s) of the specimen. The system further includes means for stitching the scans together, thereby providing both damping of the specimen and the need for smaller and less expensive optical elements.

Abstract: A system for inspecting specimens such as semiconductor wafers is provided. The system provides scanning of dual-sided specimens using a damping arrangement which filters unwanted acoustic and seismic vibration, including an optics arrangement which scans a first portion of the specimen and a translation or rotation arrangement for translating or rotating the specimen to a position where the optics arrangement can scan the remaining portion(s) of the specimen. The system further includes means for stitching the scans together, thereby providing both damping of the specimen and the need for smaller and less expensive optical elements.

Abstract: A system for inspecting specimens such as semiconductor wafers is provided. The system provides scanning of dual-sided specimens using a damping arrangement which filters unwanted acoustic and seismic vibration, including an optics arrangement which scans a first portion of the specimen and a translation or rotation arrangement for translating or rotating the specimen to a position where the optics arrangement can scan the remaining portion(s) of the specimen. The system further includes means for stitching the scans together, thereby providing both damping of the specimen and the need for smaller and less expensive optical elements.

Abstract: A system for inspecting specimens such as semiconductor wafers is provided. The system provides scanning of dual-sided specimens using a damping arrangement which filters unwanted acoustic and seismic vibration, including an optics arrangement which scans a first portion of the specimen and a translation or rotation arrangement for translating or rotating the specimen to a position where the optics arrangement can scan the remaining portion(s) of the specimen. The system further includes means for stitching the scans together, thereby providing both damping of the specimen and the need for smaller and less expensive optical elements.

Abstract: A reciprocal type of pump structure wherein a piston has a linear function actuated by a pair of coils energized alternately and includes a plurality of tapered flutes. A check valve in an outlet of the structure which stretches to open said outlet under the impact of expelled fluids and of its own volition retracts to the closed position immediately upon the cessation of fluids being expelled.

Abstract: A game apparatus is disclosed in which a playing piece such as a ball, puck and the like is adapted to move over or strike a playing surface in turn formed by one of a pair of flexible sheets on which electrical circuitry is disposed. Another sheet having openings at preselected areas is disposed between the flexible sheets so as to normally maintain pairs of contact portions of the circuits in opposed spaced relationship to each other. As a playing piece moves over such preselected areas, its weight causes the first flexible sheet to become downwardly depressed such that a contact pair of circuits is electrically closed and a game event is signalled thereby. The game may be a pinball machine including electronic/microelectric circuitry, as a game processor input subsystem, and an alpha-numeric score-keeping readout and may also include audio and visual signals.