Patents by Inventor Paul Joseph DeAngelo

Paul Joseph DeAngelo has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 8913006
    Abstract: A non-destructive inspection and testing instrument includes a housing and a first panel with a first type input to be assembled onto the housing and a second panel with a different, second type input to be assembled onto the housing. A first GUI module for the first panel implements a function upon an actuation of the first type input. A second GUI module for the second panel implements the same function upon an actuation of the second type input. A controller is configured to select the first GUI module when the first panel is associated with the instrument and to select the second GUI module when the second panel is associated with the instrument.
    Type: Grant
    Filed: February 1, 2012
    Date of Patent: December 16, 2014
    Assignee: Olympus NDT, Inc.
    Inventors: Paul Joseph DeAngelo, Coleman McCourt Flanagan
  • Patent number: 8336365
    Abstract: Disclosed is a method and an NDT/NDI calibration process that automatically detects erroneous TOF readings by providing a predetermined time acceptance window. During the calibration process, TOF readings acquired by a UT device are validated to determine whether the TOF reading for the thin test block falls within the range of the predetermined time acceptance window. If the TOF reading for the thin block (T2) falls out of the predetermined time acceptance window, the operator is alerted of an error and to repeat the TOF test for the thin block.
    Type: Grant
    Filed: March 22, 2011
    Date of Patent: December 25, 2012
    Assignee: Olympus NDT Inc.
    Inventors: Paul Joseph Deangelo, Steven Abe Labreck
  • Publication number: 20120200504
    Abstract: A non-destructive inspection and testing instrument includes a housing and a first panel with a first type input to be assembled onto the housing and a second panel with a different, second type input to be assembled onto the housing. A first GUI module for the first panel implements a function upon an actuation of the first type input. A second GUI module for the second panel implements the same function upon an actuation of the second type input. A controller is configured to select the first GUI module when the first panel is associated with the instrument and to select the second GUI module when the second panel is associated with the instrument.
    Type: Application
    Filed: February 1, 2012
    Publication date: August 9, 2012
    Inventors: Paul Joseph DeANGELO, Coleman McCourt FLANAGAN
  • Patent number: 8174407
    Abstract: Alerting a user of a material inspection device to a change in thickness of a material being inspected is disclosed. A thickness offset is determined from calibration information. The calibration information identifies a time of flight of a pulse through a reference sample similar in composition to a material to be inspected. The thickness offset indicates when a thickness of a material being inspected differs from a thickness of the reference sample. A calibration thickness alarm is set, the calibration thickness alarm corresponding to the thickness offset. A change in thickness of the material being inspected is detected. The calibration thickness alarm is engaged to alert the user of the inspection device of a detected change in thickness of the material being inspected.
    Type: Grant
    Filed: June 3, 2009
    Date of Patent: May 8, 2012
    Assignee: Olympus NDT Inc.
    Inventors: Steven Abe LaBreck, Paul Joseph DeAngelo, Michael Drummy
  • Patent number: 8156784
    Abstract: A system and method for carrying out non-destructive testing and inspection of test objects to assess their structural integrity uses a calibration module configured to provide V-Path time of flight (TOF) correction data over a plurality of object thickness points, obtained from an object or objects having known thicknesses using the same physical probe as is used for the inspection measurements. When a probe launches acoustical waves into a test object and an instrument and a control system compute a time of flight value of the acoustical waves launched by the probe, the pre-obtained V-Path TOF correction data is used to correct the measured time of flight computed by the instrument.
    Type: Grant
    Filed: December 4, 2009
    Date of Patent: April 17, 2012
    Assignee: Olympus NDT, Inc.
    Inventors: Paul Joseph DeAngelo, Steven Abe LaBreck
  • Publication number: 20110232360
    Abstract: Disclosed is a method and an NDT/NDI calibration process that automatically detects erroneous TOF readings by providing a predetermined time acceptance window. During the calibration process, TOF readings acquired by a UT device are validated to determine whether the TOF reading for the thin test block falls within the range of the predetermined time acceptance window. If the TOF reading for the thin block (T2) falls out of the predetermined time acceptance window, the operator is alerted of an error and to repeat the TOF test for the thin block.
    Type: Application
    Filed: March 22, 2011
    Publication date: September 29, 2011
    Inventors: Paul Joseph Deangelo, Steven Abe Labreck
  • Publication number: 20110132067
    Abstract: A system and method for carrying out non-destructive testing and inspection of test objects to assess their structural integrity uses a calibration module configured to provide V-Path time of flight (TOF) correction data over a plurality of object thickness points, obtained from an object or objects having known thicknesses using the same physical probe as is used for the inspection measurements. When a probe launches acoustical waves into a test object and an instrument and a control system compute a time of flight value of the acoustical waves launched by the probe, the pre-obtained V-Path TOF correction data is used to correct the measured time of flight computed by the instrument.
    Type: Application
    Filed: December 4, 2009
    Publication date: June 9, 2011
    Inventors: Paul Joseph DEANGELO, Steven Abe LABRECK
  • Publication number: 20090303064
    Abstract: Alerting a user of a material inspection device to a change in thickness of a material being inspected is disclosed. A thickness offset is determined from calibration information. The calibration information identifies a time of flight of a pulse through a reference sample similar in composition to a material to be inspected. The thickness offset indicates when a thickness of a material being inspected differs from a thickness of the reference sample. A calibration thickness alarm is set, the calibration thickness alarm corresponding to the thickness offset. A change in thickness of the material being inspected is detected. The calibration thickness alarm is engaged to alert the user of the inspection device of a detected change in thickness of the material being inspected.
    Type: Application
    Filed: June 3, 2009
    Publication date: December 10, 2009
    Inventors: Steven Abe LaBreck, Paul Joseph DeAngelo, Michael Drummy
  • Patent number: 7194907
    Abstract: An ultrasonic transducer for measuring a part with a coating having at least one acoustic transducer, and a buffer delay line having an impedance matched to an impedance of the coating.
    Type: Grant
    Filed: June 16, 2003
    Date of Patent: March 27, 2007
    Assignee: R/D Tech Instruments Inc.
    Inventors: Agostino Abbate, Paul Joseph DeAngelo, Steven Abe LaBreck
  • Publication number: 20040250624
    Abstract: An ultrasonic transducer for measuring a part with a coating having at least one acoustic transducer, and a buffer delay line having an impedance matched to an impedance of the coating.
    Type: Application
    Filed: June 16, 2003
    Publication date: December 16, 2004
    Inventors: Agostino Abbate, Paul Joseph DeAngelo, Steven Abe LaBreck