Abstract: A method for integrating a measurement device for use in measuring a machine component includes providing a coordinate measuring machine (CMM) and combining eddy current (EC) capabilities and CMM capabilities to form an inspection probe. The method further includes installing the inspection probe on the CMM so that the inspection probe measures external boundaries of the machine component with the CMM capabilities and substantially simultaneously measures at least one of internal boundaries, internal defects, surface defects, and material properties of the machine component with the EC capabilities, which are directly linked to actual component dimensional information provided by CMM. The inspection data can be simultaneously linked to and/or displayed with a CAD model to enable a direct comparison between the inspection data and the nominal requirements specified on the CAD model.

Abstract: Some embodiments provide a method and system for automatedly scheduling virtual machines across several hosting servers of a hosting service provider. Some embodiments perform the automated scheduling by receiving a server configuration that includes constraint data. In some embodiments, the constraint data includes a specified amount of hosting resources needed to implement the server configuration. Based on the constraint data, a scheduling module in the hosting environment determines an optimal distribution of the server configuration across a set of hosting resources that implement the server configuration based on the constraint data. To determine the optimal distribution, some embodiments compute a set of scores for quantifying the specified set of hosting resources required for hosting the server configuration.

Abstract: Some embodiments of the invention provide a graphical user interface for receiving a server configuration (e.g., receiving a new configuration or a modification to an existing configuration). The graphical user interface (UI) includes several UI control elements for defining components of the server configuration. It also includes a display area for displaying graphical representations of the defined components of the server configuration. Examples of control elements in some embodiments include control elements for adding, deleting, and modifying servers. In some embodiments, at least one control element is displayed when a cursor control operation is performed on the UI. The cursor control operation (e.g., a right hand click operation) in some embodiments opens a display area that shows the control element. In some embodiments, at least two different components in the server configuration correspond to two different layers (e.g., a web server layer and a data storage layer) in the server configuration.

Abstract: A method for integrating a measurement device for use in measuring a machine component includes providing a coordinate measuring machine (CMM) and combining eddy current (EC) capabilities and CMM capabilities to form an inspection probe. The method further includes installing the inspection probe on the CMM so that the inspection probe measures external boundaries of the machine component with the CMM capabilities and substantially simultaneously measures at least one of internal boundaries, internal defects, surface defects, and material properties of the machine component with the EC capabilities, which are directly linked to actual component dimensional information provided by CMM. The inspection data can be simultaneously linked to and/or displayed with a CAD model to enable a direct comparison between the inspection data and the nominal requirements specified on the CAD model.

Abstract: Some embodiments provide a system and method for projecting billing of a specified server configuration. In some embodiments, the projected billing is determined by identifying a set of allocated resources for the server configuration. In some embodiments, the set of resources include an amount of allocated RAM, network bandwidth, disk storage, processing power, etc. The set of resources are then projected over a billing period. Some embodiments determine a projection for the configuration as each component of the configuration is specified within a graphical user interface. Additionally, some embodiments determine a projection for the configuration after the entire configuration is specified within the graphical user interface.

Abstract: The present disclosure provides for the application of a two-dimensional ultrasonic phased array (100), formed of a plurality of transducers (102) arranged in a rectilinear pattern, for material and volumetric component testing. The two-dimensional array enables electronic adjustment of the focal properties and size of the aperture in both the azimuthal and elevational directions such that uniform and/or specified sound field characteristics can be obtained at any or all locations in the component being tested.