Patents by Inventor Paul M. Ingram

Paul M. Ingram has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 8983797
    Abstract: In one example of a method for remote identifying a non-Lambertian target material, a spectral signature for a target is determined from each of at least two different sets of imagery acquired at different angles, and compared to a predicted signature for a candidate material for each of the at least two different angles. The predicted signatures take into account the known anisotropy of reflectance, and thus also radiance, of the candidate material.
    Type: Grant
    Filed: June 25, 2013
    Date of Patent: March 17, 2015
    Assignee: Raytheon Company
    Inventors: Paul M. Ingram, Jr., Joseph C. Landry, John J. Coogan, Paul D. Shocklee
  • Publication number: 20140012541
    Abstract: In one example of a method for remote identifying a non-Lambertian target material, a spectral signature for a target is determined from each of at least two different sets of imagery acquired at different angles, and compared to a predicted signature for a candidate material for each of the at least two different angles. The predicted signatures take into account the known anisotropy of reflectance, and thus also radiance, of the candidate material.
    Type: Application
    Filed: June 25, 2013
    Publication date: January 9, 2014
    Inventors: Paul M. Ingram, JR., Joseph C. Landry, John J. Coogan, Paul D. Shocklee
  • Patent number: 8558884
    Abstract: A computer implemented method and apparatus estimate background reflectance, aerosol type and visibility within a multispectral imagery using the measured spectral radiance of one or more calibration targets of known reflectance and the measured radiance of the background of the target. The computer implemented method and apparatus uses predefined aerosol types, characterized by a plurality of known parameters, and the known reflectance of the one or more calibration targets, to select an aerosol that best matches the measured radiances.
    Type: Grant
    Filed: May 4, 2011
    Date of Patent: October 15, 2013
    Assignee: Raytheon Company
    Inventors: Paul M. Ingram, Jr., Joseph C. Landry
  • Patent number: 8532958
    Abstract: In one example of a method for remote identifying a non-Lambertian target material, a spectral signature for a target is determined from each of at least two different sets of imagery acquired at different angles, and compared to a predicted signature for a candidate material for each of the at least two different angles. The predicted signatures take into account the known anisotropy of reflectance, and thus also radiance, of the candidate material.
    Type: Grant
    Filed: August 6, 2010
    Date of Patent: September 10, 2013
    Assignee: Raytheon Company
    Inventors: Paul M. Ingram, Joseph C. Landry, John J. Coogan, Paul D. Shocklee
  • Patent number: 8515716
    Abstract: In accordance with the present disclosure, a computer implemented system and method predicts the performance for a remote material identification process under real conditions and uncertainties. The method and system transforms data representing measured reflectance values for candidate materials based on environmental conditions, and uncertainties regarding the environmental conditions and/or calibration of sensors measuring radiance values into the performance predictions for a material identification process operating under those conditions and uncertainties. The performance predictions can be communicated to a designer of, for example, a multi-angle material identification system for use in selecting and setting up the system, or communicated to a consumer of images captured by the material identification system for use in interpreting results of application of the material identification process to real imagery acquired with remote sensors.
    Type: Grant
    Filed: August 6, 2010
    Date of Patent: August 20, 2013
    Assignee: Raytheon Company
    Inventors: Paul M. Ingram, Joseph C. Landry, John J. Coogan, Paul D. Shocklee
  • Publication number: 20120281085
    Abstract: A computer implemented method and apparatus estimate background reflectance, aerosol type and visibility within a multispectral imagery using the measured spectral radiance of one or more calibration targets of known reflectance and the measured radiance of the background of the target. The computer implemented method and apparatus uses predefined aerosol types, characterized by a plurality of known parameters, and the known reflectance of the one or more calibration targets, to select an aerosol that best matches the measured radiances.
    Type: Application
    Filed: May 4, 2011
    Publication date: November 8, 2012
    Applicant: Raytheon Company
    Inventors: Paul M. Ingram, JR., Joseph C. Landry
  • Publication number: 20120035884
    Abstract: In one example of a method for remote identifying a non-Lambertian target material, a spectral signature for a target is determined from each of at least two different sets of imagery acquired at different angles, and compared to a predicted signature for a candidate material for each of the at least two different angles. The predicted signatures take into account the known anisotropy of reflectance, and thus also radiance, of the candidate material.
    Type: Application
    Filed: August 6, 2010
    Publication date: February 9, 2012
    Applicant: Raytheon Company
    Inventors: Paul M. Ingram, Joseph C. Landry, John J. Coogan, Paul D. Shocklee
  • Publication number: 20120035900
    Abstract: In accordance with the present disclosure, a computer implemented system and method predicts the performance for a remote material identification process under real conditions and uncertainties. The method and system transforms data representing measured reflectance values for candidate materials based on environmental conditions, and uncertainties regarding the environmental conditions and/or calibration of sensors measuring radiance values into the performance predictions for a material identification process operating under those conditions and uncertainties. The performance predictions can be communicated to a designer of, for example, a multi-angle material identification system for use in selecting and setting up the system, or communicated to a consumer of images captured by the material identification system for use in interpreting results of application of the material identification process to real imagery acquired with remote sensors.
    Type: Application
    Filed: August 6, 2010
    Publication date: February 9, 2012
    Applicant: Raytheon Company
    Inventors: Paul M. Ingram, Joseph C. Landry, John J. Coogan, Paul D. Shocklee
  • Patent number: 7117132
    Abstract: A method for estimating the error statistic for retrieved temperature and emissivity of a surface material includes determining the second order analytical error propagation from a measured radiance that differs from the true radiance by additive gaussian noise, which is independent in each band. The radiance error is translated into a diagonal covariance matrix and an analytical estimate results in a determination of the standard deviation and bias of surface temperature. Further, the method for estimating the error statistic utilizes Monte Carlo simulation from a sufficiently large ensemble of radiance spectra for the retrieved surface temperature and emissivity. Temperature and emissivity of the surface material were retrieved using ISSTES algorithm.
    Type: Grant
    Filed: July 26, 2001
    Date of Patent: October 3, 2006
    Assignee: Raytheon Company
    Inventors: Paul M Ingram, Jr., Archie H Muse
  • Publication number: 20020035454
    Abstract: A method for estimating the error statistic for retrieved temperature and emissivity of a surface material includes determining the second order analytical error propagation from a measured radiance that differs from the true radiance by additive gaussian noise, which is independent in each band. The radiance error is translated into a diagonal covariance matrix and an analytical estimate results in a determination of the standard deviation and bias of surface temperature. Further, the method for estimating the error statistic utilizes Monte Carlo simulation from a sufficiently large ensemble of radiance spectra for the retrieved surface temperature and emissivity. Temperature and emissivity of the surface material were retrieved using ISSTES algorithm.
    Type: Application
    Filed: July 26, 2001
    Publication date: March 21, 2002
    Applicant: Raytheon Company
    Inventors: Paul M. Ingram, Archie H. Muse
  • Patent number: 5581638
    Abstract: A method for automatically registering an image pair having a common coverage area, wherein a pair of image data sets, each representing an image of an image pair, are processed to generate initial dewarping coefficients for the image data sets. The translational offset between the images is estimated using a phase correlation process. Next, the common coverage area of the data image sets is determined by finding the vertices defining the limits of the common coverage area. Conjugate point pairs are extracted from the common coverage area by defining a series of block and subblock grids and defining the center point of the grid as a conjugate point location. The determined conjugate point sets are used to generate geometrically corrected registered dewarping coefficients and the image data sets are resampled using the registered dewarping coefficients to generate a registered image pair.
    Type: Grant
    Filed: February 28, 1995
    Date of Patent: December 3, 1996
    Assignee: E-Systems, Inc.
    Inventors: Fenton L. Givens, Thomas J. Skinner, Paul M. Ingram
  • Patent number: 5462357
    Abstract: A method of estimating both atmospheric conditions and surface temperatures of an object from either a single set of multispectral images or multiple simultaneously-acquired single-band images of the object. Estimates of atmospheric conditions are generated by determining and radiometrically correcting radiance values measured from the image of the object. Expected radiance values are then determined and compared with the measured radiance values. The best fit of the radiance values measured from the image of the object to the expected radiance values corresponds to the best estimate of the atmospheric conditions associated with the object. The present method estimates atmospheric conditions for the object regardless of the availability of atmospheric conditions associated with the image.
    Type: Grant
    Filed: October 28, 1993
    Date of Patent: October 31, 1995
    Assignee: E-Systems, Inc.
    Inventors: Paul M. Ingram, Jr., James R. Johnson, Fenton L. Givens
  • Patent number: 5324113
    Abstract: A method of estimating both atmospheric conditions and surface temperatures of an object from either a single set of multispectral images or multiple simultaneously-acquired single-band images of the object. Estimates of atmospheric conditions are generated by determining and radiometrically correcting radiance values measured from the image of the object. Expected radiance values are then determined and compared with the measured radiance values. The best fit of the radiance values measured from the image of the object to the expected radiance values corresponds to the best estimate of the atmospheric conditions associated with the object. The present method estimates atmospheric conditions for the object regardless of the availability of atmospheric conditions associated with the image.
    Type: Grant
    Filed: December 10, 1992
    Date of Patent: June 28, 1994
    Assignee: E-Systems, Inc.
    Inventors: Paul M. Ingram, Jr., James R. Johnson, Fenton L. Givens