Patents by Inventor Paul Tabor

Paul Tabor has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 11917258
    Abstract: Systems and methods are provided for enhanced ship-based network connectivity using a content delivery network (CDN) edge server. An example method includes receiving user requests from user devices in wireless communication with a system, with the user requests being associated with applications executing on the user devices. An operating status associated with a satellite communication system is determined, the operation status being indicative of the satellite communication system having bandwidth and/or connectivity to route the user requests via a satellite network. Based on the operating status being negative, a first subset of the user requests is queued for transmission. A second subset of the user requests are responded to using an edge cache. Based on the operating status being positive, the user requests are transmitted via the satellite network to a shore-based system, the shore-based system routing the user requests to web applications associated with different functionality.
    Type: Grant
    Filed: September 16, 2021
    Date of Patent: February 27, 2024
    Assignee: Royal Caribbean Cruises Ltd.
    Inventor: Paul Tabor
  • Publication number: 20230078360
    Abstract: Systems and methods are provided for enhanced ship-based network connectivity using a content delivery network (CDN) edge server. An example method includes receiving user requests from user devices in wireless communication with a system, with the user requests being associated with applications executing on the user devices. An operating status associated with a satellite communication system is determined, the operation status being indicative of the satellite communication system having bandwidth and/or connectivity to route the user requests via a satellite network. Based on the operating status being negative, a first subset of the user requests is queued for transmission. A second subset of the user requests are responded to using an edge cache. Based on the operating status being positive, the user requests are transmitted via the satellite network to a shore-based system, the shore-based system routing the user requests to web applications associated with different functionality.
    Type: Application
    Filed: September 16, 2021
    Publication date: March 16, 2023
    Inventor: Paul Tabor
  • Publication number: 20140371783
    Abstract: A device including a stent structure or frame to which a sheet is attached for use in minimizing or preventing emboli, particles, and/or air bubbles from migrating into certain areas of the anatomy. The device can be placed in the blood stream in an area of the heart, such as the aortic arch, to direct particles toward the descending aorta rather than toward the brain. The sheet of the device can be a thin film material, which may include multiple fenestrations that are smaller in size than the particles that are to be filtered.
    Type: Application
    Filed: September 4, 2014
    Publication date: December 18, 2014
    Inventors: Mark C.S. Shu, Charles Paul Tabor
  • Patent number: 8852225
    Abstract: A device including a stent structure or frame to which a sheet is attached for use in minimizing or preventing emboli, particles. and/or air bubbles from migrating into certain areas of the anatomy. The device can be placed in the blood stream in an area of the heart, such as the aortic arch, to direct particles toward the descending aorta rather than toward the brain. The sheet of the device can be a thin film material, which may include multiple fenestrations that are smaller in size than the particles that are to be filtered.
    Type: Grant
    Filed: September 25, 2009
    Date of Patent: October 7, 2014
    Assignee: Medtronic, Inc.
    Inventors: Charles Paul Tabor, Angela Shu
  • Patent number: 8417477
    Abstract: A method and apparatus for data analysis according to various aspects of the present invention is configured to identify statistical outliers in test data for components, including local outliers representing outliers within subsets of larger data populations.
    Type: Grant
    Filed: May 20, 2005
    Date of Patent: April 9, 2013
    Assignee: Test Acuity Solutions, Inc.
    Inventors: Emilio Miguelanez, Jacky Gorin, Eric Paul Tabor
  • Patent number: 8041541
    Abstract: A method and apparatus for data analysis according to various aspects of the present invention is configured to automatically identify a characteristic of a fabrication process for components based on test data for the components.
    Type: Grant
    Filed: March 27, 2007
    Date of Patent: October 18, 2011
    Assignee: Test Advantage, Inc.
    Inventors: Paul M. Buxton, Eric Paul Tabor, Emilio Miguelanez Martin, Ali M. S. Zalzala
  • Patent number: 8000928
    Abstract: A method and apparatus for data analysis according to various aspects of the present invention is configured to automatically select one or more outlier identification algorithms for identifying statistical outliers in test data for components.
    Type: Grant
    Filed: April 29, 2008
    Date of Patent: August 16, 2011
    Assignee: Test Advantage, Inc.
    Inventors: Michael J. Scott, Jacky Gorin, Paul Buxton, Eric Paul Tabor
  • Publication number: 20100088054
    Abstract: A method and apparatus for data analysis according to various aspects of the present invention is configured to automatically identify a characteristic of a component fabrication process guided by characteristics of the test data for the components.
    Type: Application
    Filed: October 5, 2009
    Publication date: April 8, 2010
    Inventors: EMILIO MIGUELANEZ, MICHAEL J. SCOTT, JACKY GORIN, PAUL BUXTON, ERIC PAUL TABOR
  • Publication number: 20100076482
    Abstract: A device including a stent structure or frame to which a sheet is attached for use in minimizing or preventing emboli, particles. and/or air bubbles from migrating into certain areas of the anatomy. The device can be placed in the blood stream in an area of the heart, such as the aortic arch, to direct particles toward the descending aorta rather than toward the brain. The sheet of the device can be a thin film material, which may include multiple fenestrations that are smaller in size than the particles that are to be filtered.
    Type: Application
    Filed: September 25, 2009
    Publication date: March 25, 2010
    Inventors: Mark C. S. Shu, Charles Paul Tabor, Angela Shu
  • Patent number: 7437271
    Abstract: A method and apparatus for testing semiconductors according to various aspects of the present invention comprises a test system comprising composite data analysis element configured to analyze data from more than one dataset. The test system may be configured to provide the data in an output report. The composite data analysis element suitably performs a spatial analysis to identify patterns and irregularities in the composite data set. The composite data analysis element may also operate in conjunction with a various other analysis systems, such as a cluster detection system and an exclusion system, to refine the composite data analysis. The composite may also be merged into other data.
    Type: Grant
    Filed: October 28, 2005
    Date of Patent: October 14, 2008
    Assignee: Test Advantage, Inc.
    Inventor: Eric Paul Tabor
  • Publication number: 20080249742
    Abstract: A method and apparatus for data analysis according to various aspects of the present invention is configured to automatically select one or more outlier identification algorithms for identifying statistical outliers in test data for components.
    Type: Application
    Filed: April 29, 2008
    Publication date: October 9, 2008
    Inventors: Michael J. Scott, Jocky Gorin, Paul Buxton, Eric Paul Tabor
  • Publication number: 20080189575
    Abstract: A method and apparatus for data analysis according to various aspects of the present invention is configured to automatically identify a characteristic of a component fabrication process guided by characteristics of the test data for the components.
    Type: Application
    Filed: January 29, 2008
    Publication date: August 7, 2008
    Inventors: EMILIO MIGUELANEZ, Michael J. Scotl, Jacky Gorin, Paul Buxton, Paul Tabor
  • Patent number: 7395170
    Abstract: A method and apparatus for data analysis according to various aspects of the present invention is configured to automatically select one or more outlier identification algorithms for identifying statistical outliers in test data for components.
    Type: Grant
    Filed: April 2, 2004
    Date of Patent: July 1, 2008
    Assignee: Test Advantage, Inc.
    Inventors: Michael J. Scott, Jacky Gorin, Paul Buxton, Eric Paul Tabor
  • Patent number: 7356430
    Abstract: A method and apparatus for data analysis according to various aspects of the present invention is configured to automatically identify a characteristic of a component fabrication process guided by characteristics of the test data for the components. A method and apparatus according to various aspects of the present invention may operate in conjunction with a test system having a tester, such as automatic test equipment (ATE) for testing semiconductors.
    Type: Grant
    Filed: February 7, 2005
    Date of Patent: April 8, 2008
    Assignee: Test Advantage, Inc.
    Inventors: Emilio Miguelanez, Michael J. Scott, Jacky Gorin, Paul Buxton, Paul Tabor
  • Patent number: 7225107
    Abstract: A method and apparatus for data analysis according to various aspects of the present invention is configured to automatically identify a characteristic of a fabrication process for components based on test data for the components.
    Type: Grant
    Filed: December 7, 2003
    Date of Patent: May 29, 2007
    Assignee: Test Advantage, Inc.
    Inventors: Paul M. Buxton, Eric Paul Tabor, Emilio Miguelanez Martin, Ali M. S. Zalzala
  • Patent number: 7167811
    Abstract: A method and apparatus for testing semiconductors according to various aspects of the present invention comprises a test system comprising composite data analysis element configured to analyze data from more than one dataset. The test system may be configured to provide the data in an output report. The composite data analysis element suitably performs a spatial analysis to identify patterns and irregularities in the composite data set. The composite data analysis element may also operate in conjunction with a various other analysis systems, such as a cluster detection system and an exclusion system, to refine the composite data analysis. The composite may also be merged into other data.
    Type: Grant
    Filed: February 14, 2003
    Date of Patent: January 23, 2007
    Assignee: Test Advantage, Inc.
    Inventor: Eric Paul Tabor
  • Publication number: 20050278597
    Abstract: A method and apparatus for data analysis according to various aspects of the present invention is configured to automatically identify a characteristic of a component fabrication process guided by characteristics of the test data for the components.
    Type: Application
    Filed: February 7, 2005
    Publication date: December 15, 2005
    Inventors: Emilio Miguelanez, Michael Scott, Jacky Gorin, Paul Buxton, Paul Tabor
  • Publication number: 20040267477
    Abstract: A method and apparatus for data analysis according to various aspects of the present invention is configured to automatically select one or more outlier identification algorithms for identifying statistical outliers in test data for components.
    Type: Application
    Filed: April 2, 2004
    Publication date: December 30, 2004
    Inventors: Michael J. Scott, Jacky Gorin, Paul Buxton, Eric Paul Tabor
  • Patent number: 6792373
    Abstract: A method and apparatus for testing semiconductors according to various aspects of the present invention comprises a test system comprising an outlier identification element configured to identify significant data in a set of test results. The test system may be configured to provide the data in an output report. The outlier identification element suitably performs the analysis at run time. The outlier identification element may also operate in conjunction with a smoothing system to smooth the data and identify trends and departures from test result norms.
    Type: Grant
    Filed: May 24, 2002
    Date of Patent: September 14, 2004
    Assignee: Test Advantage, Inc.
    Inventor: Eric Paul Tabor
  • Patent number: 6782297
    Abstract: A method and apparatus for smoothing data comprises adjusting data according to a first smoothing technique and selectively adjusting the data according to a second smoothing technique. The method and apparatus applies a first smoothing technique to a selected datum to adjust a value. The method and apparatus also compares preceding adjusted data to preceding raw data to generate a comparison result and may apply a second smoothing technique to the selected datum according to whether the comparison result meets a threshold. In addition, the method and apparatus of various embodiments may calculate a predicted value of the selected datum and apply another smoothing technique to the selected datum according to whether the predicted value meets a second threshold.
    Type: Grant
    Filed: May 31, 2001
    Date of Patent: August 24, 2004
    Inventor: Eric Paul Tabor