Abstract: An apparatus is described for burn-in and/or functional testing of microelectronic circuits of unsingulated wafers. A large number of power, ground, and signal connections can be made to a large number of contacts on a wafer. The apparatus has a cartridge that allows for fanning-in of electric paths. A distribution board has a plurality of interfaces that are strategically positioned to provide a dense configuration. The interfaces are connected through flexible attachments to an array of first connector modules. Each one of the first connector modules can be independently connected to a respective one of a plurality of second connector modules, thereby reducing stresses on a frame of the apparatus. Further features include for example a piston that allows for tight control of forces exerted by terminals onto contacts of a wafer.

Abstract: A clutch control system for a motor vehicle having an engine (10), a gearbox (12) having a plurality of gear ratios, and a clutch (14) providing a drive connection between the engine and the gearbox. The control system includes a clutch actuation means (22) for controlling the state of engagement of the clutch and a control unit (36) which receives signals from a plurality of vehicle operating parameter sensors including a gear sensor (32) which indicates that a gear ratio is engaged in the gearbox. The control unit (36) processes these signals to produce a command signal for operation of the clutch actuating means. The control unit (36) ensures that if on powering-up of the control unit (36) the control unit receives a signal from the gear sensor (32) indicating that a gear ratio is engaged in the gearbox (12), the control unit inhibits disengagement of the clutch (14) by the clutch actuation means (22).