Patents by Inventor Paul William Loeffen

Paul William Loeffen has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 8182607
    Abstract: There is provided a method and apparatus for assessing in-situ crystal formation in a test sample. Both optical imaging and X-ray diffraction techniques are utilized, with the results of these processes being combined in such a way as to produce an overall score relating to the aptness of crystalline material for harvesting and subsequent X-ray crystallography.
    Type: Grant
    Filed: December 13, 2006
    Date of Patent: May 22, 2012
    Assignee: Agilent Technologies, Inc.
    Inventors: Damian Kucharczyk, Richard Cooper, Paul William Loeffen