Patents by Inventor Peisen Huang

Peisen Huang has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20200224169
    Abstract: A method for preparing mesenchymal stem cell-derived exosomes on the basis of drug pretreatment, the method for preparing mesenchymal stem cell-derived exosomes comprising: using a statin to pretreat mesenchymal stem cells, and culturing the treated mesenchymal stem cells to collect exosomes secreted thereby. Also provided is an application of a statin in preparing a preparation for promoting the anti-apoptotic abilities and/or homing abilities of mesenchymal stem cells; and further provided is an application of a statin in preparing a preparation for promoting mesenchymal stem cells to secrete exosomes having myocardial infarction microenvironment-improving effects and/or myocardial repair abilities.
    Type: Application
    Filed: March 27, 2020
    Publication date: July 16, 2020
    Inventors: Yuejin Yang, Peisen Huang, Guihao Chen
  • Publication number: 20070115484
    Abstract: A structured light system for object ranging/measurement is disclosed that implements a trapezoidal-based phase-shifting function with intensity ratio modeling using sinusoidal intensity-varied fringe patterns to accommodate for defocus error.
    Type: Application
    Filed: October 24, 2006
    Publication date: May 24, 2007
    Inventors: Peisen Huang, Song Zhang
  • Patent number: 6788210
    Abstract: A three dimensional surface contouring and ranging system (10) based on a digital fringe projection (18) and phase shifting technique is disclosed. In the system, three phase-shifted fringe patterns and an absolute phase mark pattern are used to determine the absolute phase map of the object (12). The phase map is then converted to the absolute x, y, and z coordinates of the object surface by a transformation algorithm. A calibration procedure is used to determine accurate values of system parameters required by the transformation algorithm. The parameters are initially indirectly measured through experiments to determine their approximate values. A calibration plate is then measured by the system at various positions. An iteration algorithm is then used to estimate the system parameters.
    Type: Grant
    Filed: August 5, 2002
    Date of Patent: September 7, 2004
    Assignee: The Research Foundation of State University of New York
    Inventors: Peisen Huang, Qingying Hu, Fu-Pen Chiang
  • Patent number: 5418611
    Abstract: A high resolution, compact size and low cost multi-degree-of-freedom geometric error measurement system for simultaneously measuring four geometric errors, horizontal straightness, vertical straightness, pitch and yaw. The pitch and yaw error measurements are based on a new method of angle measurement in turn based on the internal reflection effect at an air/glass boundary. The method uses a differential detection scheme to largely reduce the inherent non-linearity of the reflectance versus the angle of incidence in internal reflection. With non-linearity reduced, the displacement of the angle of incidence can be determined accurately by measuring the reflectance. The resolution and measurement range are determined by the initial angle of incidence, the polarization state of light, and the number of reflections. Compared with interferometers and autocollimators, this method has the advantage of a simple sensor design for applications ranging from very wide measurement range to extremely high resolution.
    Type: Grant
    Filed: June 14, 1993
    Date of Patent: May 23, 1995
    Inventors: Peisen Huang, Jun Ni
  • Patent number: 5220397
    Abstract: A new method of angle measurement is based on the internal reflection effect at an air/glass boundary. The method uses a differential detection scheme to largely reduce the inherent non-linearity of the reflectance versus the angle of incidence in internal reflection. With non-linearity reduced, the displacement of the angle of incidence can be determined accurately by measuring the reflectance. The resolution and measurement range are determined by the initial angle of incidence, the polarization state of light, and the number of reflections. Compared with interferometers and autocollimators, this method has the advantage of a simple sensor design for applications ranging from very wide measurement range to extremely high resolution. Apparatus for accomplishing the method comprises a beamsplitter, a pair of critical angle prisms and a pair of photodiodes.
    Type: Grant
    Filed: March 25, 1992
    Date of Patent: June 15, 1993
    Inventors: Peisen Huang, Satoshi Kiyono