Patents by Inventor Peng HONG
Peng HONG has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Publication number: 20240162566Abstract: A separator includes a substrate and a coating. The coating is formed on at least a portion of surface of the substrate. The coating includes composite particles and a binder. The composite particles form bulges on surface of the coating. The composite particles include polyacrylate particles and first inorganic particles. The first inorganic particle is present between at least two of the polyacrylate particles.Type: ApplicationFiled: January 22, 2024Publication date: May 16, 2024Inventors: Haiyi HONG, Yanyun MA, Xiaonan CHENG, Lei CHAO, Peng WANG, Chongwang HAN, Yuxia LI, Jianrui YANG, Yi ZHENG, Chengdong SUN
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Patent number: 11983415Abstract: A memory management method for a memory storage device is provided. The memory management method includes: detecting effective information of at least one operation event performed by the memory storage device in a first mode; and adjusting a threshold value according to the effective information. The threshold value is configured to determine whether to instruct the memory storage device to enter the first mode.Type: GrantFiled: August 29, 2019Date of Patent: May 14, 2024Assignee: Hefei Core Storage Electronic LimitedInventors: Qi-Ao Zhu, Chong Peng, Zhi Wang, Wan-Jun Hong
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Publication number: 20240112323Abstract: A method for detecting defects on a wafer including the steps of obtaining a reference image of a chip pattern formed on a reference wafer, using a computer algorithm to analyze the reference image to produce a division map for the chip pattern; setting respective thresholds for divisions of the division map, obtaining a comparison data between a test image of the chip pattern formed on a test wafer and the reference image, using the division map and the thresholds to examine the comparison data to identify a defect in the test image.Type: ApplicationFiled: November 17, 2022Publication date: April 4, 2024Applicant: United Semiconductor (Xiamen) Co., Ltd.Inventors: Yu Peng Hong, QINGRONG CHEN, Kai Ping Huang, Chin-Chun Huang, WEN YI TAN
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Publication number: 20240104000Abstract: Determination and provision of improved representations of program flow control are provided by a method that monitors execution of binary code of a program on a computer system. The monitoring includes monitoring manipulation(s) of call stack(s) maintained by the computer system for the execution of the binary code. The method, based on the monitoring, determines function call pattern(s) and branch pattern(s) exhibited by the execution of the binary code. The method identifies, from the binary code and using the determined function call pattern(s) and branch pattern(s), function calls and branches, relations between the function calls and branches, and function and variable names. The method also provides a representation of program flow control of the program using the identified function calls and branches, relations, and function and variable names.Type: ApplicationFiled: September 28, 2022Publication date: March 28, 2024Inventors: Bao Zhang, Jin Hong Fu, Peng Hui Jiang, Shi Chong Ma, He Huang, Jia Yu
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Patent number: 11940900Abstract: Determination and provision of improved representations of program flow control are provided by a method that monitors execution of binary code of a program on a computer system. The monitoring includes monitoring manipulation(s) of call stack(s) maintained by the computer system for the execution of the binary code. The method, based on the monitoring, determines function call pattern(s) and branch pattern(s) exhibited by the execution of the binary code. The method identifies, from the binary code and using the determined function call pattern(s) and branch pattern(s), function calls and branches, relations between the function calls and branches, and function and variable names. The method also provides a representation of program flow control of the program using the identified function calls and branches, relations, and function and variable names.Type: GrantFiled: September 28, 2022Date of Patent: March 26, 2024Assignee: INTERNATIONAL BUSINESS MACHINES CORPORATIONInventors: Bao Zhang, Jin Hong Fu, Peng Hui Jiang, Shi Chong Ma, He Huang, Jia Yu
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Publication number: 20240086333Abstract: A computer-implemented method, computer program product and computer system are provided. A processor receives an indication of sensitive data in one or more files. A processor updates at least one bit in the virtual address space for the one or more files indicated to have sensitive data. A processor, in response to a program accessing the one or more files, evaluates a respective virtual address for the one or more files. A processor, in response to the at least one bit in the respective virtual address for the one or more files, marks intermediate data generated by the program as sensitive data.Type: ApplicationFiled: September 8, 2022Publication date: March 14, 2024Inventors: He Huang, Jin Hong Fu, Shi Chong Ma, Bao Zhang, Jia Yu, Peng Hui Jiang
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Patent number: 11915500Abstract: A system uses a neural network based model to perform scene text recognition. The system achieves high accuracy of prediction of text from scenes based on a neural network architecture that uses double attention mechanism. The neural network based model includes a convolutional neural network component that outputs a set of visual features and an attention extractor neural network component that determines attention scores based on the visual features. The visual features and the attention scores are combined to generate mixed features that are provided as input to a character recognizer component that determines a second attention score and recognizes the characters based on the second attention score. The system trains the neural network based model by adjusting the neural network parameters to minimize a multi-class gradient harmonizing mechanism (GHM) loss. The multi-class GHM loss varies based on a level of difficulty of the sample.Type: GrantFiled: January 28, 2021Date of Patent: February 27, 2024Assignee: Salesforce, Inc.Inventors: Pan Zhou, Peng Tang, Ran Xu, Chu Hong Hoi
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Patent number: 11478884Abstract: Disclosed are a full-automatic storage shelf assembly production line and an operation method thereof. The production line includes a logistics channel, a stand column-based feeding area, a supporting beam-based feeding area, an in-line logistics system, a shelf assembly area, a finished product area, and a control system. The stand column-based feeding area, the supporting beam-based feeding area, the shelf assembly area, and the finished product area are connected in series by means of the in-line logistics system to form an integrated production line.Type: GrantFiled: November 30, 2018Date of Patent: October 25, 2022Assignees: Jiangsu Jinling Institute of Intelligent Manufacturing Co., Ltd., United Material Handling IncInventors: Xiaohe Tian, Lingfeng Tao, Maosheng Li, Weifeng Yang, Peng Hong, Jian Zhang
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Patent number: 11048695Abstract: A system includes reception of a first query of a transaction table from a first client system, generation of a first result set based on the first query, transmission of the first result set to the first client system, reception of a first subset of the first result set from the first client system, the first subset of the first result set associated with a first user, determination of whether to present a first stored comment to the first user based on the first subset of the first result set, a first context associated with the first stored comment, and data security information associated with the first user, and, if it is determined to present the first stored comment to the first user, transmission of the first stored comment to the first client system.Type: GrantFiled: September 12, 2017Date of Patent: June 29, 2021Assignee: SAP SEInventors: Houman Ghaemi, Bill (Peng Hong) Chen, Steve Norton, Seyedhassan Mousavijavardi, Derrick Wan
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Publication number: 20200282498Abstract: Disclosed are a full-automatic storage shelf assembly production line and an operation method thereof. The production line includes a logistics channel, a stand column-based feeding area, a supporting beam-based feeding area, an in-line logistics system, a shelf assembly area, a finished product area, and a control system. The stand column-based feeding area, the supporting beam-based feeding area, the shelf assembly area, and the finished product area are connected in series by means of the in-line logistics system to form an integrated production line.Type: ApplicationFiled: November 30, 2018Publication date: September 10, 2020Inventors: Xiaohe TIAN, Lingfeng TAO, Maosheng LI, Weifeng YANG, Peng HONG, Jian ZHANG
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Publication number: 20190079969Abstract: A system includes reception of a first query of a transaction table from a first client system, generation of a first result set based on the first query, transmission of the first result set to the first client system, reception of a first subset of the first result set from the first client system, the first subset of the first result set associated with a first user, determination of whether to present a first stored comment to the first user based on the first subset of the first result set, a first context associated with the first stored comment, and data security information associated with the first user, and, if it is determined to present the first stored comment to the first user, transmission of the first stored comment to the first client system.Type: ApplicationFiled: September 12, 2017Publication date: March 14, 2019Inventors: Houman Ghaemi, Bill (Peng Hong) Chen, Steve Norton, Seyedhassan Mousavijavardi, Derrick Wan
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Patent number: 6128074Abstract: A pin grid array inspection device includes an inspection gauge having a rectangular matrix of holes corresponding to leads of a pin grid array. In the preferred embodiment, a retractable device holder extends through a central opening in the inspection gauge. The device holder contacts the central leadless section of the pin grid array and provides a resting place for the pin grid array before an alignment mechanism grasps the pin grid array. An alignment mechanism positioned above the inspection gauge guides the pin grid array and aligns it to the inspection gauge. The device holder retracts, and the pin grid array descends into the inspection gauge due to gravity. An optical scanning receiver is mounted opposite of an optical scanning transmitter to receive an optical inspection beam. The optical scanning transmitter shines an optical inspection beam over the pin grid array as it rests in the inspection gauge.Type: GrantFiled: June 26, 1997Date of Patent: October 3, 2000Assignee: Advanced Micro Devices, Inc.Inventors: Yee Peng Hong, Ng Ah Soon, Tan Kia Wai